Revue : [REVUE309]

Titre : Elsevier Science, Microelectronics Reliability, Volume 35, Issue 1, Pages 1-135 (January 1995.

Cité dans : [DATA197] Les revues Microelectronics Reliability et Microelectronics Journal, ELSEVIER, décembre 2004.

Volume : 35, Issue 1,
Pages : 1-135 (January 1995)
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[1] : Some variants of polygon-to-chain reductions in evaluating reliability of
undirected network, Pages 1-11
Moon Soo Choi and Chi-Hyuck Jun
Lien : vide.pdf - | Journal Format-PDF (337 K)

[2] : Electrical measurements as early indicators of electromigration failure,
Pages : 13-25
B. K. Jones, Y. Z. Xu, T. C. Denton and P. Zobbi
Lien : vide.pdf - | Journal Format-PDF (583 K)

[3] : The optimal replacement of a Markovian deteriorative system under
stochastic shocks, Pages 27-31
Qiying Hu
Lien : vide.pdf - | Journal Format-PDF (278 K)

[4] : Bayes estimates of pointwise and interval availability with type I
censored samples, Pages 33-36
H. Krishna and K. K. Sharma
Lien : vide.pdf - | Journal Format-PDF (162 K)

[5] : Non-parametric distribution of the reliability function for some basic
system configurations, Pages 37-39
K. K. Sharma and Hare Krishna
Lien : vide.pdf - | Journal Format-PDF (127 K)

[6] : Reliability considerations of a selective-repeat ARQ policy for a data
communication system, Pages 41-44
Kazumi Yasui and Toshio Nakagawa
Lien : vide.pdf - | Journal Format-PDF (181 K)

[7] : Bayesian approach to prediction with outliers from the Burr type X model,
Pages : 45-47
Zeinhum F. Jaheen
Lien : vide.pdf - | Journal Format-PDF (154 K)

[8] : Posbist reliability behavior of fault-tolerant systems, Pages 49-56
Cai Kai-Yuan, Wen Chuan-Yuan and Zhang Ming-Lian
Lien : vide.pdf - | Journal Format-PDF (324 K)

[9] : Efficient estimation of the mean of an exponential distribution when two
outliers are present, Pages 57-63
T. Leo AlexanderN. Balakrishnan
Lien : vide.pdf - | Journal Format-PDF (251 K)

[10] : Stochastic analysis of systems with primary and secondary failures, Pages
65-71
Surendra M. Gupta
Lien : vide.pdf - | Journal Format-PDF (315 K)

[11] : A new mathematical approach to multi-area power system reliability
evaluation, Pages 73-80
Rajesh Pathak and Chanan Singh
Lien : vide.pdf - | Journal Format-PDF (458 K)

[12] : A new method to compute reliability of repairable series systems by
arbitrary distributions, Pages 81-85
Sergey V. Gurov and Lev V. Utkin
Lien : vide.pdf - | Journal Format-PDF (251 K)

[13] : An integro-differential equation related to Gaver's parallel system, Pages
87-89
E. J. Vanderperre
Lien : vide.pdf - | Journal Format-PDF (162 K)

[14] : Cost analysis, availability and MTTF of a three state standby complex
system under common cause and human failures, Pages 91-95
D. Pandey and Mendus Jacob
Lien : vide.pdf - | Journal Format-PDF (186 K)

[15] : MINQUE and PSD-MINQMBE in the two way cross classification random effect
model without interaction, Pages 97-99
Shaban Abdel-Magid
Lien : vide.pdf - | Journal Format-PDF (105 K)

[16] : On the design of a reliability circuit simulator, Pages 101-103
Jan Verweij and Meindert Lunenborg
Lien : vide.pdf - | Journal Format-PDF (170 K)

[17] : Inferences on availability ratio, Pages 105-108
Hare Krishna and K. K. Sharma
Lien : vide.pdf - | Journal Format-PDF (199 K)

[18] : A new increasing failure rate model for life time data, Pages 109-111
S. A. Siddiqui, Deoki Nandan, Sanjay Gupta and Manish Subharwal
Lien : vide.pdf - | Journal Format-PDF (134 K)

[19] : Analysis of reliability bounds for two-unit parallel and standby reparable
systems, Pages 113-115
Rakesh Gupta and Alka Chaudhary
Lien : vide.pdf - | Journal Format-PDF (126 K)

[20] : Explicit transient and steady state queue length probabilities of a
queueing model with server on vacation providing service intermittently,
Pages : 117-129
Sharda and Indra
Lien : vide.pdf - | Journal Format-PDF (342 K)

[21] : Further extensions to the Sherif-Dear simple theorem in number theory and
some remarks, Pages 131-135
Fatin Sezgin
Lien : vide.pdf - | Journal Format-PDF (270 K)

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