Proceedings of the 1999 International Symposium
for Testing and Failure Analysis, held 14-18 November
1999 in Santa Clara, California
Contains practical information on failure analysis of
microelectronic devices that is immediately applicable
to today's problems.
DESCRIPTION: Proceedings of the 25th anniversary
symposium on testing and failure analysis of
microelectronic devices. The papers included discuss new
aspects of the procedures used to assure the quality of
these devices that form the heart of modern control and
communication equipment. Also covered is the progress
made in this field over the past 25 years.
MARKET/AUDIENCE: Persons involved in quality control
and failure and analysis of microelectronic devices.
CONTENTS:
- Microelectronic Devices
- Basics of Failure Analysis
- Advanced Techniques
- FA-Laboratory Management
- FIB x Case Histories
- EOS/ESD
- FA of Discrete Components
- Testing
- Backside Analysis
NOTE: The CD-ROM's PDF-file format can be accessed
using Adobe Acrobat Reader 4.0 or higher
Published:
1999
Pages: 486
Format: Book and CD
ROM
