| Contents: |
- Defect and Failure
Verification, Characterization and Localization
- De-Processing
- Testing, Inspection,
and Sample Preparation
- ESD
Damage
- Failure-Analysis
Techniques
- Backside
Analysis
- Focused Ion-Beam
Systems
- Discrete Electronic
Devices
- Packaging
- Military
Applications Case Histories
| |
| ISTFA '98:
24th International Symposium for Testing and Failure
Analysis |
| ASM Publication, 413
pp., 1998, ISBN: 0871706695 |
| Proceedings, ISTFA '98 Dallas, TX, 15-19 November
1998 |
 |
This volume presents the
latest information from international specialists in the
testing and failure analysis of microelectronic devices. The
papers included discuss new aspects of the procedures used to
assure the quality of these devices that form the heart of
modern control and communication equipment as well as the
established practices used in this important
field. | |
| $124.00 |
|
| |