Article : [SHEET130]

Info : COMPENDEX Answer Number 18 - 21/02/2000

Titre : Progress in the measurement of multi-junction devices at ISE, 1991.

Cité dans : [DATA036] Recherche sur les mots clés 3D simulation with ISE for semiconductor, 2000.

Title : The Conference Record of the Twenty-Second IEEE Photovoltaic Specialists Conference - 1991.
Location : Las Vegas, NV, USA, 07 Oct 1991-11 Oct 1991
Info : Organization IEEE Electron Devices Soc
Source : Conference Record of the IEEE Photovoltaic Specialists Conference v 1.Publ by IEEE, IEEE Service Center, Piscataway, NJ, USA (IEEE cat n 92CH2953-8).
Pages : 430 - 435
CODEN : CRCNDP
ISSN : 0160-8371
ISBN : 0-87942-636-5
Année : 1992
Meeting_Number : 16851
Document_Type : Conference Article
Treatment_Code : Experimental
Language : English
Stockage : Thierry LEQUEU
Lien : private/HEIDLER.pdf - 6 pages, 344 Ko.

Abstract :
A reference cell method with software preselection of the simulator
setting is discussed.This method has a high potential for reducing
measurement time.The authors report the progress in setting up a
triple source simulator for large-area solar cells with an in situ
measurement of the spectrum using a calibrated spectroradiometer
from 350 nm to 1500 nm.They present details of their high-precision
spectral response facility for solar cells of up to 10 multiplied by
10 cm2 over a wavelength range of 320 nm to 1500 nm.An analysis is
made of the propagation of systematic spectral uncertainties:
typically a 10% spectral uncertainty leads to a 1.5% uncertainty in
short-circuit current when the spectral mismatch method is used.

References : 10 Refs.

Accession_Number : 1992(9):122940

Appears : Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
Accession_Number : 4253940

Abstract :
A reference solar cell method with software preselection of the
simulator setting is discussed. This method has a high potential
for reducing measurement time. The authors report the progress in
setting up a triple source simulator for large-area solar cells
with an in situ measurement of the spectrum using a calibrated
spectroradiometer from 350 nm to 1500 nm. They present details of
their high-precision spectral response facility for solar cells
of up to 10*10 cm/sup 2/ over a wavelength range of 320 nm to
1500 nm. An analysis is made of the propagation of systematic
spectral uncertainties: typically a 10% spectral uncertainty
leads to a 1.5% uncertainty in short-circuit current when the
spectral mismatch method is used.<>

Subjet_terms :
semiconductor device testing; p-n heterojunctions; calibration;
automatic testing; test facilities; measurement; solar cell;
software; spectroradiometer; spectral response; spectral
uncertainty; short-circuit current; spectral mismatch method; 320
to 1500 nm; 350 to 1500 nm; automatic test equipment; p-n
heterojunctions; semiconductor device testing; solar cells; test
facilities

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