Titre : Recherche TCAD CITATIONS, août 1998

Recherche : 25 aout 1998, STN - INSPEC - © 1998 IEE
Date : 25 aout 1998

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Chung, Yeonbae, et al.
"Physically based DMOS transistor model implemented in SPICE for advanced power IC TCAD"
PROCEEDINGS OF THE 1995 IEEE INTERNATIONAL SYMPOSIUM ON POWER SEMICOMDUCTOR DEVICES AND ICS. Held: Yokohama, Jpn, May 23-25, 1995. IEEE International Symposium on Power Semiconductor Devices & ICs (ISPSD) 1995.,95CH35785. p 340-345. (Conference Article - English)

Halama, Stefan, et al.
"VISTA - user interface, task level, and tool integration"
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems v 14 n 10 Oct 1995. p 1208-1222. (Journal Article - English)

Plummer, J.D.
"Computational prototyping for advanced semiconductor structures"
PROCEEDINGS OF THE 11TH BIENNIAL UNIVERSITY/GOVERNMENT/INDUSTRY MICROELECTRONICS SYMPOSIUM. Held: Austin, TX, USA, May 16-18, 1995. Biennial University/Government/Industry Microelectronics Symposium - Proceedings 1995. IEEE, Piscataway, NJ, USA,95CH35779. p 84. (Conference Article - English)

Dutton, Robert W., et al.
"Virtual instruments for development of high performance circuit technologies"
PROCEEDINGS OF THE 1995 17TH ANNUAL CUSTOM INTEGRATED CIRCUITS CONFERENCE. Held: Santa Clara, CA, USA, May 1-4, 1995. Proceedings of the Custom Integrated Circuits Conference 1995. IEEE, Piscataway, NJ, USA,95CH35775. p 225-228. (Conference Article - English)

Redford, Mark, et al.
"Identifying and quantifying variability within a BiCMOS process as part of a DFM strategy"
IEE MANUFACTURING DIVISION COLLOQUIUM ON IMPROVING THE EFFICIENCY OF IC MANUFACTURING TECHNOLOGY. Held: London, UK, April 12, 1995. IEE Colloquium (Digest) n 153 1995. IEE, Stevenage, Engl. p 10/1-10/4. (Conference Article - English)

Newsam, M.I., et al.
"Total TCAD environment problem for DFM"
IEE MANUFACTURING DIVISION COLLOQUIUM ON IMPROVING THE EFFICIENCY OF IC MANUFACTURING TECHNOLOGY. Held: London, UK, April 12, 1995. IEE Colloquium (Digest) n 153 1995. IEE, Stevenage, Engl. p 1/1-1/4. (Conference Article - English)

Sato, Hisako, et al.
"New hierarchical RSM for TCAD-based device design to predict CMOS development"
PROCEEDINGS OF THE 1995 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES (ICMTS 1995). Held: Nara, Jpn, March 22-25, 1995. IEEE International Conference on Microelectronic Test Structures 1995. IEEE, Piscataway, NJ, USA,95CH3480-1. p 299-302. (Conference Article - English)

Beebe, S., et al.
"Next generation Stanford TCAD - PISCES 2ET and SUPREM 007"
PROCEEDINGS OF THE 1994 IEEE INTERNATIONAL ELECTRON DEVICES MEETING. Held: San Francisco, CA, USA, Dec. 11-14, 1994. Technical Digest - International Electron Devices Meeting 1994. IEEE, Piscataway, NJ, USA,94CH35706. p 213-216. (Conference Article - English)

Masuda, Hiroo, et al.
"TCAD strategy for predictive VLSI memory development"
PROCEEDINGS OF THE 1994 IEEE INTERNATIONAL ELECTRON DEVICES MEETING. Held: San Francisco, CA, USA, Dec. 11-14, 1994. Technical Digest - International Electron Devices Meeting 1994. IEEE, Piscataway, NJ, USA,94CH35706. p 153-156. (Conference Article - English)

Cho, Hae-Seok, et al.
"Physical and computationally efficient methodology for statistical circuit simulation in bipolar technologies"
SOLID-STATE ELECTRONICS:AN INTERNATIONAL JOURNAL - Solid-State Electronics:An International Journal v 38 n 5 May 1995. p 1065-1073. (Journal Article - English)

Axelrad, V., et al.
"CAESAR: the virtual IC factory as an integrated TCAD user environment"
MICROELECTRONICS JOURNAL - Microelectronics Journal v 26 n 2-3 Mar 1995. p 191-202. (Journal Article - English)

