Les revues "Microelectronics Reliability" et "Microelectronics Journal", ELSEVIER, décembre 2004.
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Titre : Les revues Microelectronics Reliability et Microelectronics Journal, ELSEVIER, décembre 2004.

Cité dans : [DIV002]  Liste des librairies et des catalogues constructeurs, décembre 2014.
Cité dans : [CONF016] ESREF, European Symposium on Reliability of Electron Devices, Failure Physics and Analysis et Microelectronics and Reliability, décembre 2005.

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Vers : Microelectronics Reliability 45 - 2005
Vers : Microelectronics Reliability 44 - 2004
Vers : Microelectronics Reliability 43 - 2003
Vers : Microelectronics Reliability 42 - 2002
Vers : Microelectronics Reliability 41 - 2001
Vers : Microelectronics Reliability 40 - 2000
Vers : Microelectronics Reliability 39 - 1999
Vers : Microelectronics Reliability 38 - 1998
Vers : Microelectronics Reliability 37 - 1997
Vers : Microelectronics Reliability 36 - 1996
Vers : Microelectronics Reliability 35 - 1995

Vers : Microelectronics Journal 32 - 2001
Vers : Microelectronics Journal 31 - 2000
Vers : Microelectronics Journal 30 - 1999
Vers : Microelectronics Journal 29 - 1998

Vers : Special Issues


Microelectronics Reliability 45 - 2005

TOP

  [1] :  [PAP158]  -------
  [2] : [REVUE554] Elsevier Science, Microelectronics Reliability, Volume 45, Issue 1, Pages 1-198, January 2005.


Microelectronics Reliability 44 - 2004

TOP

  [1] : [REVUE544] Elsevier Science, Microelectronics Reliability, Volume 44, Issue 12, Pages 1891-2054 , December 2004.
  [2] :  [DIV423]  ESREF'2004, 15th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, du 4 au 8 octobre 2004, ETH, Zurich, Switzerland.
  [3] : [REVUE538] Elsevier Science, Microelectronics Reliability, Volume 44, Issues 9-11, Pages 1281-1890, September-November 2004.
  [4] : [REVUE530] Elsevier Science, Microelectronics Reliability, Volume 44, Issue 8, Pages 1207-1280, August 2004.
  [5] : [REVUE529] Elsevier Science, Microelectronics Reliability, Volume 44, Issue 7, Pages 1031-1206, July 2004.
  [6] : [REVUE520] Elsevier Science, Microelectronics Reliability, Volume 44, Issue 6, Pages 889-1029, June 2004.
  [7] : [REVUE519] Elsevier Science, Microelectronics Reliability, Volume 44, Issue 5, Pages 709-888, May 2004.
  [8] : [REVUE482] Elsevier Science, Microelectronics Reliability, Volume 44, Issue 4, Pages 549-708, April 2004.
  [9] : [REVUE481] Elsevier Science, Microelectronics Reliability, Volume 44, Issue 3, Pages 365-548, March 2004.
 [10] : [REVUE480] Elsevier Science, Microelectronics Reliability, Volume 44, Issue 2, Pages 183-364, February 2004.
 [11] : [REVUE465] Elsevier Science, Microelectronics Reliability, Volume 44, Issue 1, Pages 1-182, January 2004.

Microelectronics Reliability 43 - 2003

TOP

  [1] : [REVUE464] Elsevier Science, Microelectronics Reliability, Volume 43, Issue 12, Pages 1969-2119, December 2003.
  [2] :  [DIV365]  ESREF'2003, 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, du 6 au 10 octobre 2003.
  [3] : [REVUE435] Elsevier Science, Microelectronics Reliability, Volume 43, Issues 9-11, Pages 1351-1968, September-November 2003.
  [4] : [REVUE434] Elsevier Science, Microelectronics Reliability, Volume 43, Issue 8, Pages 1173-1349, August 2003.
  [5] : [REVUE433] Elsevier Science, Microelectronics Reliability, Volume 43, Issue 7, Pages 985-1172, July 2003.
  [6] : [REVUE432] Elsevier Science, Microelectronics Reliability, Volume 43, Issue 6, Pages 821-984, June 2003.
  [7] : [REVUE418] Elsevier Science, Microelectronics Reliability, Volume 43, Issue 5, Pages 685-819, May 2003.
  [8] : [REVUE417] Elsevier Science, Microelectronics Reliability, Volume 43, Issue 4, Pages 517-684, April 2003.
  [9] : [REVUE388] Elsevier Science, Microelectronics Reliability, Volume 43, Issue 3, Pages 343-515, March 2003.
 [10] : [REVUE387] Elsevier Science, Microelectronics Reliability, Volume 43, Issue 2, Pages 179-342, February 2003.
 [11] : [REVUE386] Elsevier Science, Microelectronics Reliability, Volume 43, Issue 1, Pages 1-177, January 2003.

