Nicollian Award

The SISC Ed Nicollian Award for best student paper was established in 1995 in honor of Professor E.H. Nicollian, University of North Carolina at Charlotte. Professor Nicollian was a pioneer in the exploration of the metal-oxide-semiconductor system, particularly in the area of electrical measurements. His efforts were fundamental to establishing the SISC in its early years, and he served as its technical program chair in 1982. With John Brews, he wrote the definitive book, "MOS Physics and Technology", published by Wiley Interscience.
Past Winners of the SISC Ed Nicollian Award
2001 Thomas Kauerauf IMEC "Low Weibull slope of breakdown distributions in high-k layers" with Robin Degraeve, Charlotte Soens, Guido Groeseneken (IMEC), Eduard Cartier (IBM/IMEC)
2000 Z.J. Luo Yale University "Characterization of Ultra-thin (~1nm) Zr Silicate for CMOS Gate Application" with T.P. Ma, E. Cartier, M. Copel, T. Tamagawa and B. Halpern	1999 Shigayasu Uno Osake University "I-V Characteristics of Ultra Thin Oxide Films after Soft Breakdown" with T. Sakura, Y. Kamakura and K. Taniguchi
1998 M.K. Das Purdue University "Inversion Channel Mobility in 4H- and 6H-SiC MOSFETs" with J.A. Cooper, Jr., M.R. Melloch, and M.A. Capano	1997 Tanya Nigam IMEC "Is the Constant Current Charge-to- Breakdown Test Still a Valid Tool to Study the Reliability of MOS Structures?" with R. Degraeve, G. Groeseneken, M. Heyns
1996 Jan De Blauwe IMEC "Degradation and Nitridation Dependence of Steady-State SILC" with R. Degraeve, R. Bellens, J. Van Houdt, G. Groesenenken and H.E. Maes	1995 K.A. Ellis Cornell University "Gas Phase Chemistry of N₂O Furnace Oxidation" with R.A. Buhrman