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These short documents  provide general information on the thermal testing of semiconductor devices. Each document covers a specific topic in 2 or 3 pages and are intended to be an on-going series that will grow in number as questions are submitted to the author, Bernie Siegal. TEA provides these technical briefs as a service to participants in the semiconductor thermal measurement, management and modeling field. Suggestions for additional topics are most welcome.

The technical briefs are  published in a ".pdf" file format that requires Adobe Acrobat Reader to view and print the contents of the file. If your browser is not yet equipped with the Acrobat Reader plug-in capability, you can download a free copy of this program by clicking on the image on the right and following the download instructions displayed.