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INSPEC (The Database for Physics, Electronics and Computing) corresponds to the three Science Abstracts print publications: Physics Abstracts, Electrical and Electronics Abstracts, and Computer and Control Abstracts. The Science Abstracts family of abstract journals began publication in 1898. Approximately 16 percent of the database's source publications are in languages other than English, but all articles are abstracted and indexed in English. Author-prepared abstracts are used when available. The INSPEC Database utilizes controlled vocabulary from the INSPEC Thesaurus. A single classification scheme is used for all records from 1969 to date. The special DIALOG online thesaurus feature is available to assist searchers in determining appropriate subject terms and codes. Beginning in January 1987, INSPEC records also include chemical substance indexing and numerical index terms. As of November 1990, over 4,100 journals and serials are scanned, of which 750 are abstracted cover-to-cover. These contribute 82% of the database, including 6% which are conference papers reported in journals. A further 16% comes from conference proceedings. Other source materials include books, reports, and dissertations. Up to 1976 a small number of patents were covered. File 213 is available for ONline Training And Practice and contains INSPEC records from January and February 1989.
The principal subject areas within each subfile are: Acoustics, Astronomy and Astrophysics, Atomic and Molecular Physics, Biophysics and Medical Physics, Elementary Particle Physics, Energy Research, Environmental Science, Gases, Fluid Dynamics and Plasmas, Geophysics, Instrumentation and Measurement, Materials Science, Mathematics and Mathematical Physics, Nuclear Physics, Optics (including Lasers), Physical Chemistry, Properties of Matter, Quantum Mechanics, Thermodynamics Circuits and Components, Electricity Generation and Supply, Electromagnetic Fields and Waves, Electronic Devices and Materials, Electronic Instrumentation, Optics and Electro-optics, Power Systems and Applications, Radar and Radionavigation, Telecommunications Computational Mathematics, Computer Applications, Computer Hardware, Computer Software, Control Applications, Control Systems, Information Science, Systems and Control Theory Business and Financial Applications, Communications, Computing and Systems, Engineering and Industry Applications, Management, Office Automation
US and Americas: U.K. & Rest of World:
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Blue Sheet Contents
File Description [return to top]
Subject Coverage [return to top]
Physics (Subfile A)
Elec. Engineering & Electronics (Subfile B)
Computers & Control (Subfile C)
Information Technology (Subfile D)
Print Counterparts [return to top]
Dialog File Data [return to top]
Database Content [return to top]
Document Types Indexed [return to top]
Geographic Coverage [return to top]
Geographic Restrictions [return to top]
Special Features [return to top]
DialIndex/OneSearch Acronyms [return to top]
Contact [return to top]
INSPEC, Inc.
379 Thornall Street
Edison, NJ 08837
Telephone:
1-732-321-5575
800 Line:
1-800-929-3789
Fax:
1-732-321-5702
E-Mail:
inspec@inspecinc.com
IEE
INSPEC Marketing Dept.
Michael Faraday House,
Six Hills Way
Stevenage, Herts SG1 2AY
United Kingdom
Telephone:
+44 (0)1438 767297
(Help Desk)
Telex:
825578 IEESTV G
Fax:
01438 742840
E-Mail:
inspec@iee.org.uk
Terms and Conditions [return to top]
Dialog Standard Terms & Conditions apply.
