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The European Physical Journal AP

Eur. Phys. J. AP 7, July 1999

Materials I: Properties of bulk, thin film and nanomaterials
p 1
A kinetic formulation of piezoresistance in N-type silicon: Application to non-linear effects
A.R. Charbonnieras and C.R. Tellier
Abstract | PDF file (380 Kb) |

p 13
Structure of lead zirconium oxide: Evidence from NMR
S.M. Korniyenko, I.P. Bykov, M.D. Glinchuk, V.V. Laguta and L. Jastrabik
Abstract | PDF file (282 Kb) |

p 19
Magneto-optical properties of metal-dielectric composites with a periodic microstructure
Y.M. Strelniker and D.J. Bergman
Abstract | PDF file (487 Kb) |

Materials II: Synthesis, processing and characterization

p 25
Application of crystal orientation mapping to local orientation perturbations
R.K. Davies and V. Randle
Abstract | PDF file (396 Kb) |

p 33
A homologous series Pb2n+1Nb2n-1O7n-1 studied by electron microscopy
Ch. Leroux, T. Badeche, G. Nihoul, O. Richard and G. van Tendeloo
Abstract | PDF file (426 Kb) |

p 41
Microwave flash-synthesis of iron oxides nanoparticles
P. Rigneau, K. Bellon, I. Zahreddine and D. Stuerga
Abstract | PDF file (236 Kb) |

p 45
Computation of 3D curvatures on a wet snow sample
J.B. Brzoska, B. Lesaffre, C. Coléou, K. Xu and R.A. Pieritz
Abstract | PDF file (763 Kb) |

Lasers and Optics

p 59
Microcavity effect on dye impregnated porous silicon samples
S. Setzu, P. Solsona, S. Litant, R. Romestain and J.C. Vial
Abstract | PDF file (295 Kb) |

Physics of Electronic Devices

p 65
Thermal studies of a superconducting current limiter using Monte-Carlo method
J. Lévèque and A. Rezzoug
Abstract | PDF file (336 Kb) |

p 73
Monte-Carlo investigation of in-plane electron transport in tensile strained Si and Si1-yCy (y $\bf{\leq 0.03}$)
Ph. Dollfus, S. Galdin and P. Hesto
Abstract | PDF file (278 Kb) |

Plasma and Discharge Physics

p 79
Numerical studies on a positive ion trajectory in a magnetoelectrostatic trap for plasma confinement
H.B. Ramalingam and V. Selvarajan
Abstract | PDF file (269 Kb) |

p 87
Characterization of a spray torch and analysis of process parameters
R. Ramasamy and V. Selvarajan
Abstract | PDF file (345 Kb) |


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