Fiche : [DIV432]
Titre : Recherche sur l'auteur Stéphane AZZOPARDI, juillet 2004.
Cité dans : [DIV096] Recherches bibliographiques diverses, janvier 2019. Cité dans : [DATA147] IXL, Laboratoire IXL, Université de Bordeaux, Talence, France, http://www.ixl.u-bordeaux.fr
Date : juillet 2004
Vers : Recherche du dimanche 13 juin 2004
Vers : Recherche STN du mercredi 7 juillet 2004
Recherche du dimanche 13 juin 2004 |
[1] : [DATA147] IXL, Laboratoire IXL, Université de Bordeaux, Talence, France, http://www.ixl.u-bordeaux.fr [2] : [DIV289] Recherche sur l'auteur Christian ZARDINI, juillet 2004.Lien : S-AZZOPARDI.htm - le 3 décembre 2001
Année 2004
[1] : [ART548] S. AZZOPARDI, J.-M. VINASSA, E. WOIRGARD, C. ZARDINI, O. BRIAT, A systematic hard- and soft-switching performances evaluation of 1200 V punchthrough IGBT structures, IEEE Transactions on Power Electronics, Vol. 19, No. 1, January 2004, pp. 231-241.
Année 2003
[1] : [ART559] J. PILACINSKI, J. DESKUR, S. AZZOPARDI, Investigations on switching characteristics of an IGBT, EPE'2003, Toulouse, 9 pages. [2] : [ART556] S. AZZOPARDI, O. BRIAT, J.M. VINASSA, Experimental comparison of two hybridization strategies for ESS-battery association in heavy duty electric vehicles, EPE'2003, Toulouse, 6 pages. [3] : [ART558] S. AZZOPARDI, E. WOIRGARD, J.-M. VINASSA, O. BRIAT, C. ZARDINI, IGBT Power modules thermal characterization : what is the optimum between a low current - high voltage or a high current - low voltage test condition for the same electrical power?, ESREF'2 [4] : [ART437] S. AZZOPARDI, E. WOIRGARD, J.-M. VINASSA, O. BRIAT, C. ZARDINI, IGBT Power modules thermal characterization : what is the optimum between a low current - high voltage or a high current - low voltage test condition for the same electrical power?, Microel
Année 2002
[1] : [ART355] O. BRIAT, J. M. VINASSA, S. AZZOPARDI, C. ZARDINI, J. L. AUCOUTURIER, Etude expérimentale d'une source hybride a Accumulateur Cinétique d'énergie pour véhicules électriques lourds, EPF'2002.
Année 2001
[1] : [ART557] S. AZZOPARDI, A. KAWAMURA, H. IWAMOTO, O. BRIAT, J.M. VINASSA, E. WOIRGARD, C. ZARDINI, Local lifetime control IGBT structures : Turn-off performances comparison for hard- and soft-switching between 1200V trench PT- and new planar PT-IGBTs, Microelectro [2] : [PAP374] S. AZZOPARDI, A. KAWAMURA, H. IWAMOTO, O. BRIAT, J.M. VINASSA, E. WOIRGARD, C. ZARDINI, Local lifetime control IGBT structures : Turn-off performances comparison for hard- and soft-switching between 1200V trench PT- and new planar PT-IGBTs, ESREF'2001,
Année 2000
[1] : [PAP158] -------
Année 1999
[1] : [PAP481] S. AZZOPARDI, M. TRIVEDI, C. ZARDINI, K. SHENAI, A Punch-Through IGBT Model Using a Simple Technological Parameters Extraction Method for Two-Dimensional Physical Simulation, EPE'99. [2] : [PAP479] S. AZZOPARDI, J.-M. VINASSA, C. ZARDINI, Behaviour of Fast and Ultra-Fast 600V Punch-Through IGBT under Unclamped Inductive Switching Stress, EPE'99.
Année 1998
[1] : [THESE112] S. AZZOPARDI, Contribution à la caractérisation et à la modélisation de l'IGBT en vue d'une hybridation destinée à fonctionner à température élevée pour le véhicule électrique, 1998, 392 pages. [2] : [ART560] S. AZZOPARDI, A. JAMET, J.-M. VINASSA, C. ZARDINI, Switching performance comparison of 1200V punch-through and non punch-through igbts under hard-switching at high temperature, IEEE, pp. 1201-1207, Aout 1998.
Année 1997
[1] : [PAP478] S. AZZOPARDI, J.-M. VINASSA, C. ZARDINI, Investigations on the Internal Physical Behaviour of 600V Punch-Through IGBT under Latch-up at High Temperature, ESSDERC'97. [2] : [PAP476] S. AZZOPARDI, J.-M. VINASSA, C. ZARDINI, Comparative analysis of switching dynamics of punch-through and non punch-through IGBTs at high temperature, EPE'97. [3] : [PAP482] S. AZZOPARDI, C. JAMET, J.-M. VINASSA, C. ZARDINI, Dynamics Behaviour of Punch-Through IGBT in Hard-Switching Converters at High Temperature, European Power Electronics Proc. Conf. 1997, vol.4, pp. 1-6.
Année 1996
[1] : [PAP228] S. AZZOPARDI, C. ZARDINI, Temperature effects on the internal physical and electrical behaviour of n-channel punch-through insulated gate bipolar transistor, THERMINIC'96.
