The SISC is a workshop-style conference that provides a forum for device engineers, solid state physicists, and materials scientists to discuss topics of common interest both formally through invited and contributed presentations, and informally during a variety of events including a poster presentation session.
The program includes talks from all areas of MOS science and technology, including but not limited to the following:
 | alternative and high-k gate dielectric materials |
| physics of thin dielectrics and their interfaces |
| gate-dielectric conduction and breakdown |
| silicon carbide and its interfaces |
| physical and electrical characterization of Si/SiO2 interfaces |
| micro-roughness measurement, modeling, and device-related effects |
| hot carrier, plasma damage and radiation effects |
| nitrogen-containing oxides and stacked interfaces |
| surface cleaning technology and effects on dielectrics and interfaces |
| novel oxidation, deposition, and etching techniques |
| theory of oxide and interface defects |
Preliminary List of Invited Speakers and Topics
| Dr. Eduard Cartier, IBM and IMEC "Charge trapping, mobility degradation and reliability of high-k gate stacks" |
| Professor Hiroshi Iwai, Tokyo Institute of Technology "CMOS scaling and requested new technologies" |
| Professor Tsu-Jae King, UC Berkeley "Gate material issues for high-k gate dielectrics" |
| Professor Jack C. Lee, UT Austin "Effects of Interface States and Charge Trapping on the Performance of High-K Gate Dielectrics Devices" |
| Professor Gerry Lucovsky, NC State "Electronic structure at Si/high-k dielectronic interfaces" |
| Professor John Robertson, Cambridge "Electronic structure and band offsets in high-k dielectrics" |
| Dr. Hiroshi Yano, Nara Institute of
Science and Technology "SiC MOSFETS and their interfaces" |
The 2002 SISC is sponsored by the Electron Devices Society of the IEEE, and will be held immediately prior to the IEEE IEDM.
A Best Student Presentation award will be given in memory of E.H. Nicollian, who made many important contributions to the field and had a strong presence within the SISC.
This year, we have limited support available
from the National Science Foundation for student and young faculty
participation.
Deadline for Receipt of Extended Abstracts: August 5, 2002
Papers received after the deadline will receive full consideration for presentation at the 2002 SISC.
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You MUST submit your original work electronically as an extended abstract. |
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Two (2) pages or less, including figures and references in PDF format. |
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Text fonts must be 11-point or larger with a 1” margin on all sides of an 8.5”´ 11” size page. |
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No more than 6 figures should be used, and must be suitably large to be read easily. Only black and white/grayscale figures are accepted...no color figures. |
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Only Times New Roman and Symbol fonts may be used. |
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Fonts for references or captions must be at least 10 pt. |
| The abstract should make a clear distinction between background material and new work, and should include enough information to show how the work advances the state of the art. |
| Because the SISC is intended for the presentation of new material, work that has appeared in print prior to the submission deadline will not be considered for presentation. |
| Indicate on the submission whether student or
young faculty support for participation is requested. |
Please see our Example Abstract, and Example Review PDF versions.
Here is the Word version which can serve as a suitable template for the abstracts.
To make an electronic submission, please e-mail and provide the following:
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To: rwallace@unt.edu and bellman@imit.kth.se |
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Subject: 2002 SISC submission |
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The first line of the email should give the exact title |
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The second line should list the authors and affiliations |
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The third line should list the contact author name, address, phone and fax numbers, and e-mail address |
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The fourth line should specify if the paper is presented by a Student. |
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Attach a PDF file of the abstract, including the name and affiliation
of the authors. |
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Attach an additional PDF file of the abstract without the name or affiliation of the authors, Filename = "Review.pdf". The program committee will conduct a blind review of the submissions, so references or text that might identify authorship should be hidden. (This is easily accomplished by changing the identifying text font color from black to white.) |
All abstracts must be received by August 5, 2002.
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Bob
Wallace Technical Program Chair University of North Texas P.O. Box 305310 Denton, TX 76203-5310 USA Phone: (940)369-7834 email: rwallace@unt.edu |
Carl-Mikael
Zetterling Arrangements Chair KTH, Royal Institute of Technology Department of Microelectronics and Information Technology SE-16440 Kista, Sweden Phone:46-8-752-1409 E-mail: bellman@imit.kth.se |
| Lori
Lipkin General Chair Cree Research 4600 Silicon Drive Durham, NC 27703 USA Phone (919) 313-5525 e-mail: lori_lipkin@cree.com |
Karen Kuiper Registration Conference Specialists 6446 Tucker Ave. McLean, VA 22101 Phone: (703) 660-0913 kjkuiper@mindspring.com |