Ueda, J., et al.
"Technology CAD at OKI"
MICROELECTRONICS JOURNAL - Microelectronics Journal v 26 n 2-3 Mar 1995. p 159-175. (Journal Article - English)

Halama, S., et al.
"Viennese integrated system for technology CAD applications"
MICROELECTRONICS JOURNAL - Microelectronics Journal v 26 n 2-3 Mar 1995. p 137-158. (Journal Article - English)

Lorenz, J., et al.
"STORM technology CAD system"
MICROELECTRONICS JOURNAL - Microelectronics Journal v 26 n 2-3 Mar 1995. p 113-135. (Journal Article - English)

Dutton, Robert W., et al.
"Technology CAD at Stanford University: physics, algorithms, software and applications"
MICROELECTRONICS JOURNAL - Microelectronics Journal v 26 n 2-3 Mar 1995. p 99-111. (Journal Article - English)

Lloyd, Peter, et al.
"Technology CAD at AT&T"
MICROELECTRONICS JOURNAL - Microelectronics Journal v 26 n 2-3 Mar 1995. p 79-97. (Journal Article - English)

Agraz-Guerena, Jorge.
"Process controls for the factories of the future"
PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING - Proceedings of SPIE - The International Society for Optical Engineering v 2336 1994. p 2-4. (Journal Article - English)

Axelrad, V., et al.
"Cost and yield estimation in a virtual IC factory"
PROCEEDINGS OF SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING - Proceedings of SPIE - The International Society for Optical Engineering v 2334 1994. p 102-108. (Journal Article - English)

Dutton, Robert W., et al.
"Integrated TCAD for OEIC applications"
PHYSICS AND SIMULATION OF OPTOELECTRONIC DEVICES II. Held: Los Angeles, CA, USA, Jan. 24-26, 1994. Proceedings of SPIE - The International Society for Optical Engineering v 2146 1994. Publ by Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, USA. p 80-89. (Conference Article - English)

Lopez-Serrano, Jose, et al.
"Yield enhancement prediction with statistical process simulations in an advanced poly-emitter complementary bipolar technology"
PROCEEDINGS OF THE IEEE 1994 CUSTOM INTEGRATED CIRCUITS CONFERENCE. Held: San Diego, CA, USA, May 1-4, 1994. Proceedings of the Custom Integrated Circuits Conference 1994. Publ by IEEE, IEEE Service Center, Piscataway, NJ, USA,94CH3427-2. p 289-292. (Conference Article - English)

Agostinelli, V.M. Jr., et al.
"Sensitivity issues in modeling the substrate current for submicron N- and P-channel MOSFETs"
SOLID-STATE ELECTRONICS - Solid-State Electronics v 37 n 9 Sep 1994. p 1627-1632. (Journal Article - English)

Tanabe, Norio.
SEMICONDUCTOR TECHNOLOGY CAD SYSTEMS AT NEC
NEC Research & Development v 35 n 2 Apr 1994. p 123-133. (Report Review - English)

Boning, Duane S., et al.
"DOE/Opt: a system for design of experiments, response surface modeling, and optimization using process and device simulation"
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING - IEEE Transactions on Semiconductor Manufacturing v 7 n 2 May 1994. p 233-246. (Journal Article - English)

Fichtner, W., et al.
"TCAD in power device design and optimization"
PROCEEDINGS OF THE 1993 IEEE INTERNATIONAL ELECTRON DEVICES MEETING. Held: Washington, DC, USA, Dec. 5-8, 1993. Technical Digest - International Electron Devices Meeting 1993. Publ by IEEE, IEEE Service Center, Piscataway, NJ, USA. p 93-96. (Conference Article - English)

Giles, Martin D., et al.
"Semiconductor wafer representation for TCAD"
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems v 13 n 1 Jan 1994. p 82-95. (Journal Article - English)

Fasching, Franz, et al.
"VISTA - the data level"
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems v 13 n 1 Jan 1994. p 72-81. (Journal Article - English)

Gopalarao, K.S.V., et al.
"Integrated technology CAD system for process and device designers"
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS - IEEE Transactions on Very Large Scale Integration (VLSI) Systems v 1 n 4 Dec 1993. p 482-490. (Journal Article - English)

Szczesny, R., et al.
"TCAD - a simulation package for power electronic systems"
PROCEEDINGS OF THE 5TH EUROPEAN CONFERENCE ON POWER ELECTRONICS AND APPLICATIONS. Held: Brighton, UK, Sept. 13-16, 1993. System Engineering IEE Conference Publication v 7 n 377 1993. Publ by IEE, Michael Faraday House, Stevenage, Engl. p 1-6. (Conference Article - English)

