Article : [SHEET272]
Titre : D.E. PICCONE, L.J. WILLINGER, I.L. SOMOS, W.H. TOBIN, R.M. ANDRACA, L.O. ERIKSSON, J.A. BARROW, M.L. CHILDS, J. SCHWARTZENBERG, Clarification of Non-repetitive On-state Surge Current Ratings - Insight Into Proposed Ratings for Pulse Power Applications - SPT400 Series 125mm Thyristors, APPLICATION NOTES, Silicon Power Corporation, fall 1997.
Cité dans : [DATA043] Silicon Power, Technical papers, mars 2000. Cité dans :[THESE090] S. MOREAU, Fiabilité environnementale des composants de puissance : le TRIAC, Thèse de Doctorat, soutenue le 17 mai 2005, 127 pages.Auteur : D.E. Piccone
Lien : An125mm.pdf - 119 Ko - 125mm SCR, Light Silicon Sandwich Application Notes
Info : SPCO Silicon Power Corporation - 175 Great Valley Pkwy - Malvern, PA 19355 USA
Stockage :
INTRODUCTION :
A. Need for Highest Power Thyristors |
REFERENCES : 6
[1] : D.J. McDonald, J. Urbanek, B.J. Damsky, Modeling and testing of a thyristor for controlled series compensation (TCSC), IEEE Power Engineering Society, 1993 Winter Meeting.
[2] : I.L. Somos, D.E. Piccone, L.J. Willinger & W.H. Tobin, Power semiconductors - a new method for predicting the on-state characteristic and temperature rise during multicycle fault currents, IEEE Transactions on Industry Applications, Nov.-Dec. 1995
[3] : I.L. Somos, D.E. Piccone, L.J. Willinger & W.H. Tobin, Power semiconductors - empirical diagrams expressing life as function of temperature excursion, IEEE Trans-actions on Magnetics, January 1993 and Sixth Symposium on Electromagnetic Launch Technology, Conference Proceeding, 1992
[4] : L.O. Eriksson, D.E. Piccone, L.J. Willinger & W.H. Tobin, Selecting fuses for power semiconductor devices, IEEE Industry Applications Magazine, Sept./Oct. 1996
[5] : B. Freydin , Device failure prediction under surge current conditions The EXTERMINATOR, June 1996, Silvaco International
[6] : R. Dethlefsen, Evolving pulse power industrial market requires better solid state switches, PCIM Magazine, February, 1996 Silicon Power COrporation.
[1] : [SHEET220] L.O. ERIKSSON, D.E. PICCONE, L.J. WILLINGER, W.H. TOBIN, Selecting fuses for power semiconductor devices, IEEE Industry Applications Magazine, Volume 2, Issue 5, Sept.-Oct. 1996, pp. 19-23.
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