SAMPLE RECORD [return to top]
DIALOG(R)File 2:INSPEC | |
(c) 1997 Institution of Electrical Engineers. All rights reserv. | |
AZ= | 3603153 A90052690, B90029589 |
/TI | Title: A 970 nm strained-layer InGaAs/GaAlAs quantum well laser |
for pumping an erbium-doped optical fiber amplifier | |
AU= | Author(s): Ming C. Wu; Olsson, N.A.; Sivco, D.; Cho, A.Y. |
CS= | Author Affil: AT&T Bell Labs., Murray Hill, NJ, USA |
JN=, SO= | Journal: Applied Physics Letters vol.56, no.3 pp.: 221-3 |
PY=, CP= | Publication Date: 15 Jan. 1990 Country of Publication: USA |
CD=, SN= | CODEN: APPLAB ISSN: 0003-6951 |
U.S. Copyright Clearance Center Code: 0003-6951/90/030221-03 | |
$02.00 | |
TC= | Treatment: Experimental (X) |
LA=, DT= | Language: English Document Type: JOURNAL PAPER (JP) |
(18 Refs) | |
/AB | Abstract: The authors report the performance of a 970 nm |
strained-layer InGaAs/GaAlAs quantum well laser and its | |
application for pumping Er-doped optical fiber amplifiers. The | |
laser was grown by molecular beam epitaxy and has three In/sub | |
0.2/Ga/sub 0.8/As/GaAs quantum wells. For a 5- mu m-wide and 400- | |
mu m-long ridge-waveguide laser, a CW threshold current of 20 mA | |
and an external quantum efficiency of 0.28 mW/mA per facet were | |
obtained. Maximum output power exceeds 32 mW/facet. With | |
antireflection coating, even higher external quantum efficiency | |
(0.40 mW/mA) was achieved, and more than 20 mW of power was | |
coupled into a single mode fiber. Preliminary experiments of | |
pumping the Er-doped fiber amplifier gave 15 dB of gain at 1.555 | |
mu m for a pump power of 14 mW into the Er fiber. | |
/DE | Descriptors: erbium; fibre optics; gallium compounds; gradient |
index optics; indium compounds; optical fibres; optical pumping; | |
optical waveguides; semiconductor junction lasers; solid lasers | |
/ID | Identifiers: GRIN-SCH laser; strained-layer; quantum well laser |
; pumping; optical fiber amplifier; Er-doped optical fiber; | |
molecular beam epitaxy; ridge-waveguide laser; CW threshold | |
current; external quantum efficiency; output power; | |
antireflection coating; single mode fiber; gain; 970 nm; 1.555 | |
micron; 5 micron; 14 mW; 400 micron; 20 mA; In/sub 0.2/Ga/sub | |
0.8/As-GaAs; InGaAs-GaAlAs | |
CI= | Chemical Indexing: |
In0.2Ga0.8As-GaAs int - In0.2Ga0.8As int - Ga0.8 int - In0.2 | |
int - GaAs int - As int - Ga int - In int - In0.2Ga0.8As ss - | |
Ga0.8 ss - In0.2 ss - As ss - Ga ss - In ss - GaAs bin - As bin - | |
NE= | Ga bin (Elements - 3,2,3) |
Er ss - Er el - Er dop (Elements - 1) | |
InGaAs-GaAlAs int - GaAlAs int - InGaAs int - Al int - As int - | |
Ga int - In int - GaAlAs ss - InGaAs ss - Al ss - As ss - Ga ss - | |
In ss (Elements - 3.3.4) | |
NI=, WA= | Numerical Indexing: wavelength 9.7E-07 m; wavelength 1.555E-06 |
SI=, PO= | m; size 5.0E-06 m; power 1.4E-02 W; size 4.0E-04 m; current |
CU= | current 2.0E-02 A |
CC=, CN= | Class Codes: A4260B (Design of specific laser systems); A4255P |
(Lasing action in semiconductors with junctions); A4280L (Optical | |
waveguides and couplers); A4281F (Other optical properties); | |
