Fiche : [DATA148]

Titre : ISTFA'98, 24th International Symposium for Testing and Failure Analysis, Dallas, TX, 15-19 November 1998.

Cité dans : [CONF043] ISTFA, International Symposium for Testing and Failure Analysis et IEE proc. IGBT propulsion drives, London, mai 2002.

Contents:

This volume presents the latest information from international specialists in
the testing and failure analysis of microelectronic devices. The papers included
discuss new aspects of the procedures used to assure the quality of these devices
that form the heart of modern control and communication equipment as well as
the established practices used in this important field.

$124.00
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Microelectronics

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ISTFA, the International Symposium for Testing and Failure Analysis, continues as the leading forum on failure analysis of semiconductors and other
microelectronic devices. Technical sessions, panel discussions, practical workshops and an equipment exposition combine to form a unique learning
environment for anyone working to detect, understand and eliminate failures.

Plan now to attend the 2000 event, scheduled for 12-16 November 2000 in Bellevue (Seattle), Washington!

FOR ONE-STOP COMPARISON SHOPPING visit the ISTFA Exposition, featuring more than 80 key suppliers and service contractors Sponsored by
Electronic Device Failure Analysis Society (EDFAS) an Affiliate Society of ASM International(r)

24th International Symposium for Testing and Failure Analysis

Proceedings from ISTFA '98, Dallas, Texas, 15-19 November 1998

FEATURES:

Presents the latest procedures as used by specialists in this vital field from around the world
Covers both established and new practices

DESCRIPTION:
This volume presents the proceeding of the world's preeminent conference on the testing and failure analysis of microelectronic devices. Information included covers the
established practices used for evaluation and quality control, as well as the latest advances in the procedures needed to keep pace with the rapid changes in
microelectronic-device manufacturing.

CONTENTS:

Defect and Failure Verification, Characterization and Localization
De-Processing
Testing, Inspection and Sample Preparation
ESD Damage
Failure-Analysis Techniques
Backside Analysis
Focused Ion-Beam Systems
Discrete Electronic Devices
Packaging
Military Applications
Case Histories

The ISTFA '98 CD-ROM contains all 66 articles in the conference proceedings, converted to an Adobe Acrobat Portable Document Format, and is fully searchable.

System Requirements:

386-based PC minimum (486, Pentium or Pentium Pro recommended)
Microsoft Windows 95, 3.1, NT 3.51 or 4.0 or Windows for Workgroups
4 MB RAM
5 MB hard disk space, plus 7 MB disk space for installation

Order #02024G-RPEJ00008

ASM Online Bookstore

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