Revue : [REVUE312]

Titre : Elsevier Science, Microelectronics Reliability, Volume 35, Issue 2, Pages 159-318 (February 1995.

Cité dans : [DATA197] Les revues Microelectronics Reliability et Microelectronics Journal, ELSEVIER, décembre 2004.

Volume : 35, Issue 2,
Pages : 159-318 (February 1995)
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[1] : Availability of nonindependent main unit and n-unit series subsystem
subject to shut-off rules, Pages 159-169
Yow-Mow Chen
Lien : vide.pdf - | Journal Format-PDF (287 K)

[2] : A method to solve fuzzy reliability optimization problem, Pages 171-181
Lev V. Utkin, Sergey V. Gurov and Igor B. Shubinsky
Lien : vide.pdf - | Journal Format-PDF (345 K)

[3] : Long-term degradation tests of amorphous silicon solar cells: correlation
between light- and current-induced degradation characteristics, Pages
183-187
Takeshi Yanagisawa
Lien : vide.pdf - | Journal Format-PDF (253 K)

[4] : Optimal control of a removable and non-reliable server in a Markovian
queueing system with finite capacity, Pages 189-196
K. -H. Wang and W. -F. Hsieh
Lien : vide.pdf - | Journal Format-PDF (283 K)

[5] : Reliability of a repairable system with spares and a removable repairman,
Pages : 197-208
Yi-Chih Hsieh and Kuo-Hsiung Wang
Lien : vide.pdf - | Journal Format-PDF (357 K)

[6] : A case study of statistical process control on the prime process using
Plasmask 302U, Pages 209-224
K. I. Arshak, D. McDonagh, J. Braddell, E. Murphy and P. Gleeson
Lien : vide.pdf - | Journal Format-PDF (599 K)

[7] : Hot-carrier induced series resistance enhancement model (HISREM) of
nMOSFET's for circuit simulations and reliability projections, Pages
225-239
Nam Hwang and Leonard Forbes
Lien : vide.pdf - | Journal Format-PDF (536 K)

[8] : Cause-effect alarm failure analysis for nuclear reactor protection system
EDM modules, Pages 241-249
J. L. Roca
Lien : vide.pdf - | Journal Format-PDF (198 K)

[9] : Cost analysis of a two unit repairable system subject to on-line
preventive maintenance and/or repair, Pages 251-258
M. N. Gopalan and K. S. Bhanu
Lien : vide.pdf - | Journal Format-PDF (217 K)

[10] : Profit evaluation of a two-unit system with internal and external repairs,
inspection and post repair, Pages 259-264
D. Pandey, S. K. Tyagi and Mendus Jacob
Lien : vide.pdf - | Journal Format-PDF (271 K)

[11] : Some optimality conditions for Mb/M/C queueing systems, Pages 265-268
Manju Sharma and G. C. Sharma
Lien : vide.pdf - | Journal Format-PDF (203 K)

[12] : The median for a L-R fuzzy number, Pages 269-271
Mitsuo Yamashiro
Lien : vide.pdf - | Journal Format-PDF (117 K)

[13] : Software reliability growth model with error dependency, Pages 273-278
P. K. KapurSaid Younes
Lien : vide.pdf - | Journal Format-PDF (357 K)

[14] : Estimation of reliability of a component under multiple stresses, Pages
279-283
J. FerdousMd. Borhan UddinM. Pandey
Lien : vide.pdf - | Journal Format-PDF (275 K)

[15] : Availability analysis of a standby complex system having imperfect
switch-over device, Pages 285-288
Jai SinghPardeep Goel
Lien : vide.pdf - | Journal Format-PDF (168 K)

[16] : Non-parametric inferences on system availability with a reference of
k-out-of-m systems, Pages 289-293
K. K. Sharma and Hare Krishna
Lien : vide.pdf - | Journal Format-PDF (220 K)

[17] : A set theoretic method for enumeration of pathsets of non-directed graphs,
Pages : 295-298
M. A. Aziz
Lien : vide.pdf - | Journal Format-PDF (233 K)

[18] : A complex two-unit system with random breakdown of repair facility, Pages
299-302
M. Gururajan and Bala Srinivasan
Lien : vide.pdf - | Journal Format-PDF (190 K)

[19] : Reliability analysis of a National Broadcasting Network (NBN) system,
Pages : 303-307
Virendra Singh Rana
Lien : vide.pdf - | Journal Format-PDF (200 K)

[20] : Repairable single server systems with multiple breakdown modes, Pages
309-318
Yi-Chih Hsieh and Mark S. Andersland
Lien : vide.pdf - | Journal Format-PDF (297 K)

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