Joint Symposium with FEMS
Symposium Organizers:
B. EIGENMANN, Institute für Werkstoffkunde I, Universität Karlsruhe (TH), Karlsruhe, Germany
J.-L. LEBRUN, LM3-ENSAM, Paris, France
Tuesday, June 1, 1999 - Morning
Mardi 1er juin 1999, Matin
| H-I.1 | 9:00-9:30 | WAFER QUALITY IMAGING BY MM RESOLVED HIGH RESOLUTION X-RAY DIFFRACTION, D. Lübbert*,**, T. Baumbach*,**, E. Boller**, J. Härtwig**, J. Baruchel**; *Fraunhofer Institut for Non-Destructive Testing, Saarbriicken and Dresden, Germany; **ESRF, 38043 Grenoble, France | |
| H-I.2 | 9:30-10:00 | EVALUATIONS THE INTRINSIC STRESS VALUE IN SILICON WAFERS FROM PHOTOVOLTAGE MEASUREMENTS, A. Patrin, Technical University of Koszalin, 17 Partyzantow Street, 75-411 Koszalin, Poland | |
| H-I.3 | 10:00-10:30 | SCANNING PROBE MICROSCOPY STUDIES OF STRESS-ENHANCED DISSOLUTION OF SINGLE CRYSTAL SURFACES: MODELS OF CHEMICAL MECHANICAL POLISHING, J.T. Dickinson, Washington State University, Department of Physics and Materials Science Program, Pullman WA 99164-2814, USA | |
| 10:30-11:00 | BREAK | ||
| H-I.4 | 11:00-11:30 | INFLUENCE OF A STRESS STATE OF A SAMPLE ON THE SHAPE OF X-RAY DIFFRACTION LINES, N. Dubrovinskaia, L. Dubrovinsky, S. Saxena, Institute of Earth Sciences, Uppsala University, 752 36, Villavagen 16, Uppsala, Sweden | |
| H-I.5 | 11:30-12:00 | INFLUENCE OF THE STRESS STATE ARISING UNDER STATIC AND DYNAMIC MICROINDENTATION OF NaCl CRYSTALS, ON DEFORMATION REGULARITIES IN THE ELECTRIC FIELD, R.P. Zhitaru, P. Grau, Institute of Applied Physics, Academy of Sciences, Academy str, 5, 2028 Kishinev, Moldova | |
| H-I.6 | 12:00-12:30 | ABOUT THE MECHANISM OF PROLONGED PLASTIC DEFORMATION IN THE STRESS FIELD OF CONCENTRATED LOAD FOR MgO CRYSTALS, V.A. Rahvalov, Institute of Applied Physics, Academy of Sciences, Academy str, 5, 2028 Kishinev, Moldova | |
| 12:30-14:00 | LUNCH |
Thusday June 1, 1999- Afternoon
Mardi 1er juin 1999, Après-midi
| H-II.1 | 14:00-14:30 | -Invited- | INVESTIGATION OF RESIDUAL STRESSES IN MICROSYSTEMS USING X-RAY DIFFRACTION, B. Kämpfe, Fraunhofer Institute for Reliability and Microintegration, Gustav-Meyer-Allee 25, 13355 Berlin, Germany |
| H-II.2 | 14:30-15:00 | STRAIN MAPPING BY DIFFRACTION IMAGING, T. Wroblewski, DESY, Hamburg, Germany | |
| H-II.3 | 15:00-15:30 | RESIDUAL STRAIN MEASUREMENTS WITH SUBMICROMETER RESOLUTION IN LOCOS PROCESSED FILMS BY X-RAY DIFFRACTION, C. Giannini, L. De Caro, PASTIS-CNRSM, Brindisi, Italy; S. Di Fonzo, W. Jark, ELETTRA, Trieste, Italy; S. Lagomarsino, A. Cedola, IESS-CNR, Roma, Italy | |
| H-II.4 | 15:30-16:00 | MICRO-RAMAN STRESS IMAGING OF CERAMIC (C,SiC) FIBRE REINFORCED CMCs AND MMCs, G. Gouadec, DMSC, ONERA, BP 72, 92322 Châtillon, France and P. Colomban, LADIR, CNRS-u. ParisVI, 2 rue Henri-Dunant, 94320 Thiais, France | |
