J.W. ORTON, P. BLOOD, "The Electrical characterization of semiconductors : measurement of minority carrier properties (techniques of physics 13)", Academic Press Inc, 1990, 320 pages.

J.W. ORTON, P. BLOOD, "The Electrical characterization of semiconductors : measurement of minority carrier properties (techniques of physics 13)", Academic Press Inc, 1990, 320 pages. Copyright - [Précédente] [Première page] [Suivante] - Home

Livre : [LIVRE035]

Titre : J.W. ORTON, P. BLOOD, The Electrical characterization of semiconductors : measurement of minority carrier properties (techniques of physics 13), Academic Press Inc, 1990, 320 pages.

Auteur : J.W. Orton
Auteur : Peter Blood

Année : août 1990
Stockage : Bibliothèque LMP
Info. : LMP98-05
Mots_clés : silicium
Référence : 9802/LMP
Date_d'achat : 27-Jan-98
Prix : 644.05 F
Pages : 1 - 320
Editeur : Academic Press Inc
Langue : Anglais
ISBN-10 : 0125286252
ISBN-13 : 978-0125286251

Book_Description :
This is the first comprehensive and unified treatment to describe the physical principles behind experimental techniques used for measuring the electrical properties of semi conductors. The principles involved are illustrated by reference to selected examples drawn from the world of semiconductor materials. By concentrating on the physical principles of each technique and enumerating its inherent limitations the authors have produced a text that will be helpful in solving a variety of problems in semiconductor characterization and one that will not be quickly outdated by developments in the materials themselves.

Table_des_matières :

Introduction. Minority Carrier Recombination and Generation. Steady State Methods of Measuring Lifetime. Transient Methods for Measuring Lifetime. Transient Methods for Measuring Lifetime. Modulation Methods for Measuring Lifetime. The Diode Step Recovery Method of Measuring Lifetime. Scanning Methods of Measuring Diffusion Length. Non-Scanning Methods of Measuring Diffusion Length.

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