TECHNICAL  COMMITTEES AND SUB-COMMITTEES

Quality and Reliability Techniques for Components and System
Chairmen: M. Catelani  W. De Ceuninck
Failure Mechanisms in Silicon devices
Chairmen: N.Stojadinovic  C.Caprile
Failure Mechanisms in Compound Semiconductors devices
Chairmen: N. Labat  R. Menozzi
Non-volatile and programmable device reliability
Chairman: P. Pavan
Power Devices Reliability
Chairmen: M.Ciappa G. Busatto
Photonics Reliability
 Chairmen: J. Arnaud  J.M.Dumas
Packaging and Assembly Reliability
Chairman: C.Cognetti 
Advanced Failure Analysis : Defect Detection and Analysis
Chairmen: G.Queirolo  P.Perdu
EOBT
Chairmen: R. Cramer  W. Claeys
ESD
Chairmen: G.Meneghesso T. Mouthaan
MEMS/MOEMS (Special Session)
Chairman: I. De Wolf   E. Wolfgang 
Microelectronic Realibility Anniversary (Special Session)
Chairman: N.Stojadinovic

 

CORRESPONDING MEMBERS AND REVIEWERS

 ESD

Giuseppe Croce - ST Microelectronics, Milan – (Italy)                  
Antonio Andreini - STMicroelectronics, Milan – (Italy)
Christian Russ, Sarnoff Corporation, Princeton, NJ (USA)
Fred Kuper, Philips Semiconductors, Nijmegen, (The Netherlands)
Wolfgang Stadler, Infineon Technologies, Munich, (Germany)
Joachim Reiner    EMPA  (Switzerland)

 Photonic Reliability

Boisrobert Christian, University of Nantes (France)

Caloz François ,  Diamond (Switzerland)

Pusch  Reinhard, Alcatel (Germany)

Villa Marco, Pirelli (Italy)

 Quality and Reliability Techniques for Components and System

Cathérine Dekeuleire - Alcatel Microelectronics – Oudenaarde – (Belgium)

Kristof Croes –Xpeqt – Tessenderlo – (Belgium)

 Failure Mechanisms in Silicon devices

Gerard Ghibaudo, LPCS/ENSERG,  (France)
Sima Dimitrijev, Griffith University (Australia)

Xavier Aymerich, University of Barcelona (Spain)

Roland Thewes, Infineon Technologies (Germany)
Ton Mouthaan, University of Twente (The Netherlands)
Luc De Schepper, Limburgs University (Belgium)
Hiroshi Iwai, Tokyo Institite of Technology (Japan)
Dimitris Kouvatsos, IMEL Demokritos (Greece)
Lucile Arnaud, LETI/CEA (France)
Merlyne De Souza, De Montfort University (UK)
Gabriella Ghidini - STMicroelectronics  Agrate (MI) –( Italy)
Andrea Scorzoni, University of Perugia (Italy)
Bruno Neri, University of Pisa (Italy)

 Non-volatile and programmable device reliability

Gabriella Ghidini - STMicroelectronics - Agrate (MI) – (Italy)
Dirk Wellekens - IMEC – (Belgium)
Luigi Pantisano - IMEC - (Belgium)
Andrea Scarpa - Philips Semiconductors - Nijmegen, (The Netherlands)

 Packaging and Assembly Reliability
 Luc Petit  -  ST Microelectronics (France)
 Isabelle Baudry  - ST Microelectronics  (France)
 Tong Yan Tee - ST Microelectronics  (Singapore)
 Valter Motta - ST Microelectronics  (Italy)
 Failure Mechanisms in Compound Semiconductors devices

Jean-Michel Dumas, ENSIL, Université de Limoges (France)
Hans L. Hartnagel , TU Darmstadt (Germany)
Jean-Luc Muraro, Alcatel Space Industry (France)

 Paolo Cova University of  Parma (Italy)
Peter Ersland  M/A-COM  (USA)
Michael Dammann Fraunhofer Inst. IAF – Freiburg (Germany)
Tim Henderson  TriQuint Texas (USA)

 Power Devices Reliability

Paolo Dovano, Fiat (Italy)
Frederic Lecoq, Renault (France)

Wolfgang Wondrak, Daimler Chrysler (Germany)
Yasushi Yamada, Toyota (J)

Gerard Coquery, INRETS (France)

Paolo Cova, Uni Parma (Italy)
Christian Zardini, Uni Bordeaux (France)

Luigi Fratelli, Ansaldo Breda (Italy)
Norbert Seliger, Siemens (Germany)
Hermann Berg, Eupec (Germany)

Ferruccio Frisina, ST Microelectronics (Italy)

Raymond Zehringer, ABB (CH)

 EOBT

Alain Cornet, University of Louvain (Belgium)
Stefan Dilhaire, University Bordeaux I (France)
Pascal Fouillat University Bordeaux I (France)
Hiromu Fujioka Osaka University (Japan)
Ralf Heiderhoff ,University of Wuppertal (Germany)
Siegfried Görlich Infineon Technologies (Germany)
Wolfgang Mertin University of Duisburg, (Germany)
Jacob C.H. Phang National University of Singapore
Antonio Rubio University Polytechnica of Barcelona (Spain)
 Advanced Failure Analysis: Defect Detection and Analysis

Gerald Haller ST Rousset (France) 
Moyra Mc Manus IBM Research, Yorktown Heights (USA) 
Bernard Picard ATMEL Rousset (France )
Jerome Touzel INFINEON Munich (Germany )
Romain Desplats CNES Toulouse (France) 
Philippe Descamp PHILIPS Caen (France) 
Christophe Goupil PHILIPS Caen (France) 

Bernd Ebersberger INFINEON Munich (Germany )

Candida Caprile ST Agrate (Italy) 

 MEMS

Jürgen Villain  FHA  Augsburg (Germany)
Gerhard Wachutka  Technical University of Munich  (Germany)
Roman Szeloch  Wroclaw University of Technology  (Poland) 
Vittorio Foglietti  CNR-IESS  (Italy)
Francis Pressecq  CNES (France)

 WELCOME ESREF 2002