| 16:00-16:30 | BREAK | ||
| H-II.5 | 16:30-17:00 | MAGNETOPHONON RESONANCE AS METHOD OF CONTROLLING OF THE THERMAL STRESS IN THE MULTIPLE QUANTUM WELLS, G.Tomaka1, J. Cebulski, E.M. Sheregii, W. Œciuk, W. Strupiñski and L. Dobrzañski, Institute of Physics of Pedag. Univer., Rejtana 16a , 35-310 Rzeszów, Poland | |
| H-II.6 | 17:00-17:30 | RESIDUAL STAINS AND STRESSES RELEASE IN TMC (TITANIUM MATRIX COMPOSITES) USING ACOUSTIC EMISSION, Qi Fang, P.S.Sidky and G.M. Hocking, Department of Materials, Imperial College, Prince Consort Road, London SW7 2BP, UK | |
| H-II.7 | 17:30-18:00 | AN INDENTATION TECHNIQUE FOR STRESS MEASUREMENT, Y. Bisrat and S.G. Roberts, Oxford University, Department of Materials, Parks Road, OX1 3PH, Oxford, UK | |
| H-II.8 | 18:00-18:30 | EXPERIMENTAL AND NUMERICAL RESIDUAL STRESS ANALYSIS OF COATED COMPONENTS, K. Berreth, M. Buchmann, R. Gadow, J. Tabellion, Institute for Manufacturing Technologies of Ceramic Components and Composites, Allmandring 5b, 70569 Stuttgart, Germany |
Wednesday June 2, 1999 - Morning
Mercredi 2 juin 1999, Matin
| H-III.1 | 14:00-14:30 | ELASTIC AND PLASTIC STRAINS IN Al/TiW/Si CONTACTS DURING THERMAL CYCLES, S. Berger, Department of Materials Engineering, Technion, Haifa, Israel | |
| H-III.2 | 14:30-15:00 | MODELING OF STRESS DISTRIBUTION INDUCED BY UV IRRADIATION OF GERMANIUM DOPED FIBERS, F. Kherbouche and B. Poumellec, Laboratoire Physico-Chimie de l’Etat Solide - CNRS, Bât. 414, Université de Paris Sud, 91405 Orsay Cedex, France | |
| H-III.3 | 15:00-15:30 | STRESS RESISTANCE PARAMETERS OF BRITTLE SOLIDS UNDER LASER/PLASMA PULSE HEATING, V.N. Gurarie, School of Physics, MARC, University of Melbourne, Parkville VIC. 3052, Australia | |
| H-III.4 | 15:30-16:00 | LASER SHOCK WAVES AS A TOOL OF CHANGING THE STRAINS IN MATERIALS, Y.N. Nikiforov, Ternopil State Technical University 56 Russka St., 282001, Ternopil, Ukraine, V. Yakovyna and N.N. Berchenko, "Lviv Polytechnic" State University, 12 Bandera St., 290646 Lviv, Ukraine | |
| 16:00-16:30 | BREAK |
| H-IV.1 | 16:30-17:00 | X-ray characterization of residual stresses in electroplated Nickel used in LIGA technique, S. Basrour, L. Robert, LPMO, 32 avenue de l’Observatoire, 25044 Besançon, France and P. Delobelle, LMARC, 24 rue de l’Epitaphe, 25000 Besançon, France | |
| H-IV.2 | 17:00-17:30 | ROLE OF SOLDERING PARAMETERS ON THE ELECTRICAL PERFORMANCES PRESENTED BY Cu-Sn-Cu JOINTS USED IN POWER DIODES, C. Gonçalves, J. Ferreira, E. Fortunato, F. Braz Fernandes and R. Martins, CENIMAT, FCT-UNL, Monte da Caparica 2825-114, Caparica, Portugal, A.P. Marvão, CSP, Charneca da Caparica, Portugal; J.I. Martins, FEUP, Porto, Portugal | |
