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The IPFA Symposium Technical Programme Steering Committee invites papers in various areas of interest to semiconductor Physical and Failure analysis. The broad topics, but not limited only to, for the symposium is given below:
Advanced Failure Analysis Techniques
EOS/ESD and CMOS Latchup
Practical Issues in Building-in Reliability
Packaging and Metallization Related Failure Mechanisms
Dielectrics and Hot-Carrier Reliability
Reliability and Failure Analysis of Specialist Devices
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