Article : [ART221]
Info : REPONSE 89, le 06/05/2002.
Titre : High pulse power failure of discrete resistors, 1975.
Cité dans : [DIV334] Recherche sur les mots clés power cycling of power device, mai 2002.Auteur : Domingos, H. (Dept. of Electrical Engng., Clarkson Coll. of Technol., Potsdam, NY, USA)
Source : IEEE Transactions on Parts, Hybrids and Packaging (Sept. 1975) vol.PHP-11, no.3, p.225-9. 2 refs.
CODEN : IEPHAA
ISSN : 0361-1000
Document_Type : Journal
Treatment_Code : Application; Theoretical; Experimental
Info : Country of Publication : United States
Language : English
Stockage :
Abstract :
Theoretical and experimental studies have been conducted on discrete
resistors to determine the power required to cause failure as a function
of pulse width over the range 1 mu s to 10 ms. Single pulses of increasing
amplitude were applied until voltage breakdown occurred, the resistor
shattered, or until a resistance change of 5% or more took place. Carbon
composition (both slug and film type), wire-wound (both precision and
power type) and film resistors were tested. Computer calculations,
temperature cycling tests, and field plots were utilized to interpret the
results.
Accession_Number : 1975:827024 INSPEC
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