| H-IV.3 | 17:30-18:00 | RESIDUAL STRESSES IN NEW RAILS, G. Schleinzer, F.D. Fischer, Institut für Mechanik, Montanuniversität Leoben, Austria | |
| H-IV.4 | 18:00-18:30 | Stress-texturAL indicators of tribological wear L.Starczewski, Armour and Motor Technical Military Institute, 11-go Listopada Str.52, 05-070 Sulejówek, Poland, J.T.Bonarski and R.Ciach, Polish Academy of Sciences, Institute of Metallurgy and Materials Science, Reymonta Str. 25, 30-059 Kraków, Poland |
Thursday June 3, 1999 - Morning
Jeudi 3 juin 1999, Matin
| H-V.1 | 8:30-9:00 | -Invited- | X-RAY DIFFRACTION AS A TOOL TO STUDY THE MECHANICAL BEHAVIOR OF THIN FILMS, O. Kraft, M. Hommel and E. Arzt, Max-Planck-Institut für Metallforschung, Seestr. 92, 70174 Stuttgart, Germany |
| H-V.2 | 9:00-9:30 | RESIDUAL STRESSES IN CVD FREE-STANDING DIAA4OND FILMS BY XRD ANALYSES, O. Durand, J. Olivier, R. Bisaro and P. Galtier, Thomson-CSF, Laboratoire Central de Recherches, 91404 Orsay, France | |
| H-V.3 | 9:30-10:00 | STRESS ANALYSIS OF CUBIC BORON NITRIDE THIN FILMS, A. Klett, R. Freudenstein, M.F. Plass, W. Kulisch, University of Kassel, Institute of Technical Physics, 34109 Kassel, Germany | |
| H-V.4 | 10:00-10:30 | STRAIN IN MULTILAYERED SYSTEMS AND IT’S INFLUENCE ON ASYMMETRIC X-RAY DIFFRACTION PROFILES D. Chocyk, G. Gladyszewski, Department of Experimental Physics, Technical University of Lublin, ul. Nadbytrzycka 38, 20-618 Lublin, Poland T. Pienkos and L. Gladyszewski, Institute of Physics, MCS University, pl. M. Curie-Skodowskiej 1, 20-031 Lublin, Poland | |
| 10:30-11:00 | BREAK |
11:00-12:30
| H/P1 | ANISOTROPY OF FIELDS OF STRESSES IN SI MONOCRYSTALS WITH ORDERED DISLOCATIONS STRUCTURE, N.Ya. Gorid'ko, V.G. Sushko, P.A. Teselko, Physical Faculty, Kiev Taras Shevchenko University, Glushkova prospect 6, 252022 Kiev, Ukraine |
| H/P2 | DETERMINATION OF STRAW AND COMPOSffION OF HETERO- EPITAXIAL TERNARY (AlGaIn)-NITRIDE FILMS USING X-RAY DIFFRACTOMETRY, N. Herres, A. Ramakdshnan, M. Seelmann- Eggebert, H. Obloh, J. Wagner, Fraunhofer-Institut für Angewandte Festkörperphysik, Tullastrasse 72, 79108 Freiburg, Germany |
| H/P3 | NEUTRON STRAIN SCANNING ON BIMETALLIC TUBES, C.R. Borlado and F.J. Mompean, ICMM, CSIC, 28049 Madrid, Spain; Ru Lin, NFL, Studsvik, 61182 Nyköping, Sweden; J. Izquierdo, IBERDROLA S.A., Hermosilla 2, 28001 Madrid, Spain; M.A. Ramos, Babcock & Wilcox Espanola, 48510 Galindo, Spain |
