Article : [PAP396]
Titre : K. CROES, J. V. MANCA, W. DE CEUNINCK, L. DE SCHEPPER, G. MOLENBERGHS, The time of guessing your failure time distribution is over!, Microelectronics Reliability, Volume 38, Issues 6-8, 8 June 1998, pp. 1187-1191.
Cité dans :[REVUE253] Elsevier Science, Microelectronics Reliability, Volume 38, Issues 6-8, Pages 851-1366, 8 June 1998. Cité dans : [DATA233] ESREF'98, Proceedings of the 9th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis, 5-9 October 1998. Cité dans : [DIV366] Recherche sur l'auteur Kristof CROES, octobre 2002. Cité dans :[PAP432]Auteur : K. Croes (1)
Adresse : (1) Limburgs Universitair Centrum, Institute for Materials Research, Materials Physics Division, Universitaire Campus, Wetenschapspark 1, 3590 Diepenbeek, Belgium
Adresse : (2) Limburgs Universitair Centrum, Biostatistics, Universitaire Campus, 3590 Diepenbeek, Belgium
Vers : Bibliographie
Lien : PAP432.HTM#Bibliographie - référence [4].
Lien : private/CROES.pdf - 5 pages, 298 Ko
Pages : 1187 - 1191
Volume : 38
Issues : 6-8
Date : 8 June 1998
Logiciel : FAILURE
Abstract :
Each statistical analysis of reliability data starts with the choice of the underlying distribution of failure
times. This choice is of great importance because all conclusions drawn from this analysis will depend on it.
Lifetime predictions can vary orders of magnitude depending on the distribution used. Most researchers choose
the underlying distribution of failure times rather unfounded: because of "historical" reasons, because everybody
uses it, ...We developed a method which offers reliability engineers an objective tool for making the distinction
between the two most widely used distributions, the lognormal and the Weibull, using a statistical well-founded
technique. Essentially, the method comes down to constructing both the lognormal and the Weibull probability
plot of the data set under consideration. For each plot, the Pearson's correlation coefficient is calculated. It is
shown that the ratio of these two correlation coefficients is a pivotal quantity .Hence, it can serve as a test
statistic.
Bibliographie |
[1] : [PAP158] ------- [2] : [LIVRE288] BAIN, Statistical analysis of reliability and lifetesting models : theory and methods, Marcel Dekker Inc., New York, 1978. [3] : [PAP158] ------- [4] : [PAP158] ------- [5] : [PAP158] ------- [6] : [DIV338] FAILURE, Software package for reliability data analysis, distributed by DESTIN NV, Wetenschapspark 1, B-3590 Diepenbeek, Belgium.
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