A4255R (Lasing action in other solids); B4320J (Semiconductor | |
junction lasers); B4125 (Fibre optics); B4130 (Optical | |
waveguides); B4320G (Solid lasers) | |
SEARCH SUFFIX |
DISPLAY CODE |
FIELD NAME |
INDEXING |
SELECT EXAMPLES |
---|---|---|---|---|
None | None | All Basic Index Fields | Word | S THRESHOLD(W)CURRENT |
/AB | AB | Abstract | Word | S THRESHOLD(W)CURRENT/AB |
/DE | DE | Descriptor1 | Word & Phrase |
S FIBRE?(N)OPTIC?/DE S OPTICAL FIBRES/DE |
/ID | ID | Identifier2 | Word & Phrase |
S GAALAS/ID S INGAAS-GAALAS/ID |
/TI | TI | Title | Word | S QUANTUM(W)WELL(S)LASER?/TI |
SEARCH PREFIX |
DISPLAY CODE |
FIELD NAME |
INDEXING |
SELECT EXAMPLES |
---|---|---|---|---|
AC= | AC | Patent Application Country 3 | Word | S AC=JP |
AD= | AD | Patent Application Date 3 | Phrase | S AD=710402 |
AN= | AN | Patent Application Number 3 | Phrase | S AN=20162 |
AU= | AU | Author | Phrase | S AU=OLSSON, N.A. |
None | AZ | DIALOG Accession Number | ||
AZ= | AZ | INSPEC Abstract Number | Phrase | S AZ=A90052690 |
BN= | BN | International Standard Book Number (ISBN) | Phrase | S BN=0 8186 1986 4 S BN=0818619864 |
CC= | CC | Classification Code | Phrase | S CC=A4260B S CC=A42 |
None | CF | Conference Information | ||
CL= | CL | Conference Location | Word | S CL=(SANTA(W)CLARA) |
CN= | CN | Classification Name | Word & Phrase |
S CN=(LASING(W)ACTION) S CN=OPTICAL WAVEGUIDES |
CO= | CO | CODEN | Phrase | S CO=APPLAB |
CP= | CP | Country of Publication | Word & Phrase |
S CP=USA S CP=WEST GERMANY |
CS= | CS | Corporate Source | Word | S CS=(AT(W)T(S)MURRAY(W)HILL) |
CT= | CT | Conference Title | Word | S CT=(COMPUTER(W)AIDED(W)DESIGN) |
CY= | CY | Conference Year | Phrase | S CY=1990 |
DN= | DN | Document Number | Phrase | S DN=0038-1101(96)00038-X |
DT= | DT | Document Type | Phrase | S DT=JOURNAL PAPER S DT=JP |
IC= | IC | ANSI Z39.56 Serial Item Contribution Identifier (SICI) Code | Phrase | S IC="0038-11(199609)39:9L.1359:HFCM"? |
JN= | JN | Journal Name | Phrase | S JN=APPLIED PHYSICS LETTERS S JN=APPL. PHYS. LETT. (USA) |
LA= | LA | Language | Phrase | S LA=FRENCH |
None | MI | Material Itentity Number | ||
None | NI | Numeric Information | Phrase | S NI=ELECTRICAL CONDUCTIVITY |
PA= | PA | Patent Assignee 3 | Word & Phrase |
S PA=PIONEER S PA=PIONEER ELECTRONIC? |
PC= | PC | Patent Country 3 | Word | S PC=GB |
PD= | PD | Patent Date 3 | Phrase | S PD=720329 |
None | PI | Patent Information 3 | ||
PN= | PN | Patent Number 3 | Phrase | S PN=GB 1379306 |
PU= | PU | Publisher 4 | Word | S PU=(IEEE AND WASHINGTON) |
PY= | PY | Publication Year | Phrase | S PY=1989:1990 |
RN= | RN | Report or Contract Number | Word & Phrase |
S RN=CERN S RN="CERN/SPS/ACC/79-13" S RN=CERNSPSACC7913 |
SF= | AZ | Subfile | Phrase | S SF=A |
SN= | SN | International Standard Serial Number (ISSN) | Phrase | S SN=0003-6951 S SN=00036951 |
SO= | SO | Source Information 5 | Word | S SO=APPL?(W)PHYS?) |
SP= | SP | Conference Sponsor | Word | S SP=(ACM AND IEEE) |
TC= | TC | Treatment Code | Phrase | S TC=EXPERIMENTAL S TC=X |
UD= | None | Update 6 | Phrase | S UD=9001B1:9999 |
