| C.D. Bulucea |
National Semiconductor, CA, USA |
| S. Cristoloveanu |
CNRS, Grenoble, France |
| D. Dascalu |
IMT, Bucharest, Romania |
| R.B. Fair |
Duke University, NC, USA |
| U. M. Gosele |
Max-Planck Institute, Halle, Germany |
| R. Grigorovici |
Romanian
Academy, Romania |
| H.G. Grimmeiss |
Lund University, Sweden |
| A. Jelenski |
ITME, Warsaw, Poland |
| M.K. Lee |
Yonsei University, Seoul, Korea |
| H. Lüth |
ISI, Jülich, Germany |
| J. Millan |
CNM-CSIC, Barcelona, Spain |
| A. Mircea |
CNET, Bagneux, France |
| I. Munteanu |
University of Bucharest, Romania |
| Y. Okuto |
Nagoya City University, Japan |
| S.T. Pantelides |
Vanderbilt University, Nashville, TN, USA |
| M. Profirescu |
"Politehnica" University,
Bucharest, Romania |
| S. Selberherr |
Technical University Vienna, Austria |
| N. Stojadinovic |
Niš University, Yugoslavia |
| K. Sumino |
Nippon Steel Corp., Japan |
| S.M. Sze |
National Chiao Tung University,Taiwan |
| F.J. Tegude |
Duisburg University, Germany |
| A. Tugulea |
"Politehnica" University,
Bucharest, Romania |
