Session 4: Packaging and Reliability II
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Monday, June 4, 17:00-18:15, 5F Main Hall
Chairperson: G. Charitat, LAAS-CNRS
R. Saito, Hitachi
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4.1 Lead-Frame-On-Chip Offers Integrated Power Bus and Bond over Active Circuit
T.R. Efland, D. Abbott, V. Arellano*, M. Buschbom, M. Chang**, C. Hoffart, L. Hutter, Q. Mai, I. Nishimura***, S.Pendharker, M. Pierce, C.C. Shen, C.M. Thee**** and H.Vanhorn
Texas Instruments, U.S.A., *Texas Instruments, Mexico, **Texas Instruments, Taiwan, ***Texas Instruments, Japan and ****Texas Instruments, Malaysia
4.2 A Dimple-Array Interconnect Technique for Power Semiconductor Devices
S.S. Wen and G.-Q. Lu
Virginia Polytechnic Institute and State Univ., U.S.A.
4.3 Novel Monitoring Method and Long-Term Reliability Evaluation of Power Semiconductor Devices in Power Utilities
T. Horiuchi and Y. Sugawara
Kansai Electric Power, Japan