D.E. PICCONE, L.J. WILLINGER, I.L. SOMOS, W.H. TOBIN, R.M. ANDRACA, L.O. ERIKSSON, J.A. BARROW, M.L. CHILDS, J. SCHWARTZENBERG, "Clarification of Non-repetitive On-state Surge Current Ratings - Insight Into Proposed Ratings for Pulse Power Applications -
Copyright - [Précédente] [Première page] [Suivante] - Home

Article : [SHEET272]

Titre : D.E. PICCONE, L.J. WILLINGER, I.L. SOMOS, W.H. TOBIN, R.M. ANDRACA, L.O. ERIKSSON, J.A. BARROW, M.L. CHILDS, J. SCHWARTZENBERG, Clarification of Non-repetitive On-state Surge Current Ratings - Insight Into Proposed Ratings for Pulse Power Applications - SPT400 Series 125mm Thyristors, APPLICATION NOTES, Silicon Power Corporation, fall 1997.

Cité dans : [DATA043] Silicon Power, Technical papers, mars 2000.
Cité dans :[THESE090] S. MOREAU, Fiabilité environnementale des composants de puissance : le TRIAC, Thèse de Doctorat, soutenue le 17 mai 2005, 127 pages.
Auteur : D.E. Piccone
Auteur : L.J. Willinger
Auteur : I.L. Somos
Auteur : W.H. Tobin
Auteur : R.M. Andraca
Auteur : L.O. Eriksson
Auteur : J.A. Barrow
Auteur : M.L. Childs
Auteur : J. Schwartzenberg

Lien : An125mm.pdf - 119 Ko - 125mm SCR, Light Silicon Sandwich Application Notes
Info : SPCO Silicon Power Corporation - 175 Great Valley Pkwy - Malvern, PA 19355 USA
Stockage :

INTRODUCTION :


A. Need for Highest Power Thyristors

TOP

There is a growing need in the market for thyristors of the highest
voltage design that can endure heavy fault currents as experienced in new
electrical power systems or operating in the pulse power mode as for mili-tary
weapons and other government laser and magnet supplies. An example
of a milestone already past is the installation of 100 mm thyristors on the 500
kV AC transmission line of BPA-Slatt substation: thyristor controlled series
compensation, {TCSC} [1]. In that application, the most demanding pa-rameter
to meet was the high multi-cycle asymmetrical fault current. It was
necessary to predict fault withstand capability [2] according to the highest
available standard as designated faults were to be expected and not consid-ered
as rare occurrence. Pulse power duty, on the other hand, are single
shot events with durations usually less than 8.3 ms and peak current much
higher than normally encountered.
When circuit designers encounter more of these stringent surge duty
applications, they are sure to realize the inadequacy of normally published
surge current data. Moreover if they are to make an evaluation and choose
from contending devices using non-repetitive surge current, I TSM ratings as
an essential criteria, they will be mislead. Consequently one should make
specific inquires to thyristor manufacturers so as to develop a mutual under-standing
of the real surge current requirement. including details about verifi-cation
testing and life expectancy.

REFERENCES : 6
[1] : D.J. McDonald, J. Urbanek, B.J. Damsky, Modeling and testing of a thyristor for controlled series compensation (TCSC), IEEE Power Engineering Society, 1993 Winter Meeting.
[2] : I.L. Somos, D.E. Piccone, L.J. Willinger & W.H. Tobin, Power semiconductors - a new method for predicting the on-state characteristic and temperature rise during multicycle fault currents, IEEE Transactions on Industry Applications, Nov.-Dec. 1995
[3] : I.L. Somos, D.E. Piccone, L.J. Willinger & W.H. Tobin, Power semiconductors - empirical diagrams expressing life as function of temperature excursion, IEEE Trans-actions on Magnetics, January 1993 and Sixth Symposium on Electromagnetic Launch Technology, Conference Proceeding, 1992
[4] : L.O. Eriksson, D.E. Piccone, L.J. Willinger & W.H. Tobin, Selecting fuses for power semiconductor devices, IEEE Industry Applications Magazine, Sept./Oct. 1996
[5] : B. Freydin , Device failure prediction under surge current conditions The EXTERMINATOR, June 1996, Silvaco International
[6] : R. Dethlefsen, Evolving pulse power industrial market requires better solid state switches, PCIM Magazine, February, 1996 Silicon Power COrporation.

  [1] : [SHEET220] L.O. ERIKSSON, D.E. PICCONE, L.J. WILLINGER, W.H. TOBIN, Selecting fuses for power semiconductor devices, IEEE Industry Applications Magazine, Volume 2, Issue 5, Sept.-Oct. 1996, pp. 19-23.


Mise à jour le lundi 10 avril 2023 à 18 h 59 - E-mail : thierry.lequeu@gmail.com
Cette page a été produite par le programme TXT2HTM.EXE, version 10.7.3 du 27 décembre 2018.

Copyright 2023 : TOP

Les informations contenues dans cette page sont à usage strict de Thierry LEQUEU et ne doivent être utilisées ou copiées par un tiers.
Powered by www.google.fr, www.e-kart.fr, l'atelier d'Aurélie - Coiffure mixte et barbier, La Boutique Kit Elec Shop and www.lequeu.fr.