Mitigation of Single-Event Effects in Mission-Critical Systems

Techniques for mitigation of single-event upset, latchup, and gate rupture/burnout will be presented. Mitigation options include component-level technology solutions, hardened circuit designs, and fault-tolerant system architectures. Examples of each of these techniques will be given, and the impact of technology trends on the feasibility of mitigation solutions will be discussed.

Paul E. Dodd

Paul E. Dodd received his B.S., M.S., and Ph.D. in electrical engineering from Purdue University in 1988, 1989, and 1993, respectively. He joined Sandia National Laboratories in 1993, and is Technical Team Leader of the Radiation Physics, Simulation, and Technology department. He is involved in the development of Sandia’s radiation-hardened bulk and SOI CMOS technologies, and the computer simulation of radiation effects on microelectronics. Paul has served the radiation effects community as Publicity Chairman, Session Chairman, Short Course Instructor, and Short Course Chairman for the IEEE Nuclear and Space Radiation Effects Conference (NSREC), and has been a Session Chairman for the Single-Event Effects Symposium. Paul has served the IEEE International Electron Devices Meeting as a member of the Modeling and Simulation Technical Subcommittee and Session Chairman. He has authored or co-authored more than 35 publications, including the 1997, 2000, and 2001 NSREC Outstanding Conference Papers. Paul is a senior member of the IEEE and the NPSS, and was the recipient of the 2001 IEEE NPSS Early Achievement Award.

Fred W. Sexton

Fred W. Sexton manages the Radiation & Reliability Physics department at Sandia National Laboratories, responsible for developing the science and technology of radiation effects and reliability in microsystems, including both MEMS and CMOS IC technologies. He has served the radiation effects community as Technical Program Chairman, Guest Editor, Short Course Chairman, Short Course Speaker, and Session Chairman for the IEEE Nuclear and Space Radiation Effects Conference (NSREC), and is currently Senior Member at Large of the Radiation Effects Steering Group. Fred has received Outstanding Conference Paper awards at the 1984, 1997, and 2001 NSREC and the 1985 and 1990 HEART conferences. He received his B.S. and M.S. in electrical engineering from the University of Arkansas in 1976 and 1978, respectively. He joined Sandia National Laboratories in 1978 as a Member of Technical Staff and has worked in the areas of silicon solar cell development, IC technology development, IC manufacturing, and radiation effects in semiconductor devices and ICs. He has more than 80 technical publications to his credit. He is a senior member of the IEEE and the NPSS.