Memory Devices Share of System SER

What do soft errors look like at the data pins of memory components? We will show how this is influenced by the structure of the devices, and cover results of accelerated tests and system tests for soft errors. Finally the trend of decreasing SER for the last 8 generations of DRAMs is also shown.

Guenter Schindlbeck

Guenter Schindlbeck received the Electrical and Electronical Engineering Degree in Munich, Germany. He is a graduate of the Berlin Technical University and received the M.S.E.E. from Munich Technical University. He joined the Res. Lab of Siemens in 1970 and the Semiconductor Group in 1974. His topics were test automation, testchips for process control, failure analysis, design, quality assurance, project engineering, soft errors, and low level alpha counting. He now is with Infineon Technologies - the former Semiconductor Group of Siemens - and is responsible for soft error related reliability.