Revue : [REVUE298]

Titre : Elsevier Science, Microelectronics Reliability, Volume 38, Issue 10, Pages 1519-1645 (October 1998.

Cité dans : [DATA197] Les revues Microelectronics Reliability et Microelectronics Journal, ELSEVIER, décembre 2004.

Volume : 38, Issue 10,
Pages : 1519-1645 (October 1998)
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[1] : Solder joint reliability of a low cost chip size package¯¯NuCSP, Pages
1519-1529
J. H. Lau
Lien : vide.pdf - | Article | Journal Format-PDF (973 K)

[2] : Influence of thermal heating effect on pulsed DC electromigration result
analysis, Pages 1531-1537
P. Waltz, L. Arnaud, G. Lormand and G. Tartavel
Lien : vide.pdf - | Article | Journal Format-PDF (669 K)

[3] : The use of impedance spectroscopy, SEM and SAM imaging for early detection
of failure in SMT assemblies, Pages 1539-1545
Y. Ousten, S. Mejdi, A. Fenech, J. Y. Deletage, L. Bechou, M. G. Perichaud
and Y. Danto
Lien : vide.pdf - | Article | Journal Format-PDF (438 K)

[4] : Building in reliability with latch-up, ESD and hot carrier effects on 0.25
m CMOS technology, Pages 1547-1552
C. Leroux, P. Salome, G. Reimbold, D. Blachier, G. Guegan and M. Bonis
Lien : vide.pdf - | Article | Journal Format-PDF (349 K)

[5] : Experimental characterization of the continuous switching regime in
floating-body PD SOI MOSFETs, Pages 1553-1559
L. M. Perron, C. Hamaguchi, A. L. Lacaita, S. Maegawa and Y. Yamaguchi
Lien : vide.pdf - | Article | Journal Format-PDF (322 K)

[6] : RTS noise due to lateral isolation related defects in submicron nMOSFETs,
Pages : 1561-1568
N. Lukyanchikova, M. Petrichuk, N. Garbar, E. Simoen and C. Claeys
Lien : vide.pdf - | Article | Journal Format-PDF (393 K)

[7] : Low-frequency noise in thick-film structures caused by traps in glass
barriers, Pages 1569-1576
I. Mrak, M. M. Jevti and Z. Stanimirovi
Lien : vide.pdf - | Article | Journal Format-PDF (322 K)

[8] : Optimal burn-in for minimizing cost and multiobjectives, Pages 1577-1583
K. N. Kim
Lien : vide.pdf - | Article | Journal Format-PDF (202 K)

[9] : Off-state gate current with quasi-zero temperature coefficient in
n-MOSFETs with reoxidized nitrided oxide as gate dielectric, Pages
1585-1589
P. T. Lai, Jing-Ping Xu, H. B. Lo and Y. C. Cheng
Lien : vide.pdf - | Article | Journal Format-PDF (281 K)

[10] : Thermomechanical effects in metal lines on integrated circuits analysed
with a differential polarimetric interferometer, Pages 1591-1597
S. Dilhaire, T. Phan, E. Schaub and W. Claeys
Lien : vide.pdf - | Article | Journal Format-PDF (892 K)

[11] : Genetic algorithms for reliability design problems, Pages 1599-1605
Yi-Chih Hsieh, Ta-Cheng Chen and Dennis L. Bricker
Lien : vide.pdf - | Article | Journal Format-PDF (203 K)

[12] : Reliability assessment of a plastic encapsulated RF switching device,
Pages : 1607-1610
R. Mahajan and M. Pecht
Lien : vide.pdf - | Article | Journal Format-PDF (420 K)

[13] : Strain relaxation in SiGe due to process induced defects and their
subsequent annealing behavior, Pages 1611-1619
D. Misra and P. K. Swain
Lien : vide.pdf - | Article | Journal Format-PDF (327 K)

[14] : Impact of geometrical scaling on parasitic pnp bipolar transistor in
N-well, 0.25 m CMOS devices and its effect on latchup immunity, Pages
1621-1626
Kam-Chew Leong, Po-Ching Lin, Hok-Min Ho, Chock-Ming Gan and Lap Chan
Lien : vide.pdf - | Article | Journal Format-PDF (421 K)

[15] : The degradation of GaAlAs red light-emitting diodes under continuous and
low-speed pulse operations, Pages 1627-1630
T. Yanagisawa
Lien : vide.pdf - | Article | Journal Format-PDF (235 K)

[16] : Two-polarity pulse noise in reverse biased degraded p¯n junctions, Pages
1631-1637
M. M. Jevti
Lien : vide.pdf - | Article | Journal Format-PDF (228 K)

[17] : Stochastic analysis of a two-unit warm standby system with slow switch
subject to hardware and human error failures, Pages 1639-1644
M. A. W. Mahmoud and M. A. Esmail
Lien : vide.pdf - | Article | Journal Format-PDF (208 K)

[18] : Book Review, Page 1645
Lien : vide.pdf - Format-PDF (72 K)

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