Sanders, Thomas, J., et al.
"Use of stadium statistical TCAD simulation methodology in industrial environments"
PROCEEDINGS OF THE TENTH BIENNIAL UNIVERSITY/GOVERNMENT/INDUSTRY MICROELECTRONICS SYMPOSIUM. Held: Research Triangle Park, NC, USA, May 18-19, 1993. 1993 University/Government/Industry Microelectronics Symposium Proc Tenth Bienn Univ Gov Ind Microelectron Symp 1993. Publ by IEEE, IEEE Service Center, Piscataway, NJ, USA. p 46-50. (Conference Article - English)

Redford, Mark,, et al.
"Teaching company scheme an academic-industry partnership - a case study"
PROCEEDINGS OF THE TENTH BIENNIAL UNIVERSITY/GOVERNMENT/INDUSTRY MICROELECTRONICS SYMPOSIUM. Held: Research Triangle Park, NC, USA, May 18-19, 1993. 1993 University/Government/Industry Microelectronics Symposium Proc Tenth Bienn Univ Gov Ind Microelectron Symp 1993. Publ by IEEE, IEEE Service Center, Piscataway, NJ, USA. p 29-36. (Conference Article - English)

Goossens, Ronald J. G., et al.
"Device CAD in the '90s: At the crossroads."
IEEE CIRCUITS AND DEVICES MAGAZINE - IEEE Circuits Devices Mag v 8 n 4 Jul 1992 p 18-26. (Journal Article - English)

Vande Voorde, Paul.
"TCAD for bipolar process development: A user's perspective."
PROCEEDINGS OF THE 1991 BIPOLAR CIRCUITS AND TECHNOLOGY MEETING. Held: Minneapolis, MN, USA, Sept. 9-10, 1991. Proceedings of the 1991 Bipolar Circuits and Technology Meeting Proc 91 Bipolar Circuits Technol Meet. Publ by IEEE, IEEE Service Center, Piscataway, NJ, USA (IEEE cat n 92CH3020-5). p 101-109. (Conference Paper - English)

Neureuther, Andrew R.
"Simulation of optical lithography and inspection."
MICROELECTRONIC ENGINEERING - Microelectronic Engineering v 17 n 1-4 Mar 1992. p 377-384. (Journal Article - English)

Chin, G., et al.
"Linking TCAD to EDA--Benefits and issues."
PROCEEDINGS OF THE 28TH ACM/IEEE DESIGN AUTOMATION CONFERENCE. Held: San Francisco, CA, USA, June 17-21, 1991. Proceedings - Design Automation Conference. Publ by IEEE, IEEE Service Center, Piscataway, NJ, USA (IEEE cat n 91CH3014-8). p 573-578. (Conference Paper - English)

Buturla, E.
"The use of TCAD in semiconductor technology development."
PROCEEDINGS OF THE IEEE 1991 CUSTOM INTEGRATED CIRCUITS CONFERENCE. Held: San Diego, CA, USA, May 12-15, 1991. Proceedings of the Custom Integrated Circuits Conference. Publ by IEEE, IEEE Service Center, Piscataway, NJ, USA (IEEE cat n 91CH2994-2). p 7p. (Conference Paper - English)

Wong, Alexander S., et al.
"The intertool profile interchange format: A technology CAD environment approach."
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS - IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems v 10 n 9 Sep 1991. p 1157-1162. (Journal Article - English)

Anonymous.
"Technology CAD reduces prototypes."
EUROPEAN SEMICONDUCTOR - Eur Semicond v 12 n 3 Mar 1990 p 22-23. (Journal Article - English)

Carlach, J. C., et al.
"TCAD: a 27 MHz 8 multiplied by 8 discrete cosine transform chip."
1989 INTERNATIONAL CONFERENCE ON ACOUSTICS, SPEECH, AND SIGNAL PROCESSING. Held: Glasgow, Scotland, May 23-26, 1989. Proceedings - ICASSP, IEEE International Conference on Acoustics, Speech and Signal Processing v IV (of 4). Publ by IEEE, IEEE Service Center, Piscataway, NJ, USA. Available from IEEE Service Cent (cat n 89CH2673-2), Piscataway, NJ, USA. p 2429-2432. (Conference Paper - English)

Dutton, Robert W., et al.
"Use of computer aids in ic technology evolution."
PROCEEDINGS OF THE IEEE - Proc IEEE v 74 n 12 Dec 1986 p 1730-1740. (Journal Article - English)

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