| H/P4 | EPITAXIAL STRESS STUDY BY LARGE ANGLE CONVERGENT BEAM ELECTRON DIFFRACTION (LACBED), F. Pailloux, R.J. Gaboriaud, C. Champeaux*, A. Catherinot*; LMP, SP2MI, bd3, téléport2, BP179, 86960 Futuroscope cedex, France; *SPCTS, Faculté des Sciences,123 av. A. Thomas, 87060 Limoges cedex, France |
| H/P5 | MORPHOLOGICAL AND STRUCTURAL CHARACTERISTICS PRESENTED BY THE Cu-Sn-Cu METALLURGICAL SYSTEM USED IN ELECRONIC JOINS, C. Gonçalves, J. Ferreira, E. Fortunato, F. Braz Fernandes and R. Martins, CENIMAT, FCT-UNL, Monte da Caparica 2825-114, Caparica, Portugal, A.P. Marvão, CSP, Charneca da Caparica, Portugal; J.I. Martins, FEUP, Porto, Portugal |
| H/P6 | STRESS IN SixN1-x THIN FILMS DEPOSITED AT LOW TEMPERATURES BY LASER CVD, S. Berger, Department of Materials Engineering, Technion, Haifa 32000, Israel; S. Tamir, Metal Institute, Technion, Haifa 32000, Israel |
| H/P7 | CONTROLLING KINETIC AND INERTIAL PROPORTIES OF LARGE CsI(Na) CRYSTALS WITH HOMOGENEOUS ACTIVATOR DISTRIBUTION, V.I. Goriletsky, B.V. Grinyov, A.N. Panova, K.V. Shakhova, E.L. Vinograd, S.P. Korsunova, Alkali Halide, Crystal Department, STC "Institute for Single Crystals", NAS of Ukraine. |
| H/P8 | PRODUCTION OF PRESET QUALITY LARGE NaI(Tl) SINGLE CRYSTALS FOR DETECTORS USED IN MEDICAL INSTRUMENT BUILDING, V.I. Goriletsky, B.V. Grinyov, K.V. Shakhova, A.N. Panova, S.K. Bondarenko ,L.V. Udovichenko, V.I. Sumin, A.I. Mitichkin, V.A. Kuznetsov, Y.M. Epifanov, S.P. Korsunova, Alkali Halide Crystal Department, STC "Institute for Single Crystals", NAS of Ukraine, Kharkov, Ukraine |
| H/P9 | INFLUENCE OF INTRINSIC STRESSES ON CRYSTALOGRAPHIC DEFECTS DISTRIBUTION IN Cz-Si WAFERS, T. Piotrowski, W. Jung, Institute of Electron Technology, Al. Lotników 32/46, 02-668 Warsaw, Poland |
| H/P10 | INVESTIGATION OF RESIDUAL STRESSES IN TMC (TITANIUM MATRIX COMPOSITES) USING MATRIX ETCHING, Qi Fang, P.S. Sidky and G.M. Hocking, Department of Materials, Imperial College, Prince Consort Road, London SW7 2BP, UK |
| H/P11 | STRESSES IN SI/COSI2/SI HETEROSTRUCTURES FORMED BY IBS, Yu.N.Parkhomenko, K.D.Chtcherbatchev, A.V.Bozhenov, E.A. Vygovskaya, Moscow State Institute of Steel and Alloys, Leninskii pr. 4, 117936 Moscow, Russia |
| H/P12 | Measurement of residual stresses in a plate using bulging test and a vibrational technique. Application to electrolytic Nickel coatings, S. Basrour, L. Robert, LPMO, 32 avenue de l’Observatoire, 25044 Besançon, France and P. Delobelle, LMARC, 24 rue de l’Epitaphe, 25000 Besançon, France |
| H/P13 | STRONG ELASTIC DEFORMATION INFLUENCE ON SCATTERING MECHANISMS IN QUANTUM WIRES BASED ON SEMIMETALS, A.A. Nikolaeva*,**, A.N. Burchakov*, E.P. Condrea*, D.V. Gitsu*; *Institute of Applied Physics, Kishinev, Moldova; **International Laboratory of High Magnetic Fields and Low Temperatures, Wroclav, Poland |