UR= | UR | Uniform Resource Locator (URL) | Phrase | S UR=HTTP//ENGINE.IEEE? |
CHEMICAL INDEXING FIELDS (available since January 1987) | ||||
CI= | CI | Substance (including role modifier) 7 | Word & Phrase |
S CI=GAAS S CI=(GA(S)AS(S)INT) S CI=AS BIN S CI=SS |
NE= | NE | Number of elements in Substance, Component, or Material System | Phrase | S NE=3(S)CI=(GA(S)AL(S)AS) |
NUMERICAL INDEXING FIELDS (available since January 1987)8,9 | ||||
HI= | NI | Highest Value | Numeric | S HI=2.5E4(S)NI=FREQUENCY S HI<=9.7E-7(S)NI=WAVELENGTH |
LO= | NI | Lowest Value | Numeric | S LO=100(S)NI=TEMPERATURE S LO>=3.16E7(S)NI=AGE |
NUMERICAL INDEXING FIELDS (available since January 1987)10 | ||||
AG= | NI | Age (yr; Year) | Numeric | S AG>=1E9 |
AL= | NI | Altitude (m; Meter) | Numeric | S AL=2E4:9E5 |
AP= | NI | Apparent Power (VA; Volt-amp) | Numeric | S AP=3E6 |
BI= | NI | Bit Rate (Bit/s; Bits per Second) | Numeric | S BI=64000 |
BW= | NI | Bandwidth (Hz; Hertz) | Numeric | S BW=5E7 |
BY= | NI | Byte Rate (Byte/s; Bytes per Second) | Numeric | S BY=2.5E6 |
CA= | NI | Capacitance (F; Farad) | Numeric | S CA=2E-13 |
CD= | NI | Conductance (S; Seimen) | Numeric | S CD=2:5 |
CE= | NI | Computer Execution Rate (IPS; Instructions per Second) | Numeric | S CE>=1E6 |
CM= | NI | Computer Speed (FLOPS) | Numeric | S CM>=3.5E6 |
CU= | NI | Current (A; Ampere) | Numeric | S CU=0.051 |
DI= | NI | Distance (m; Meter) | Numeric | S DI=0.002 |
DP= | NI | Depth (m; Meter) | Numeric | S DP=2E4:9E5 |
EF= | NI | Efficiency (Percent) | Numeric | S EF=60 |
EL= | NI | Electrical Conductivity (S/m; Siemen per Meter) | Numeric | S EL=7.0E4 |
EN= | NI | Energy (J; Joule) | Numeric | S EN=0.5 |
ER= | NI | Electrical Resistivity (ohmm; Ohm meter) | Numeric | S ER=1.7E-4 S ER=0.00017 |
EV= | NI | Electron Volt Energy (eV; Electron Volt) | Numeric | S EV=-0.5:0 |
FR= | NI | Frequency (Hz; Hertz) | Numeric | S FR=0:1 |
GA= | NI | Gain (dB; Decibel) | Numeric | S GA=14 |
GD= | NI | Galactic Distance (pc; Parsec) | Numeric | S GD>=1E7 |
GE= | NI | Geocentric Distance (m; Meter) | Numeric | S GE=>3.7E10 |
HD= | NI | Heliocentric Distance (AU; Astronomical Unit) | Numeric | S HD=5E4 |
LS= | NI | Loss (dB; Decibel) | Numeric | S LS=-60:0 |
MA= | NI | Mass (kg; Kilogram) | Numeric | S MA=6E14 |
MD= | NI | Magnetic Flux Density (T; Tesla) | Numeric | S MD=1E-2 |
MS= | NI | Memory Size (Byte) | Numeric | S MS>=3E7 |
NF= | NI | Noise Figure (dB; Decibel) | Numeric | S NF=1:2 |
PO= | PO | Power (W; Watt) | Numeric | S PO=4E-5:2E-4 |
PR= | NI | Pressure (Pa; Pascal) | Numeric | S PR=1.3E-3 |
PS= | NI | Printer Speed (cps; Characters per Second) | Numeric | S PS>=2E2 |
PX= | NI | Picture Size (pixel; Picture Element) | Numeric | S PX=512 |
RA= | NI | Radiation Absorbed Dose (Gy; Gray) | Numeric | S RA=2 |
RD= | NI | Radiation Dose Equivalent (Sv; Sievert) | Numeric | S RD=1E-6:1E-2 |
RE= | NI | Resistance (ohm) | Numeric | S RE=7E-5:0.1 |
RP= | NI | Reactive Power (VAr; Volt-Amp Reactive) | Numeric | S RP=1E5 |
RX= | NI | Radiation Exposure (C/kg; Coulomb per Kilogram) | Numeric | S RX<=0.1 |
