ESREF 2004, the 15th European Symposium on Reliability of Electron Devices will take place in Zurich (Switzerland) from 4 to 8 October 2004.



This international symposium continues to focus on recent developments and future directions in quality and reliability Management of materials, devices and circuits in microelectronics. It provides an open forum to develop all aspects of reliability management and advanced analysis techniques for present and future semiconductor applications. ESREF 2004 also includes the former Electron and Optical Beam Test Conference (EOBT) and it is co-sponsored by the IEEE Electron Device and IEEE Reliability Societies.