Revue : [REVUE354]

Titre : Elsevier Science, Microelectronics Reliability, Volume 42, Issue 7, Pages 995-1151, July 2002.

Cité dans : [DATA197] Les revues Microelectronics Reliability et Microelectronics Journal, ELSEVIER, décembre 2004.

Volume : 42
Issue : 7
Pages : 995 - 1151
Date : July 2002

[1] : , Page 995
Wallace T. Anderson and Roberto Menozzi
Lien : vide.pdf - | Full Text + Links | PDF (27 K)

[2] : Reliability of metamorphic HEMTs on GaAs substrates, Pages 997-1002
P. F. Marsh, C. S. Whelan, W. E. Hoke, R. E. Leoni III and T. E. Kazior
Lien : vide.pdf - | Full Text + Links | PDF (262 K)

[3] : The effects of buffer thickness on GaAs MESFET characteristics:
channel¯substrate current, drain breakdown, and reliability, Pages
1003-1010
Frank Gao, Ravi Chanana and Tom Nicholls
Lien : vide.pdf - | Full Text + Links | PDF (555 K)

[4] : Modeling gallium arsenide heterojunction bipolar transistor ledge
variations for insight into device reliability, Pages 1011-1020
Tim Henderson
Lien : vide.pdf - | Full Text + Links | PDF (441 K)

[5] : Multiple quantum well PIN optoelectronic devices and a method of restoring
failed device characteristics, Pages 1021-1028
K. Ikossi, W. S. Rabinovich, D. S. Katzer, S. C. Binari, J. Mittereder and
P. G. Goetz
Lien : vide.pdf - | Full Text + Links | PDF (306 K)

[6] : Methods of reducing defects in GaAs ICs, Pages 1029-1036
William J. Roesch
Lien : vide.pdf - | Full Text + Links | PDF (467 K)

[7] : A thorough investigation of hot-carrier-induced gate oxide breakdown in
partially depleted N- and P-channel SIMOX MOSFETs, Pages 1037-1044
Hongxia Liu, Yue Hao and Jiangang Zhu
Lien : vide.pdf - | Full Text + Links | PDF (468 K)

[8] : Investigation of the power dissipation during IGBT turn-off using a new physics-based IGBT compact model, Pages 1045-1052
P. M. Igic, P. A. Mawby, M. S. Towers, W. Jamal and S. Batcup
Lien : private/IGIC1.pdf - | Full Text + Links | PDF (287 K)

  [1] :  [ART293]  P.M. IGIC, P.A. MAWBY, M.S. TOWERS, W. JAMAL, S. BATCUP, Investigation of the power dissipation during IGBT turn-off using a new physics-based IGBT compact model, Microelectronics Reliability, Volume 4, Issues 7, July 2002, pp. 955-1151.

[9] : Characterization method of thermomechanical parameters for microelectronic
materials, Pages 1053-1058
O. Perat, J. M. Dorkel, E. Scheid, P. Temple Boyer, Y. S. Chung, A.
Peyre-Lavigne, M. Zecri and P. Tounsi
Lien : vide.pdf - | Full Text + Links | PDF (246 K)

[10] : Transient thermal analysis of multilayered structures using Green's
functions, Pages 1059-1064
Marcin Janicki, Gilbert De Mey and Andrzej Napieralski
Lien : vide.pdf - | Full Text + Links | PDF (213 K)

[11] : Reliability study of the electroless Ni¯P layer against solder alloy,
Pages : 1065-1073
M. O. Alam, Y. C. Chan and K. C. Hung
Lien : vide.pdf - | Full Text + Links | PDF (780 K)

[12] : The effect of sputtered interface metallic layers on reinforced core
laminate making build-up structures, Pages 1075-1079
Paavo Jalonen and Aulis Tuominen
Lien : vide.pdf - | Full Text + Links | PDF (152 K)

[13] : Effect of misalignment on electrical characteristics of ACF joints for
flip chip on flex applications, Pages 1081-1090
S. H. Fan and Y. C. Chan
Lien : vide.pdf - | Full Text + Links | PDF (418 K)

[14] : Low cost flex substrates for miniaturized electronic assemblies, Pages
1091-1099
F. Barlow, A. Lostetter and A. Elshabini
Lien : vide.pdf - | Full Text + Links | PDF (418 K)

[15] : Study of the optimal layout of cooling fins in forced convection cooling,
Pages : 1101-1111
Octavio Leon, Gilbert De Mey and Erik Dick
Lien : vide.pdf - | Full Text + Links | PDF (306 K)

[16] : Behavioral study of passive components and coating materials under
isostatic pressure and temperature stress conditions, Pages 1113-1120
B. Trégon, Y. Ousten, Y. Danto, L. Bechou and B. Parmentier
Lien : vide.pdf - | Full Text + Links | PDF (577 K)

[17] : A multiprocess performance analysis chart based on the incapability index
Cpp: an application to the chip resistors, Pages 1121-1125
W. L. Pearn, C. H. Ko and K. H. Wang
Lien : vide.pdf - | Full Text + Links | PDF (103 K)

[18] : Using statistical design of experiment to investigate the effect of firing
parameters on the electrical and magnetic properties of Mn¯Zn ferrite,
Pages : 1127-1132
K. I. Arshak, D. P. Egan and K. Phelan
Lien : vide.pdf - | Full Text + Links | PDF (221 K)

[19] : Analysis and design of thin film resonator ladder filters, Pages 1133-1140
A. T. Kollias and J. N. Avaritsiotis
Lien : vide.pdf - | Full Text + Links | PDF (202 K)

[20] : Hierarchical test generation for combinational circuits with real defects
coverage, Pages 1141-1149
T. Cibáková, M. Fischerová, E. Gramatová, W. Kuzmicz, W. A. Pleskacz, J.
Raik and R. Ubar
Lien : vide.pdf - | Full Text + Links | PDF (251 K)

[21] : The Computer Engineering Handbook; Vojin Oklobdzija. CRC Press, Boca
Raton, 2002. Hardcover, pp. 1338, plus XXII & 1-23 ISBN 0-8493-0885-2,
Page 1151
Mile Stojcev
Lien : vide.pdf - | Full Text + Links | PDF (34 K)

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