G. GUFFROY, G. SIMON, "A pragmatic methodology for the monitoring of the electronic components ageing :The case of power thyristors at EDF", ESREF'2001, pp. 1701-1705

G. GUFFROY, G. SIMON, "A pragmatic methodology for the monitoring of the electronic components ageing :The case of power thyristors at EDF", ESREF'2001, pp. 1701-1705 Copyright - [Précédente] [Première page] [Suivante] - Home

Article : [PAP373]

Titre : G. GUFFROY, G. SIMON, A pragmatic methodology for the monitoring of the electronic components ageing :The case of power thyristors at EDF, ESREF'2001, pp. 1701-1705

Cité dans : [DATA227] ESREF'2001, 12th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Arcachon, France , 1-5 octobre 2001.

Auteur : G. Guffroy
Auteur : G. Simon

Adresse : EDF R&D - France
Source : ESREF'2001 - 12th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - Arcachon - France.
Date : 1-5 octobre 2001
Site : http://www.elsevier.com/locate/microrel
Pages : 1701 - 1705
Lien : private/GUFFROY.pdf - 5 pages, 76 Ko.

Abstract :
Electricité de France (EDF) aims at lengthening the life of its electronic equipment with a crucial care for
availability and safety. A project is currently conducted to identify the main ageing mechanisms of the electronic
components. Our goal is to define a method to monitor the ageing process and to evaluate the residual life of the
field components. The life duration of power thyristors is usually considered to be limited by ageing phenomena.
Analyses were conducted on thyristors of the field to identify a measurable parameter for which an end of life
criteria could be determined. Results showed that the gate current threshold can be monitored to assess the level
of ageing of the thyristors. However, the ageing phenomenon is not activated by the self heating of the
components. This result is in contradiction with our first assumption.

Bibliographie

Références : 4
[1] : T.I. Bajenescu et al., Reliability of electronic components, Ed. Springer, 1999.
[2] : T. Stoop et al., Life testing of high power thyristors under extreme electrical and thermal conditions, IEEE, congress, 1978.
[3] : M. Cepek et al., Thyristor aging, Proceedings of Powercon ’98, IEEE Power Eng. Soc., 1998.
[4] : Norme UTE C 80-810 : Composants électroniques - Recueil de données de fiabilité (1997).

  [1] : [LIVRE137] T.I. BAJENESCU, M.I. BAZU, Reliability of electronics components - A practical guide to electronic systems manufacturing, Springer, 1999, 509 pages.
  [2] :  [PAP158]  -------
  [3] :  [PAP158]  -------
  [4] :  [PAP158]  -------

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