Revue : [REVUE529]

Titre : Elsevier Science, Microelectronics Reliability, Volume 44, Issue 7, Pages 1031-1206, July 2004.

Cité dans : [DATA197] Les revues Microelectronics Reliability et Microelectronics Journal, ELSEVIER, décembre 2004.

Volume : 44
Issue : 7
Pages : 1031 - 1206
Date : July 2004

[1] : Editorial
Page 1031
Peter Ersland and Roberto Menozzi
Lien : vide.pdf - | Full Text + Links | PDF (201 K)

[2] : Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting
Pages : 1033-1038
Y. C. Chou, D. Leung, I. Smorchkova, M. Wojtowicz, R. Grundbacher, L.
Callejo, Q. Kan, R. Lai, P. H. Liu, D. Eng and A. Oki
Lien : vide.pdf - | Full Text + Links | PDF (428 K)

[3] : Lifetime acceleration model for HAST tests of a pHEMT process
Pages : 1039-1045
Peter Ersland, Hei-Ruey Jen and Xinxing Yang
Lien : vide.pdf - | Full Text + Links | PDF (541 K)

[4] : Cycling copper flip chip interconnects
Pages : 1047-1054
William J. Roesch and Suwanna Jittinorasett
Lien : vide.pdf - | Full Text + Links | PDF (478 K)

[5] : High-resolution transmission electron microscopy on aged InP HBTs
Pages : 1055-1060
Bruce M. Paine, Timothy J. Perham and Stephen Thomas III
Lien : vide.pdf - | Full Text + Links | PDF (394 K)

[6] : Role of carrier depletion effects and material properties in advanced microscale thermal modeling of N-GaInP–Si/p-GaAs–C heterojunction bipolar transistor (HBT) devices
Pages : 1061-1068
Satbir S. Madra
Lien : vide.pdf - | Full Text + Links | PDF (833 K)

[7] : Design strategy of localized halo profile for achieving sub-50 nm bulk MOSFET
Pages : 1069-1075
Chun-Hsing Shih, Yi-Min Chen and Chenhsin Lien
Lien : vide.pdf - | Full Text + Links | PDF (432 K)

[8] : Low frequency noise characterization in 0.13 m p-MOSFETs. Impact of scaled-down 0.25, 0.18 and 0.13 m technologies on 1/f noise
Pages : 1077-1085
M. Marin, Y. Akue Allogo, M. de Murcia, P. Llinares and J. C. Vildeuil
Lien : vide.pdf - | Full Text + Links | PDF (362 K)

[9] : Study of swing potential on deep submicron on-chip interconnect
Pages : 1087-1091
Qungang Ma, Yuejin Li and Yintang Yang
Lien : vide.pdf - | Full Text + Links | PDF (341 K)

[10] : A two-dimensional analytical subthreshold behavior model for short-channel AlGaAs/GaAs HFETs
Pages : 1093-1099
T. K. Chiang
Lien : vide.pdf - | Full Text + Links | PDF (351 K)

[11] : Impact of device geometry and doping strategy on linearity and RF performance in Si/SiGe MODFETs
Pages : 1101-1107
L. Yang, A. Asenov, J. R. Watling, M. Boriçi, J. R. Barker, S. Roy, K. Elgaid, I. Thayne and T. Hackbarth
Lien : vide.pdf - | Full Text + Links | PDF (816 K)

[12] : Long-term reliability of Ti–Pt–Au metallization system for Schottky contact and first-level metallization on SiC MESFET
Pages : 1109-1113
A. Sozza, C. Dua, A. Kerlain, C. Brylinski and E. Zanoni
Lien : vide.pdf - | Full Text + Links | PDF (392 K)

[13] : Temperature influence on energy losses in MOSFET capacitors
Pages : 1115-1121
A. Goda and A. Kos
Lien : vide.pdf - | Full Text + Links | PDF (345 K)

[14] : Low frequency noise as a tool to study optocouplers with phototransistors
Pages : 1123-1129
Milan M. Jevti
Lien : vide.pdf - | Full Text + Links | PDF (311 K)

[15] : Impact life prediction modeling of TFBGA packages under board level drop test
Pages : 1131-1142
Tong Yan Tee, Hun Shen Ng, Chwee Teck Lim, Eric Pek and Zhaowei Zhong
Lien : vide.pdf - | Full Text + Links | PDF (486 K)

[16] : Vibration fatigue experiments of SMT solder joint
Pages : 1143-1156
Hongfang Wang, Mei Zhao and Qiang Guo
Lien : vide.pdf - | Full Text + Links | PDF (1164 K)

[17] : Reliability enhancement of electronic packages by design of optimal parameters
Pages : 1157-1163
Ashish Batra, Pradeep Ramachandran, Poornima Sathyanarayanan, Susan Lu and Hari Srihari
Lien : vide.pdf - | Full Text + Links | PDF (335 K)

[18] : 2-Step algorithm for automatic alignment in wafer dicing process
Pages : 1165-1179
Hyong Tae Kim, Chang Seop Song and Hae Jeong Yang
Lien : vide.pdf - | Full Text + Links | PDF (689 K)

[19] : Staggered heat sinks with aerodynamic cooling fins
Pages : 1181-1187
Octavio A. Leon, Gilbert De Mey, Erik Dick and Jan Vierendeels
Lien : vide.pdf - | Full Text + Links | PDF (339 K)

[20] : A high-linear wide-tunable CMOS transconductor for video frequency applications
Pages : 1189-1198
Belén Calvo, Santiago Celma, M Teresa Sanz and Pedro A. Martínez
Lien : vide.pdf - | Full Text + Links | PDF (433 K)

[21] : Analytical investigation of dead space effect under near-breakdown conditions in GaInP/GaAs composite double heterojunction bipolar transistors
Pages : 1199-1202
Y. L. Goh and D. S. Ong
Lien : vide.pdf - | Full Text + Links | PDF (273 K)

[22] : Networks on Chip; Axel Jantsch, Hannu Tenhunen (Eds.). Kluwer Academic Publishers, Boston; 2003. Hardcover, pp. 303, plus VIII, euro 117. ISBN 1-4020-7392-5 BOOK REVIEW
Pages : 1203-1204
Mile Stojcev
Lien : vide.pdf - | Full Text + Links | PDF (213 K)

[23] : Memory architecture exploration for programmable embedded systems; Peter
Grun, Nikil Dutt, Alexandru Nicolau. Kluwer Academic Publishers, Boston.

[2003] : REVIEW
Pages : 1205-1206
Mile Stojcev
Lien : vide.pdf - | Full Text + Links | PDF (209 K)

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