RY= | NI | Radioactivity (Bq; Becquerel) | Numeric | S RY=1E8:1E12 |
SI= | NI | Size (m; Meter) | Numeric | S SI=0.7:15 |
SM= | NI | Stellar Mass (Msol; Solar Mass) | Numeric | S SM=1E-2:3000 |
SR= | NI | Storage Capacity (Bit) | Numeric | S SR=4.2E6 |
TE= | NI | Temperature (K; Kelvin) | Numeric | S TE=3.26E2 |
TM= | NI | Time (s; Second) | Numeric | S TM=2E-11:4E-11 |
VE= | NI | Velocity (m/s; Meters per Second) | Numeric | S VE=-5E4:-2E2 |
VO= | NI | Voltage (V; Volt) | Numeric | S VO>=1000 |
WA= | NI | Wavelength (m; Meter) | Numeric | S WA=8.8E-7:1E-1 |
WL= | NI | Word Length (Bit) | Numeric | S WL=32 |
3 Files 2 and 3 only; dates of patent coverage are 1969-1976.
4 Available for conference proceedings and books only.
5 Search field includes journal title words and volume and issue numbers. Display varies depending on document type.
7 Role modifiers include: EL (element), DOP (dopant), BIN (binary system) SS (system with 3 or more components), INT (interface system), SUR (surface or substrate), ADS (adsorbate, or any sorbate, i.e., species being adsorbed onto a substrate).
8 Numeric data for each physical quantity (temperature, pressure, frequency, etc.) are indexed into a separate numeric field (TE=, PR=, FR=, etc.). In the record display, numeric values appear in an exponential floating point format, e.g., FR=2.5E04.
9 Truncation is not allowed when searching numeric data. Range searching is recommended for best results, e.g., S FR=25000:30000. The smallest and largest numbers that may be searched are 5.4E-79 and 7.2E+75. For specifying precise minimum or maximum numeric values, the LO= and HI= search prefixes may be used. LO= and HI= are generic prefixes not specific to any physical quantity. Searches using LO= and HI= should be qualified with the addition of the desired physical quantity using the NI= prefix.
10 Each physical quantity and its corresponding abbreviated unit of measure are optionally searchable using NI=.
Sets and terms may be limited by Basic Index suffixes, i.e., /AB, /DE, /DF, /ID, /IF, /TI (e.g., SELECT S6/TI), as well as by the features listed below: | ||
SUFFIX | FIELD NAME | EXAMPLES |
---|---|---|
/ART | Journal Article | S S2/ART |
/ENG | English Language | S S9/ENG |
/NAR | Non-Journal Article | S AMPLIFIER?/NAR |
/NONENG | Non-English Language | S LASERS/NONENG |
/PHYS | Physics Subfile | S SEMICONDUCTOR?/PHYS |
/TECH | Electronics, Computing, and Information Technology Subfiles | S HOLOGRAPHY/TECH |
/YYYY | Publication Year | S SUPERCONDUCTOR?/1989:1990 |
SORTABLE FIELDS | EXAMPLES |
---|---|
AU, AZ, CC, CS, JN, PY, TI | SORT S6/ALL/JN/PY,D PRINT S3/5/1-24/AU |
RANK FIELDS | EXAMPLES |
---|---|
All phrase- and numeric-indexed fields in the Additional Indexes can be ranked. Other RANK codes include: DE, ID | RANK DE RANK AU S4 |
Display codes listed in the Search Options table can be used to customize output. | TYPE S3/AU,TI,SO/1-5 |
NO. |
DIALOGWEB FORMAT |
RECORD CONTENT |
---|---|---|
1 | -- | DIALOG Accession Number |
2 | -- | Full Record except Abstract |
3 | Medium | Bibliographic Citation |
4 | -- | Full Record with Tagged Fields |
5 | -- | Full Record |
6 | Short | Title and INSPEC Abstract Number |
7 | Long | Full Record except Indexing |
8 | Free | Title and Indexing |
9 | Full | Full Record |
K | -- | KWIC (Key Word In Context) displays a window of text; may be used alone or with other formats |
FIELD NAME | EXAMPLES | ||
---|---|---|---|
If the accession number of a specific record is known, it can be used to display the record directly. | TYPE 3603153/5 DISPLAY 3603153/5 PRINT 3603153/3 |
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Rates For File: INSPEC (1969- present)[2]
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Rates For File: INSPEC (1969-1982)[3]
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Rates For File: INSPEC (1983- present)[4]
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Rates For File: ONTAP® INSPEC[213]
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