The 5th THERMINIC Workshop | ||
3-6 October 1999, Rome, Italy Program overview|Detailed program|Tutorials|Proceedings, special issues of journals|Official Workshop web site at TIMA |
The 5th Therminic Workshop met in Rome from October 3 to 6, 1999. The workshop was organized by TIMA Laboratory and the TU Budapest, sponsored by the IEEE Computer Society, Test Technology Technical Council, the TIMA Laboratory in cooperation with the DETERMIN project supported by EC/ESPRIT, and with the European Test Technology Technical Committee. |
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This workshop gathered more than 80 submissions from around the world, out of which the program committee selected 42 contributions for oral presentation and 28 ones for poster presentation. This time, first in the history of the workshops, tutorials were organised. | |
Program overview |
SUNDAY 3 OCTOBER | ||
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9:30 | Tutorial A / Tutorial B | |
12:30 | Lunch | |
14:00 | Tutorial A / Tutorial B | MONDAY 4 OCTOBER |
8:00 | Registration | |
9:30 | Welcome
address
Opening address |
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9:40 | Invited
talk
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THERMAL PACKAGING FOR THE 21ST CENTURY: CHALLENGES AND OPTIONS |
10:20 | Session 1 | ADVANCED MEASUREMENT TECHNIQUES |
12:00 | Lunch | |
13:30 | Session 2 | TEMPERATURE MEASUREMENT AND MONITORING |
14:30 | Coffee | |
14:50 | Embedded Tutorial | A SURVEY ON COUPLED TRANSPORT PROCESSES IN THIN LIQUID FILMS FOR MICROCHANNEL HEAT TRANSFER APPLICATION |
15:10 | Session 3 | ADVANCED COOLING TECHNOLOGIES |
17:15 | Poster session 1 | |
19:00 | Reception | TUESDAY 5 OCTOBER |
8:30 | Invited talk | NEEDS AND TRENDS IN INDUSTRIAL THERMAL MANAGEMENT OF ELECTRONICS |
9:10 | Session
4
|
ELECTRO-THERMAL SIMULATION |
11:10 | Coffee | |
11:30 | Session 5 | EXPERIMENTAL VALIDATION OF NUMERICAL ANALYSIS |
13:15 | Lunch | |
14:30 | Vendors Session | |
16:00 | Session 6 | STUDIES ON THERMAL MATERIAL PARAMETERS |
17:20 | Coffee | |
17:40 | Poster session 2 | |
19:00 | Diner | |
20:30 | Panel | WHAT ARE THE EXPECTATIONS OF THE ELECTRONICS INDUSTRY FROM THE THERMAL ACADEMIC COMMUNITY ? | WEDNESDAY 6 OCTOBER |
9:00 | Invited talk | THERMAL STRESS IN MICROELECTRONICS PACKAGING: PROBABILISTIC APPROACH |
9:40 | Coffee | |
10:00 | Embedded Tutorial | THERMAL CHARACTERISATION BY COMPACT MODELS: WHERE ARE WE ? |
10:20 | Session 7 | THERMAL AND THERMOMECHANICAL CHARACTERISATION |
12:00 | Lunch | |
13:00 | Session 8 | MEMS |
14:20 | Coffee | |
14:40 | Session 9 | THERMAL ANALYSIS TECHNIQUES |
15:40 | Closing remarks |
Detailed program |
MONDAY 4 OCTOBER | ||
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8:00-9:30 | Registration | |
9:30-9:40 | Welcome
address: B. Courtois, General Chair, TIMA Laboratory, Grenoble, France
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9:40-10:20 | Invited
talk: A. Bar-Cohen, University of Minnesota, USA
Chair: V. Székely, TU of Budapest, Hungary |
THERMAL PACKAGING FOR THE 21ST CENTURY: CHALLENGES AND OPTIONS |
10:20-12:00 | Session
1
Chair: O. Slattery, NMRC, Ireland |
ADVANCED MEASUREMENT TECHNIQUES |
10:20 | V. Székely1,
S. Ress1, A. Poppe1, S. Török1,
D. Magyari1, Zs. Benedek1, B. Courtois2,
M. Rencz3 1TU of Budapest, Hungary 2TIMA, Grenoble, France 3MicRed, Budapest, Hungary |
Transient thermal measurements for dynamic package modeling: new approaches |
10:40 | N. Trannoy, S. Gomès,
P. Grossel U. of Reims, France |
Thermal characterization of measurement by STM and STHM |
11:00 | M. Rohde Forschungszentrum Karlsruhe, Germany |
Nondestructive testing and determination of thermal parameters in thin films and microcomponents |
11:20 | R. Grimes, M. Davies U. of Limerick, Ireland |
PIV measurements of cooling fan aerodynamics |
11:40 | N. Mathis Mathis Inst., Fredericton, Canada |
New instrument for thermal management design |
12:00-13:30 | Lunch | |
13:30-14:30 | Session
2
Chair: D. De Cogan, U. of East Anglia, United Kingdom |
TEMPERATURE MEASUREMENT AND MONITORING |
13:30 | M. Janicki, A. Napieralski TU of Lodz, Poland |
New approach to electronic circuit temperature monitoring |
13:50 | R.A. Bianchi1,
J.M. Karam1, B. Courtois1, R. Nadal2, F.
