I.L. SOMOS, D.E. PICCONE, W.H. TOBIN, "Plasma spreading in 6 KV, 100 mm diameter thyristors", IEEE Industry Applications Society Annual Meeting 1987, pp. 521-526.

I.L. SOMOS, D.E. PICCONE, W.H. TOBIN, "Plasma spreading in 6 KV, 100 mm diameter thyristors", IEEE Industry Applications Society Annual Meeting 1987, pp. 521-526. Copyright - [Précédente] [Première page] [Suivante] - Home

Article : [SHEET231]

Info : COMPENDEX Answer Number 6, le 16/03/2000.

Titre : I.L. SOMOS, D.E. PICCONE, W.H. TOBIN, Plasma spreading in 6 KV, 100 mm diameter thyristors, IEEE Industry Applications Society Annual Meeting 1987, pp. 521-526.

Cité dans : [DATA042] Recherche sur l'auteur Istvan SOMOS, mars 2000.
Cité dans : [DATA049] Recherche sur l'auteur Dante E. PICCONE, mars 2000.

Auteur : Somos, I.L. (Somos Electra, Lansdowne, PA, USA)
Auteur : Piccone, D.E.
Auteur : Tobin, W.H

Meeting : Conference Record of the 1987 IEEE Industry Applications Society Annual Meeting. Papers Presented at the 22nd Annual Meeting.
Location : Atlanta, GA, USA
Date : 18 Oct 1987-23 Oct 1987
Source : Conference Record - IAS Annual Meeting (IEEE Industry Applications Society) 1987.Publ by IEEE, New York, NY, USA.
Available : from IEEE Service Cent (Cat n 87CH2499-2), Piscataway, NJ, USA
Pages : 521 - 526
CODEN : CIASDZ
ISSN : 0160-8592
Année : 1987
Info : Meeting Number : 10895 ; Document Type : Conference Article ; Language : English
Stockage : Thierry LEQUEU

Abstract :
Plasma spreading velocity (Vel) affects turn on losses and the
temperature rise.This function Vel vs.time, together with the gate design,
determines the maximum usable silicon diameter, the frequency limit, and
the operational life.An equation used for the representation of this
parameter is Vel equals M (J-JO)n where J is the current density M and n
are constants, and JO is the minimum current density to move the plasma.A
method is presented for computing the values of JO, M, and n by analyzing
a dynamic E-I characteristic which is tested routinely when measuring the
voltage drop for a given current.The authors analyzed the EI
characteristics of various devices and found that the shape of these
characteristics is determined by the plasma velocity in addition to other
device parameters.Thus the E-I characteristic is a simple tool for
determining the velocity.

Referneces : 7 refs.

Accession_Number : 1988(5):72228

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