| H/P14 | STRESSES AND FINE DEFECT STRUCTURE OF SAPPHIRE CRYSTALS, GROWN IN A LOW PRESSURE CARBON CONTAINING GAS ATMOSPHERE, V.T. Tkachenko, V.M. Puzikov, A.Ya.Danko, S.V.Nizhankovski, G.T.Adonkin, A.T.Budnikov, N.S.Sidelnikova, Institute for Single Crystals, National Academy of Sciences of Ukraine, 60 Lenin ave., 310001, Kharkov, Ukraine |
| H/P15 | INVESTIGATION OF RESIDUAL STRESS IN THIN MEMBRANES OBTAINED BY BORON DIFFUSION PROCESSES, E. Manea, I. Cernica, R. Divan, R. Muller, National Institute for Research and Development of Microtechnology PO box 38-160, Bucharest, Romania |
| H/P16 | STRESS IN THIN Ga DOPED SILICOORGANIC COATINGS DEPOSITED BY R.F. PLASMA GLOW DISCHARGE, S. Tamulevicius, R. Dargis, J. Jankauskas, G.Laukaitis Department of Physics, Kaunas University of Technology, Studentu 50, LT-3031 Kaunas, Lithuania J. Tyczkowski, H. Szymanowski, R. Mazurczyk, Polish Academy of Sciences |
| H/P17 | STRESS RELAXATION EFFECT IN Ag/Pd SUPERLATTICE AT INITIAL STAGES OF ION BEAM MIXING, T. Pienkos, L. Gladyszewski, Institute of Physics, MCS University, pl. M. Curie-Sklodowskiej 1, 20-031 Lublin, Poland, D. Chocyk and G. Gladyszewski, Department of Experimental Physics, Technical University of Lublin, ul. Nadbytrzycka 38, 20-618 Lublin, Poland |
| H/P18 | COMPARATIVE ANALYSIS OF INDICATOR MICROSTRUCTURES FOR RESIDUAL STRESS DETERMINATION, I. Pavelescu and V.M. Poladian, National Institute for R&D in Microtechnologies, P.O. Box 38-160, 72225 Bucharest, Romania |
| H/P19 | TWO-DIMENSIONAL MAPPING OF RESIDUAL STRAIN-INDUCED BIREFRINGENCE IN DIFFERENTLY GROWN SEMICONDUCTORS FOR OPTICAL COMMUNICATION APPLICATIONS, A. Milani, S.M. Pietralunga, A. Sangiovanni, A. Zappettini and M. Martinelli, CoreCom, via Ampere 30, 20131 Milano, Italy |
| H/P20 | OPTIMIZATION OF THE STRAIN IN ZnO PIEZOELECTRIC LAYERS FOR SENSOR APPLICATIONS, M.J. Geerts et al. Delft University, Dept of Electronics - DIMES, 4 Mekelweg, 2600 CD Delft, The Netherlands |
| H/P21 | Effect of the silicon cleaning procedure on the strain and texture of copper deposited thin films, N. Benouattas, Institut de Physique, Université Ferhat Abbas, 19000 Sétif, Algérie, A. Mosser, IPCMS, UM 7504, CNRS, 67037 Strasbourg Cedex France and A. Bouabellou, Institut de Physique, Université de Constantine, 25000 Constantine, Algérie |
| H/P22 | SILICON ELASTOMER AS PROTECTIVE LAYER IN 3D MICROFABRICATION OF MOEMS, P. Obreja, R. Muller, E. Manea, National Institute for Research and Development in Microtechnologies , PO Box.36-160, 72225 Bucharest, Romania |