Pressecq3, S. Sifflet4 1TIMA, Grenoble, France 2UPC Barcelona, Spain 3CNES, Toulouse, France 4TRS31, Auterive, France |
CMOS compatible temperature sensor with digital output for wide temperature range applications |
14:10 | H. Bellaj, J.M.
Dorkel, P. Tounsi, Ph. Leturcq LAAS, Toulouse, France |
Validity and limits of the junction temperature concept for integrated power devices |
14:30-14:50 | Coffee | |
14:50-15:10 | Embedded Tutorial C.P. Tso, S.P. Mahulikar, Nanyang TU, Singapore Chair: G. De Mey, U. Gent, Belgium |
A SURVEY ON COUPLED TRANSPORT PROCESSES IN THIN LIQUID FILMS FOR MICROCHANNEL HEAT TRANSFER APPLICATION |
15:10-17:10 | Session
3
Chair: G. De Mey, U. Gent, Belgium |
ADVANCED COOLING TECHNOLOGIES |
15:10 | C. Perret1,2,
J. Boussey2, Ch. Schaeffer1, M. Coyaut1 1LEG, Grenoble, France 2LPCS, Grenoble, France |
Integration of cooling devices in silicon technology |
15:30 | G.B. Russell, W.Z.
Black, J.G. Hartley, A. Glezer Georgia Inst. of Techno, Atlanta, USA |
Microjet cooling of single level integrated modules |
15:50 | P. Dziurdzia, A.
Kos U. of Mining and Metallurgy, Krakow, Poland |
Electrothermal macromodel of active heat sink for cooling process simulation |
16:10 | G.I. Sultan Mansoura U., Egypt |
Enhancing forced convection heat transfer from multiple protruding heat sources simulating electronic components in a horizontal channel by passive cooling |
16:30 | D.G. Wang NCR, San Diego, USA | Expanding conventional system level forced air-cooling envelope |
16:50 | C.H. Amon Carnegie Mellon U., Pittsburgh, USA |
Metrics for transient cooling of portable electronics |
17:15-19:00 | Poster
session 1
Chair: M. Rencz, Techn. Univ. of Budapest, Hungary |
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N. Pesare, A. Giorgio,
B.M. Bobbo, A.G. Perri Politecnico di Bari, Italy |
A new electrothermal simulator of GaAs MESFETs for optimal layout design of MMICs | |
K.O. Petrojanc1,
I.A. Kharitonov1, P. Maltcev1, N.I. Rjabov1,
L.N. Kravtchenko2, A.N. Sapelnikov2 1MUEM, Moscow, Russia 2Science and Research Inst. of Molecular Electr., Moscow, Russia |
High-speed digital GaAs ICs electro-thermal simulation with PSPICE | |
T. Franke Siemens, München, Germany |
Thermal modelling of multichip assemblies | |
M.Rencz, V. Székely,
Zs. Kohari, S. Ress, A. Pàhi, A. Poppe TU of Budapest, Hungary |
Thermal evaluation of the SIP9 package | |
S. Ramminger1,
J.G. Bauer1, T. Scherg1, H.J. Schulze1, K.
Mosig2, G. Wachutka3 1Siemens, München, Germany 2Infineon, Villach, Austria 3München U. of Techno., Germany |
Temperature behavior of power devices with copper metallisation using thermal simulation | |
R. Schacht1,
M. Kasper2, H. Reichl1 1TU of Berlin, Germany 2TU Hamburg-Harburg, Germany |
Macro modelling for transient simulation of coupled electro-thermal problems for an IGBT module | |
E.W. Kreutz1,
N. Pirch1, T. Ebert2,3, R. Wester2, B. Ollier2,3,
P. Loosen2, R. Poprawe1,2 1LLRWTH, Aachen, Germany 2Fraunhofer-Inst. für Lasertechnik, Aachen, Germany 3PROLAS, Aachen, Germany |
Simulation of micro-channel heat sinks for optoelectronic microsystems | |
S. Galliou, M. Mourey ENSMM, Besançon, France |
Simulation of thermal regulated ultra stable quartz oscillator | |
A.G. Madera, M.Sh.
