B. FOUCHER, J. BOULLIE, B. MESLET, D. DAS, "A review of reliability prediction methods for electronic devices", Microelectronics Reliability, Volume 42, Issues 8, pp. 115-1162.

B. FOUCHER, J. BOULLIE, B. MESLET, D. DAS, "A review of reliability prediction methods for electronic devices", Microelectronics Reliability, Volume 42, Issues 8, pp. 115-1162. Copyright - [Précédente] [Première page] [Suivante] - Home

Article : [ART294]

Titre : B. FOUCHER, J. BOULLIE, B. MESLET, D. DAS, A review of reliability prediction methods for electronic devices, Microelectronics Reliability, Volume 42, Issues 8, pp. 115-1162.

Cité dans :[REVUE355] Elsevier Science, Microelectronics Reliability, Volume 42, Issue 8, Pages 1153-1248, August 2002.

Auteur : B. Foucher - (a)
Auteur : J. Boullié - (a)
Auteur : B. Meslet - (b)
Auteur : D. Das - (b)

Vers : Bibliographie
Adresse : (a) EADS CCR, 12, rue Pasteur BP76, 92152 Suresnes Cedex, France
Adresse : (b) CALCE Electronic Products and Systems Center, University of Maryland, College Park, MD 20740, USA
Infos : J. Boullié is now with Alcatel Space Industries (Toulouse, France). B. Meslet is now at Yonsei University (Seoul, Korea).
Fax. : +33-1-46-97-30-08
Lien : mailto:bruno.foucher@eads.net
Source : Microelectronics Reliability
Volume : 42
Issues : 8
Date : 2002
Pages : 1155 - 1162
DOI : 10.1016/S0026-2714(02)00087-2
PII : S0026-2714(02)00087-2
Lien : private/FOUCHER1.pdf - 99 Ko, 8 pages.
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Abstract :
A wide range of reliability prediction methods is available today for electronic
systems. This article classifies the commonly used and referred to reliability
prediction methodologies into some categories easy to understand. A set of
selected methods, which are of relevance to many industries, the aerospace
industry among others, are reviewed and the possibility they offer to address
the stated objectives is assessed. Their respective advantages and shortcomings
are the basis for the recommendation we make to use the methods in a combined
fashion (simultaneously or successively) along the product development process.

Article Outline
1. Introduction
2. The concepts for reliability prediction
2.1. Bottom¯up statistical methods
2.2. Top¯down similarity analysis methods
2.3. Bottom-up physics-of-failure methods
3. Discussion on the methods
4. Comparison criteria and assessment
5. Management of objectives
6. Conclusions

Table 1. Non-exhaustive list of assessed reliability prediction methods and their latest updates (<1K)
Table 2. Examples of models used in BS methods for microcircuits (<1K)
Table 3. Sources of data and environment of the reliability prediction methods(4K)
Table 4. Inputs to the different reliability prediction methods (10K)
Table 5. Comparison criteria for use (6K)
Table 6. Comparison criteria as management of objectives (<1K)

Bibliographie

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