Article : [ART539]
Info : REPONSE 151, le 31/03/2004.
Titre : Reliability improvement methodology for cockpit high voltage power supplies.
Cité dans : [DATA035] Recherche sur les mots clés thermal + fatigue + semiconductor et reliability + thermal + cycle, mars 2004.Auteur : Chow, D.
Source : Proceedings of the SPIE - The International Society for Optical Engineering (1995) vol.2462, p.322-9. 4 refs.
Published by: SPIE-Int. Soc. Opt. Eng
Price: CCCC 0 8194 1815 3/95/$6.00
CODEN : PSISDG
ISSN : 0277-786X
SICI : 0277-786X(1995)2462L.322:RIMC;1-3
Conference: Cockpit Displays II. Orlando, FL, USA, 19-21 April 1995
Sponsor(s): SPIE
Document_Type : Conference Article; Journal
Treatment_Code : Practical
Info : Country of Publication : United States
Language : English
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Abstract :
High voltage power supplies (HVPS) have traditionally been among the least reliable components in airborne display electronics. NAVMAT P-4855-1A highlighted the source of these problems in industry's failure to apply appropriate methods for high voltage design, development and materials selection. Also, the nature of airborne HVPS is such that MTBF prediction using MIL-HDBK-217 has shown very little correlation to actual field performance. These problems continue today. In recent years, ELDEC has developed a methodology to systematically evaluate and improve the design and long term reliability of high voltage power supplies. This methodology has been successfully applied under a recent Air Force CRT PRAM contract to improve HVPS reliability in AWACS aircraft situation displays. The accelerated testing portion of the methodology has been recommended to the Air Force for adoption as a standard to be used in the procurement of future high voltage power supplies. Elements of the methodology are described.
Accession_Number : 1996:5157257 INSPEC
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