Sourgouladze Russian Acad. of Science, Moscow, Russia |
Stochastical temperature fields in ICs and electron modules and method for their calculation | |
A. Poppe, Gy. Csaba,
K. Tarnay, V. Székely TU of Budapest, Hungary |
Considering electro-thermal interations in sub-micron n-MOS transistor on microscopi scale within a 3D particle dynamics based monte carlo simulator | |
F.H. Fernandez Morales,
J. Samitier U. of Barcelona, Spain |
Thermal behaviour of a bioparticle microhandler: a transient approach | |
D. Fedasyuk, E.
Levus, M. Mykhalchuk, D. Petrov State U. Lvivska Polytech, The Ukraine |
Modelling and analysis of methods of providing thermal performance of flip-chip structure | |
E. Chen Xiansong Hewlett-Packard, Singapore |
Thermal performance study for a MCMS infrared transceiver by FEM | |
J. Diefenbach1,
F. Hiller2, R. Vahrmann2 1DaimlerChrysler, Frankfurt, Germany 2TEMIC, Heilbronn, Germany |
THERESCA: a tool to calculate the thermal resistance of an electronic package | |
19:00 | Reception | |
TUESDAY 5 OCTOBER | ||
8:30-9:10 | Invited
talk: J. Rantala, Nokia, Helsinki, Finland
Chair: C. Lasance, Philips, Eindhoven, The Netherlands |
NEEDS AND TRENDS IN INDUSTRIAL THERMAL MANAGEMENT OF ELECTRONICS |
9:10-11:10 | Session
4
Chair: J.M. Dorkel, LAAS, Toulouse, France |
ELECTRO-THERMAL SIMULATION |
9:10 | M.N. Sabry1,
H. Haddara2, K. Abdel-Salam3, M. Awad1, A.
Nasser3 1Mansoura U., Egypt 2Mentor Graphics, Egypt 3Tenth of Ramadan Higher Tech. Inst., Egypt |
Investigation of self heating in SIMOX transistors operated at high temperatures using a boundary value problem formulation |
9:30 | P. Tounsi, K. Bellil,
J.M. Dorkel LAAS-INSAT, Toulouse, France |
Transient electrothermal computation: large power IGBT and MOS modules in on-state operating conditions |
9:50 | C. Harlander1,
R. Sabelka1, R. Minixhofer2, S. Selberherr1 1TU Vienna, Austria 2Austria Mikro Systeme Intl, Unterpremstätten, Austria |
Three-dimensional transient electro-thermal simulation |
10:10 | D. D'Amore, P. Maffezzoni Politecnico di Milano, Italy |
Electro-thermal analysis of paralleled bipolar devices |
10:30 | M. Jakovljevic,
P. Fotiu, Z. Mrcarica, H. Detter TU Wien, Austria |
A method for simultaneous 3D electro-thermal simulation of microsystems |
10:50 | G. Breglio1,
F. Frisiana2, A. Magri2, P. Spirito1 1U. of Napoli, Italy 2STMicroelectronics, Catania, Italy |
Thermal mapping of new cellular power MOS affected by electro-thermal instability |
11:10-11:30 | Coffee | |
11:30-13:10 | Session
5
Chair: K. Azar, Lucent Technologies, Andover, USA |
EXPERIMENTAL VALIDATION OF NUMERICAL ANALYSIS |
11:30 | M.N. Sabry Mansoura U., Egypt |
Scale effects on fluid flow and heat transfer in micro-channels |
11:50 | D. Newport1,
M. Davies1, T. Dalton1, M. Whelan2 1U. of Limerick, Ireland 2Joint Research Centre, Ispra, Italy |
An optical and numerical investigation into the temperature and velocity fields about an enclosed PCB with an array of simulated 2D components in free convection |
12:10 | J. Lohan, P. Tiilikka,
C.M. Fagar, J. Rantala Nokia, Helsinki, Finland |
Effect of PCB thermal conductivity on the operating temperature of an SO-8 package in a natural convection environment: experimental measurement versus numerical prediction |
12:30 | P. Rodgers1,
J. Lohan2, V. Eveloy2 1U. of Limerick, Ireland 2Nokia, Helsinki, Finland |
Impact of both convective environment and PCB conductivity on the distribution of heat transfer from three electronic component package types-operating on single-and multi-component printed circuit boards |
12:50 | D. Agonafer1,
R. Schmidt1, A. Free2 1IBM, Poughkeepsie, USA 2Maya Heat Transfer Technologies, USA |
A coupled conjugate model of the internal and external resistance of a TCM |
13:15-14:15 | Lunch | |
14:30-16:00 | Vendors' Session | |
16:00-17:20 | Session
6
Chair: J.B. Saulnier, ENSMA, Poitiers, France |
STUDIES ON THERMAL MATERIAL PARAMETERS |
16:00 | M. Malinski, L.
