Other Issues
The European Physical Journal AP
Eur. Phys. J. AP 11, August 2000
Materials I: Properties of bulk, thin film and nanomaterials
- p79
- Symmetry synthesis of the multiport scattering matrix as a first step in the design of electromagnetic components and devices
V. Dmitriev and J.C.W.A. Costa
Abstract
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PDF file (109 Kb)
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- p83
- Contribution to the theoretical and experimental study of the dielectric material Rb0.7(NH4)0.3HSO4
H. Smaoui, H. Guermazi, Y. Mlik and T. Mhiri
Abstract
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PDF file (287 Kb)
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- p91
- Optical behavior of RF sputtered Au-TiO2
thin cermet films, influence of the gold particles size and concentration
S. Liberman, X. Quélin, J. Sztern, Y. Dumont, A. Etcheberry, A. Bourdon and P. Gadenne
Abstract
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PDF file (223 Kb)
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- p97
- Annealing effect on structural and magnetic properties of Ta/Cu/FeMn/Co/FeMn/Ta thin film structures
F. Bensmina, A. Dinia, C. Mény, P. Panissod and D. Muller
Abstract
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PDF file (156 Kb)
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- p103
- Elaboration and characterization of PNZT thin films deposited on silicon by RF cathodic sputtering
T. Haccart, E. Cattan and D. Rèmiens
Abstract
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PDF file (282 Kb)
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Lasers and Optics
- p107
- Cr4+-doped silica optical fibres: absorption and fluorescence properties
V. Felice, B. Dussardier, J.K. Jones, G. Monnom and D.B. Ostrowsky
Abstract
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PDF file (166 Kb)
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Plasma and Discharge Physics
- p111
- Study of the electrode gap influence on electrode erosion under the action of an electric arc
A.M. Gouega, Ph. Teste, R. Andlauer, T. Leblanc
and J.-P. Chabrerie
Abstract
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PDF file (485 Kb)
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- p123
- Analytic calculations of ozone concentration
in an oxygen-fed DBD cylindrical ozonizer
B. Held
Abstract
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PDF file (182 Kb)
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Instrumentation,Measurement,Metrology
- p131
- Measurement of in-plane displacement fields by a spectral phase algorithm applied to numerical speckle photography for microtensile tests
C. Poilane, E. Lantz, G. Tribillon and P. Delobelle
Abstract
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PDF file (1 Mb)
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- p147
- Surface imaging by an ion probe scanning
K. Wang, P. Garoche and L. Dumoulin
Abstract
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PDF file (203 Kb)
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