Interfacial Degradation and the Role of Oxygen
Interstitials.
R.A.B. DEVINE
The Photorefractive Bragg Gratings in the Fibers for
Telecommunications.
B. POUMELLEC and F. KHERBOUCHE
An Overview of Buried Oxides on Silicon: New Processes and
Radiation Effects.
Jean-Luc LERAY, Philippe PAILLET and Jean-Luc
AUTRAN
Ultrafast Optical Measurements of Defect Creation
in Laser Irradiated .
Guillaume PETITE, Philippe
DAGUZAN, Stéphane GUIZARD and
Philippe MARTIN
Amorphization of -Quartz under Irradiation.
L.
DOUILLARD and J.P. DURAUD
Regular Papers
Materials Science
Electrical Properties of Silver Impurities and their Annealing
Behaviour in p-Type Fz Silicon.
G.A. ADEGBOYEGA, L. PASSARI, M.A. BUTTURI, A. POGGI and
E. SUZI
Improvement of the Electrical Properties of Layered
Semiconductor Thin Films by Iodine Treatment.
J.C. BERNEDE, H. HADOUDA, S.J. LI, H. ESSAIDI, J.
POUZET and A. KHELIL
Transient Photo Conductivity Decay Study on Polycrystalline
Silicon.
V. SUBRAMANIAN and J. SOBHANADRI
Instrumentation
A Laser-Vibrometer Measuring System Applied to the
Analysis of Ultrasonics Motors. (Text in French).
A. FERREIRA, P. LE MOAL and P. MINOTTI
Physics of Electronic Devices
Analysis by Analytical Method of the Working of a
Triode High Frequency
Induction Generator for Inductive Plasma
Torch. (Text in French).
Roland ERNST
Miniaturized Shape Memory Alloy Actuators Fabricated
Using Microstereophotolithography. (Text in French).
S. BALLANDRAS,
M. CALIN, S. ZISSI, A.
BERTSCH, J.C. ANDRÔ, A. BOURJAULT and
D. HAUDEN
Physics of Energy Transfers
Inter-Strand Coupling Losses in Superconducting Power
Cables Without Coaxial Magnetic Shielding
S. STENGER, P. MANUEL
and F. BOUILLAULT
Induction Machine Modelling Using Permeance Network for
Vector Control Drive Applications. (Text in French).
C. DELFORGE-DELMOTTE and B.
LEMAIRE-SEMAIL
Physics and Mechanics of Biological Systems
I. Rheology of Weakly Flocculated Suspensions of Rigid
Particles.
P. SNABRE
and P. MILLS
II. Rheology of Weakly Flocculated Suspensions of Viscoelastic
Particles.
P. SNABRE
and P. MILLS
Erratum
An High Quantitative Texture Analysis ODF Using High
Resolution X-Ray Pole Figures. (Text in French).
R.Y. FILLIT, F. DUCHEMIN and J.M. BECKER