Bychto TU of Koszalin, Poland |
Photoacoustic studies of the absorption coefficient of CdTe |
16:20 | M. Malinski, L.
Bychto TU of Koszalin, Poland |
The influence of the quality of the semiconductor surface on the photoacoustic signal characteristics on the example of CdTe studies |
16:40 | A. Drushinin, Y.
Pankov, I. Maryamova, Y. Khoverko Lviv Polytech. State U., The Ukraine |
The Piezo-seebeck effect in p-type silicon |
17:00 | J. Zakrzewski1,
F. Firszt1, S. Legowski1, H. Meczynska1,
B. Sekulska1, J. Szatkowski1, W. Paszkowicz2 1Inst. of Physics, Torun, Poland 2Polish Academy of Sciences, Warsaw, Poland |
Photoacoustic investigations of beryllium containing wide gap II-VI mixed crystals |
17:20-17:40 | Coffee | |
17:40-18:40 | Poster
session 2
Chair: M. Rencz, Techn. Univ. of Budapest, Hungary |
|
V.Székely1,
A. Nagy1, S. Török1, E. Nikodemusz-Székely2,
M.Rencz3 1TU of Budapest, Hungary 2Res. Inst. for Comp. Automation, Budapest, Hungary 3MicRed, Budapest, Hungary |
Electrically controlled thermal resistance: an experiment | |
G.C. Albright1,
J.A. Stump1, J.D. McDonald1, H. Kaplan2 1Quantum Focus Instr., Shelton, USA 2Honeyhill Techn. Comp., Norwalk |
"True" temperature measurements on microscopic semiconductor targets | |
R. Houlihan, G.
Kelly, C. Lyden NMRC, Cork, Ireland |
Development of behavioural models of resonant sensor elements subject to residual stress | |
V. Golembo, V. Kotlarov,
S. Kharytonov State U. "Lviv Polytechnic", The Ukraine |
The piezoquartz temperature sensor's interfac modules | |
N.F. Strarodub,
V.M. Starodub NASU, Kyiv, The Ukraine |
Microthermal enzymatic sensor for the express monitoring of the cyanide content in water | |
Yu.P. Dotsenko,
T.Ya. Gorbach, L.O. Matveeva, P.S. Smertenko, S.V. Svechnikov, E.F. Venger NASU, Kyiv, The Ukraine |
Dimensionless sensitivity as a base for modeling of thermometric characteristics of thermodiode sensors | |
M. Davies, E. Kehoe,
J. Punch U. of Limerick, Ireland |
Thermal gradients and electronic component reliability | |
N.R. Kamat Chartered Semiconductor, Singapore |
Investigating reliability on the 5 metal single poly 0.25um CMOS process | |
S. Volz1,
J.B. Saulnier1, G. Chen2, P. Beauchamp3 1LET, Poitiers, France 2UCLA, Los Angeles, USA 3U. of Poitiers, Futuroscope, France |
Computation thermal conductivity of superlattices by molecular dynamics technique | |
R.A. Bianchi, J.M.