| H/P23 | X-RAY DIFFRACTION UNDER NON-HYDROSTATIC CONDITIONS IN EXPERIMENTS WITH DIAMOND ANVIL CELL, L. Dubrovinsky, N. Dubrovinskaia, S. Saxena, Institute of Earth Sciences, Uppsala University, 752 36, Villavagen 16, Uppsala, Sweden |
| H/P24 | CHANGE OF CHAINS TENSION AT MOLECULAR REOGROUPINGS IN DEFORMATION OF AN ORIENTED FLEXIBLE CHAIN CRYSTALLINE POLYMER, U. Gafurov, Institute of Nuclear Physics, Tashkent 702132, Uzbekistan |
| H/P25 | MODEL OF RUPTURE OF A STRESSED MACROMOLECULAR CHAIN IN AN ORIENTED CRYSTALLINE POLYMER, U.Gafurov, Institute of Nuclear Physics, Tashkent, Ulugbek, 702132, Uzbekistan |
| 12:30-14:00 | LUNCH |
Thursday June 3, 1999 - Afternoon
Jeudi 3 juin 1999, Après-midi
| H-V.6 | 14:30-15:00 | INFLUENCE OF THE GaAs SUBSTRATE ORIENTATION AND LATTICE STRAIN ON THE INDIUM INCORPORATION DURING MOVPE AND MBE GROWTHS OF INGAAS EPITAXIAL LAYERS, L. De Caro, M.F. De Riccardis, C. Giannini, L. Tapfer, Centro Nazionale Ricerca e Sviluppo Materiali (PASTIS-CNRSM), Strada Statale 7 Appia km 712, 72100 Brindisi, Italy; L. Däweritz, K.H. Ploog, Paul-Drude-Institut für Festkörperelektronik, Hausvogteiplatz 5-7, 10117 Berlin, Germany; G. Bernatz, W. Stolz, Wiss. Zentrum für Materialwissenschaften und Fachbereich Physik, Philipps-Universität, Hans-Meerwein-Strasse, 35032 Marburg, Germany | |
| H-V.5 | 14:00-14:30 | STRAIN IN EPITAXIAL Pt FILMS GROWN ON MgO BY LASER ABLATION, W. Seiler, K. Payraudeau, LM3, ESA 8006 CNRS, ENSAM, 151 Boulevard de l'hôpital, 75013 Paris, France and M. Morcrette, A. Laurent, J. Perrière, GPS, URA 7588 CNRS, Université Paris VII, 2 Place Jussieu, 75251 Paris Cedex 05, France | |
| H-V.7 | 15:00-15:30 | STRESS AND SURFACE STUDIES OF CdS THIN FILMS, S. Tamulevicius, G. Laukaitis, Department of Physics, Kaunas University of Technology, Studentu 50, 3031 Kaunas, Lithuania, M.P. Valkonen, S. Lindroos, M. Leskelä , Department of Chemistry, University of Helsinki, P.O. Box 55, 00014 Helsinki, Finland | |
| H-V.8 | 15:30-16:00 | THE INFLUENCE OF THE STRESS ON MNOS STRUCTURE PROPERTIES, V.G. Litovchenko, V.G. Popov, A. A. Evtukh, B. M. Romanjuk, Institute of Semiconductor Physics , 45 Prospekt Nauki, Kiev, 252650, Ukraine | |
| 16:0-16:30 | BREAK | ||
| H-V.9 | 16:30-17:00 | STRAIN IN SrTiO3 THIN FILMS CONSTITUENTED OF MULTI-LAYER STRUCTURES, P.K. Petrov, S.S. Gevorgian, Dept. of Microelectronics, Chalmers University of Technology, 412-96 Gothenburg, Sweden, and Z.G. Ivanov, Dept. of Physics, Chalmers University of Technology and Gothenburg University, 412-96 Gothenburg, Sweden | |
| H-V.10 | 17:00-17:30 | X-RAY REFLECTIVITY STUDY OF FORMATION OF MULTILAYER POROUS ANODIC OXIDES OF SILICON, R. Fenollosa, V. Parkhutik, Universidad Politécnica de Valencia, Camí de Vera s/n, 46071 Valencia, Spain, H. You and Y. Chu, Argonne National Laboratory, 9700 S. Cass Avenue, Argonne IL 60439, USA, J.Alamo, Universidad de Valencia, Carrer Moliner s/n, Burjassot, Valencia, Spain | |