Recherche STN du mercredi 7 juillet 2004 |
Titres dans la banque de données COMPENDEX
1 : A systematic hard- and soft-switching performances evaluation of 1200 V punchthrough IGBT structures.
2 : Strategy for designing accelerated aging tests to evaluate IGBT power modules lifetime in real operation mode.
Titres dans la banque de données INSPEC
3 : A systematic hard- and soft-switching performances evaluation of 1200 V punchthrough IGBT structures.
4 : IGBT power modules thermal characterization: what is the optimum between a low current-high voltage or a high current-low voltage test condition for the same electrical power?.
5 : Strategy for designing accelerated aging tests to evaluate IGBT power modules lifetime in real operation mode.
6 : Experimental investigations on the switching performances of 1200 V conventional PT-IGBT and new PT-IGBT using local lifetime control for clamped inductive load without freewheeling diode reverse recovery effect.
7 : Soft-switching performances of 1200V new punch-through IGBT using local lifetime control at high temperature.
8 : Soft-switching turn-off characterization at high temperature of 1200 V trench IGBT using local lifetime control.
9 : Local lifetime control IGBT structures: turn-off performances comparison for hard- and soft-switching between 1200 V trench and new planar PT-IGBTs.
10 : Characterization of 1200 V trench IGBT using local lifetime control for clamped inductive load under extensive measurements without freewheeling diode reverse recovery influence.
11 : Switching performances of 1200 V conventional planar and trench punch-through IGBTs for clamped inductive load under extensive measurements.
12 : Behaviour of fast and ultra-fast 600 V punch-through IGBT under unclamped inductive switching stress.
13 : A punch-through IGBT model using a simple technological parameters extraction method for two-dimensional physical simulation.
14 : Non-destructive extraction of technological parameters for numerical simulation of conventional planar punch-through IGBT.
15 : Performances of 1200 V punch-through and nonpunch-through IGBTs under unclamped inductive switching.
16 : Dynamics behaviour of punch-through IGBT converters at high temperature.
17 : A study of 600V punch-through IGBT dynamics under unclamped inductive switching.
18 : Hybrid power modules using a metal matrix composite baseplate: An evaluation.
19 : Al/SiC baseplate hybrid power modules: evaluation of the thermomechanical performances.
20 : Switching performances comparison of 1200 V punch-through and nonpunch-through IGBTs under hard-switching at high temperature.
21 : Investigations on the internal physical behaviour of 600V punch-through IGBT under latch-up at high temperature.
[1] : [ART548] S. AZZOPARDI, J.-M. VINASSA, E. WOIRGARD, C. ZARDINI, O. BRIAT, A systematic hard- and soft-switching performances evaluation of 1200 V punchthrough IGBT structures, IEEE Transactions on Power Electronics, Vol. 19, No. 1, January 2004, pp. 231-241. [2] : [PAP158] ------- [3] : [ART548] S. AZZOPARDI, J.-M. VINASSA, E. WOIRGARD, C. ZARDINI, O. BRIAT, A systematic hard- and soft-switching performances evaluation of 1200 V punchthrough IGBT structures, IEEE Transactions on Power Electronics, Vol. 19, No. 1, January 2004, pp. 231-241. [4] : [ART437] S. AZZOPARDI, E. WOIRGARD, J.-M. VINASSA, O. BRIAT, C. ZARDINI, IGBT Power modules thermal characterization : what is the optimum between a low current - high voltage or a high current - low voltage test condition for the same electrical power?, Microel [5] : [PAP158] ------- [6] : [PAP158] ------- [7] : [PAP158] ------- [8] : [PAP374] S. AZZOPARDI, A. KAWAMURA, H. IWAMOTO, O. BRIAT, J.M. VINASSA, E. WOIRGARD, C. ZARDINI, Local lifetime control IGBT structures : Turn-off performances comparison for hard- and soft-switching between 1200V trench PT- and new planar PT-IGBTs, ESREF'2001, [9] : [PAP158] -------
[10] : [PAP158] ------- [11] : [PAP158] ------- [12] : [PAP479] S. AZZOPARDI, J.-M. VINASSA, C. ZARDINI, Behaviour of Fast and Ultra-Fast 600V Punch-Through IGBT under Unclamped Inductive Switching Stress, EPE'99. [13] : [PAP481] S. AZZOPARDI, M. TRIVEDI, C. ZARDINI, K. SHENAI, A Punch-Through IGBT Model Using a Simple Technological Parameters Extraction Method for Two-Dimensional Physical Simulation, EPE'99. [14] : [PAP158] ------- [15] : [PAP158] ------- [16] : [PAP482] S. AZZOPARDI, C. JAMET, J.-M. VINASSA, C. ZARDINI, Dynamics Behaviour of Punch-Through IGBT in Hard-Switching Converters at High Temperature, European Power Electronics Proc. Conf. 1997, vol.4, pp. 1-6. [17] : [PAP158] ------- [18] : [PAP158] ------- [19] : [PAP158] -------
[20] : [ART560] S. AZZOPARDI, A. JAMET, J.-M. VINASSA, C. ZARDINI, Switching performance comparison of 1200V punch-through and non punch-through igbts under hard-switching at high temperature, IEEE, pp. 1201-1207, Aout 1998. [21] : [PAP478] S. AZZOPARDI, J.-M. VINASSA, C. ZARDINI, Investigations on the Internal Physical Behaviour of 600V Punch-Through IGBT under Latch-up at High Temperature, ESSDERC'97.
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