Karam, B. Courtois TIMA, Grenoble, France |
Pressure and temperature integrated measurement system for high temperature oil well applications based on ALC crystal oscillators | |
Ch. S. Roumenin,
A. Ivanov, P. Nikolova Inst. of Control & System Research, Sofia, Bulgaria |
Thermogradiometer sensor based on differential microdiode | |
M. Strasser1,2,
F. Flötz1, R. Aigner1, G. Wachutka2 1Infineon, München, Germany 2München U. of Techno., Germany |
Device performance of CMOS low power thermoelectric generators | |
19:00-20:30 | Diner | |
20:30 | Panel
Moderator: D. Agonafer, IBM, Poughkeepsie, USA Panelists: |
WHAT ARE THE EXPECTATIONS OF THE ELECTRONICS INDUSTRY FROM THE THERMAL ACADEMIC COMMUNITY ? |
WEDNESDAY 6 OCTOBER | ||
9:00-9:40 | Invited
talk: E. Suhir, Lucent Technologies, Murray Hill, USA
Chair: B. Courtois, TIMA, Grenoble, France |
THERMAL STRESS IN MICROELECTRONICS PACKAGING: PROBABILISTIC APPROACH |
9:40-10:00 | Coffee | |
10:00-10:20 | Embedded Tutorial C. Lasance, Philips, Eindhoven, The Netherlands Chair: T. Tarter, AMD, Sunnyvale, USA |
THERMAL CHARACTERISATION BY COMPACT MODELS: WHERE ARE WE ? |
10:20-12:00 | Session
7
Chair: T. Tarter, AMD, Sunnyvale, USA |
THERMAL AND THERMOMECHANICAL CHARACTERISATION |
10:20 | J.M. Bosc1,
P. Dupuy1, J. Gil1, J.M. Dorkel2, G. Sarrabayrouse2 1Motorola, Toulouse, France 2LAAS, Toulouse, France |
Thermal characterization: a key element for accelerating stress testing |
10:40 | D. Giusti, G. Verzellesi,
G.U. Pignatel U. of Trento, Italy |
Thermo-mechanical analysis of microstructures for chemoresistive gas sensors |
11:00 | S. Leseduarte1,
S. Marco1, E. Beyne2, R. van Hoof2, A. Marty3,
S. Pinel3, O. Vendier4, A. Coello-Vero4 1U. of Barcelona, Spain 2IMEC, Leuven, Belgium 3LAAS, Toulouse, France 4Alcatel Space Industries, Toulouse, France |
Residual thermo-mechanical stresses in thinned chip assemblies |
11:20 | S. Van Dooren1,
B. Vandevelde1, E. Beyne1, F. Christiaens2,
D. Corlatan2 1IMEC, Leuven, Belgium 2Alcatel Bell, Antwerpen, Belgium |
Parametric compact models for flip chip assemblies |
11:40 | L. Gleton1,
P. Lybaert1, B. Dessart2, D. Petitjean2,
A. Sturbois2 1Fac Polytech. of Mons, Belgium 2Alcatel ETCA, Charleroi, Belgium |
Static and dynamic thermal characterization of a 28 J-lead ceramic package-application of the DELPHI methodology |
12:00-13:00 | Lunch | |
13:00-14:20 | Session
8
Chair: M.N. Sabry, Mansoura U., Egypt |
MEMS |
13:00 | A. Kruusing, S.
Leppävuori, A. Uusimäki, H. Moilanen U. of Oulu, Finland |
Piezoelectric drive for agitation and pumping of coolant in ltcc multilayer modules |
13:20 | U. Dillner, E. Kessler,
J. Müller IPHT, Jena, Germany |
High sensitivity micromachined heat flux sensor: the problem of heat flow field distortion |
13:40 | J.E. Duarte1,2,
M. Moreno2, E. Martin-Badosa2 1TU of Colombia, Colombia, 2U. of Barcelona, Spain |
Design and characterization of thermally actuated bimetallic membrane |
14:00 | E. Burian1,
T. Lalinsky1, M. Drzik2 1Inst. of EE, Bratislava, Slovakia 2Inst. of Constr. & Archit., Bratislava, Slovakia |
Simulation of thermally exited GaAs micromachined microactuator |
14:20-14:40 | Coffee | |
14:40-15:40 | Session
9
Chair: J. Parry, Flomerics, Hampton Court, United Kingdom |
THERMAL ANALYSIS TECHNIQUES |
14:40 | V.Székely1,
A. Pàhi1, A. Poppe1, M. Rosental1,
T. Teszéri1, M. Rencz2 1TU of Budapest, Hungary 2MicRed, Budapest, Hungary |
Thermal time constant analysis and implementation in the THERMAN and SUNRED thermal simulation tools |
15:00 | M. Bologna, E. Dallago,
G. Venchi U. of Pavia, Italy |
Thermal analysis of a portable PC |
15:20 | S. Koziel, W. Szczesniak TU of Gdansk, Poland |
Application of evolutionary algorithms to VLSI circuits partitioning with reduction of thermal interactions between elements |
15:40 | Closing remarks |
Proceedings, special issues of journals | ||
The informal proceedings of the workshop is formed by the Collection of papers presented at the 5th Therminic Workshop (368 pages), which was distributed among the workshop participants. Limited number of copies is available for FF200 from TIMA. As follow up to the Workshop special issue of the Microelectronics Journal and a special issue of the IEEE Transactions on Components, Packaging and Manufacturing Technology are being organised based on contributions presented at the 5th Workshop and other original papers. These issues will form the formal proceedings of the workshop. |
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