| H-V.11 | 17:30-18:00 | DANGLING-BOND concentration dependence OF internal STRAIN AT THE (111)Si/SiO2 INTERFACE, A. Stesmans and B. Nouwen, Department of Physics, University of Leuven, 3001 Leuven, Belgium | |
| H-V.12 | 18:00-18:30 | STUDY ON THE PROPERTIES OF SI-SIO2 SYSTEM INTERFACE THROUGH APPLICATION OF A MECHANICAL STRESS, S. Iovan and M.L. Grecea, Institute of Microtechnologies, PO Box 38-160, 72225 Bucharest, Romania |
Friday June 4, 1999 - Morning
Vendredi 4 juin 1999, Matin
| H-VI.1 | 8:30-9:00 | STRAIN IN TUNGSTEN-BASED SOLID SOLUTIONS. MODELING OF LATTICE TETRAGONALITY, V. Liubich and D. Fuks, Mat.Eng. Dept., BGU, P.O.B. 653, 84105 Beer Sheva, Israel; S. Dorfman, Dept.of Phys., Technion, 32000 Haifa, Israel | |
| H-VI.3 | 9:00-9:30 | ORDERING OF METALS DEFECTS STRUCTURES AT THE INFLUENCE OF HIGH ENERGETIC PARTICLES, M.D. Starostenkov, V.L. Orlov, A.V. Orlov, D.S. Tupitsin General Physics Dept, Altai State Technical University, Lenin st 46, 656099 Barnaul, Russia. | |
| H-VI.3 | 9:30-10:00 | THE FEATURES OF DEFECT STRUCTURE AND PROPERTIES CHANGING OF IRON BASED POWDER ALLOYS SINTERED BY HIGH-RATE ELECTRIC HEATING, L.O. Andrusheik, Institute for Metal Physic of Ukrainian Academy of Sciences, Vernadsku bevol 36, 252680 Kiev 142, Ukraine | |
| H-VI.4 | 10:00-10:30 | The analysis of wedge-like twins evolution as a method of stressed ion-implanted surface layers investigation, V.V. Uglov, Belarussian State University, pr. F. Scoriny 4, 220080 Minsk, Belarus; O.M. Ostrikov, Mozyr State Pedagogical Institute, ul. Studencheskaya 28, 247760 Mozyr, Belarus | |
| 10:30-11:00 | BREAK | ||
| H-VI.5 | 11:00-11:30 | THE MOLECULAR MODEL OF TENSION AND SLIPPAGE OF THE STRAINED MACROMOLECULES IN HIGHORIENTED LINEAR CRYSTALLINE POLYMER, U. Gafurov, E.Pestrikova,E. Urusova, Institute of Nuclear Physics, Ulugbek, Tashkent 702132, Uzbekistan | |
| H-VI.6 | 11:30-12:00 | EXPERIMENTAL STUDY OF THE VISCOSITY OF THE MELTS IN THE AIV-Te — AIVTe SYSTEMS AND ANALYSIS OF THE CHANGES IN THE REDUNDANT THERMODYNAMIC FUNCTIONS, V.M. Giazov and V.G. Pavlov, Department of Physical Chemistry, Moscow Institute of Electronic Engineering (Technical University), 103498 Moscow, Russia. | |
| H-VI.7 | 12:00-12:30 | INFLUENCE OF A WEAK MAGNETIC FIELD ON SPIN-DEPENDENT RELAXATION OF STRUCTURAL DEFECTS IN DIAMAGNETIC CRYSTALS, Y.I. Golovin, R.B. Morgunov, Department of Physics, Tambov State University, 33 Internationalnaya str., Tambov 392622, Russia |
End of Symposium H