Microelectronics Reliability 42 - 2002

TOP

  [1] : [REVUE378] Elsevier Science, Microelectronics Reliability, Volume 42, Issue 12, Pages 1823-2034, December 2002.
  [2] : [REVUE377] Elsevier Science, Microelectronics Reliability, Volume 42, Issues 9-11, Pages 1249-1822, September - November 2002.
  [3] :  [DIV312]  ESREF'2002, 13th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, du 7 au 11 octobre 2002, Bellaria, Rimini, Italie.
  [4] : [REVUE355] Elsevier Science, Microelectronics Reliability, Volume 42, Issue 8, Pages 1153-1248, August 2002.
  [5] : [REVUE354] Elsevier Science, Microelectronics Reliability, Volume 42, Issue 7, Pages 995-1151, July 2002.
  [6] : [REVUE341] Elsevier Science, Microelectronics Reliability, Volume 42, Issue 6, Pages 805-993, June 2002.
  [7] : [REVUE296] Elsevier Science, Microelectronics Reliability, Volume 42, Issues 4-5, Pages 463-804, April - May 2002.
  [8] : [REVUE295] Elsevier Science, Microelectronics Reliability, Volume 42, Issue 3, Pages 307-461, March 2002.
  [9] : [REVUE294] Elsevier Science, Microelectronics Reliability, Volume 42, Issue 2, Pages 157-305, February 2002.
 [10] : [REVUE281] Elsevier Science, Microelectronics Reliability, Volume 42, Issue 1, Pages 1-156, January 2002.

Microelectronics Reliability 41 - 2001

TOP

  [1] : [REVUE280] Elsevier Science, Microelectronics Reliability, Volume 41, Issue 12, Pages 1915-2095, December 2001.
  [2] : [REVUE257] Elsevier Science, Microelectronics Reliability, Volume 41, Issue 11, Pages 1737-1913, November 2001.
  [3] : [REVUE279] Elsevier Science, Microelectronics Reliability, Volume 41, Issues 9-10, Pages 1273-1736, September - October 2001.
  [4] :  [DATA227] ESREF'2001, 12th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Arcachon, France , 1-5 octobre 2001.
  [5] : [REVUE256] Elsevier Science, Microelectronics Reliability, Volume 41, Issue 8, Pages 1101-1272, August 2001.
  [6] : [REVUE255] Elsevier Science, Microelectronics Reliability, Volume 41, Issue 7, Pages 933-1100, July 2001.
  [7] : [REVUE243] Elsevier Science, Microelectronics Reliability, Volume 41, Issue 6, Pages 779-931, June 2001.
  [8] : [REVUE219] Elsevier Science, Microelectronics Reliability, Volume 41, Issue 5, Pages 625-777, May 2001.
  [9] : [REVUE218] Elsevier Science, Microelectronics Reliability, Volume 41, Issue 4, Pages 481-624, April 2001.
 [10] : [REVUE217] Elsevier Science, Microelectronics Reliability, Volume 41, Issue 3, Pages 333-480, March 2001.
 [11] : [REVUE194] Elsevier Science, Microelectronics Reliability, Volume 41, Issue 2, Pages 145-332, February 2001.
 [12] : [REVUE193] Elsevier Science, Microelectronics Reliability, Volume 41, Issue 1, Pages 1-143, January 2001.

Microelectronics Reliability 40 - 2000

TOP

  [1] : [REVUE171] Elsevier Science, Microelectronics Reliability, Vol. 40, Issue 12, pp. 1981-2152, December 2000.
  [2] : [REVUE170] Elsevier Science, Microelectronics Reliability, Vol. 40, Issue 11, pp. 1773-1980, November 2000.
  [3] : [REVUE190] Elsevier Science, Microelectronics Reliability, Vol. 40, Issue 8-10, pp. 1243-1770, august-october 2000.
  [4] :  [DATA126] ESREF'2000, 11th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, Dresden, Germany, 2-6 octobre 2000.
  [5] : [REVUE163] Elsevier Science, Microelectronics Reliability, Vol. 40, Issue 7, pp. 1069-1241, July 2000.
  [6] : [REVUE164] Elsevier Science, Microelectronics Reliability, Vol. 40, Issue 6, pp. 897-1067, June 2000.
  [7] : [REVUE165] Elsevier Science, Microelectronics Reliability, Volume 40, Issues 4-5, Pages 555-895, 1 April 2000.
  [8] : [REVUE166] Elsevier Science, Microelectronics Reliability, Volume 40, Issue 3, Pages 365-546, 17 March 2000.
  [9] : [REVUE167] Elsevier Science, Microelectronics Reliability, Vol. 40, Issue 2, pp. 191-364, 28 February 2000.
 [10] : [REVUE168] Elsevier Science, Microelectronics Reliability, Volume 40, Issue 1, Pages 1-183, 14 January 2000.

Microelectronics Reliability 39 - 1999

TOP

  [1] : [REVUE242] Elsevier Science, Microelectronics Reliability, Volume 39, Issue 12, Pages 1721-1902 (17 December 1999.
  [2] : [REVUE241] Elsevier Science, Microelectronics Reliability, Volume 39, Issue 11, Pages 1519-1714 (November 1999.
  [3] : [REVUE240] Elsevier Science, Microelectronics Reliability, Volume 39, Issue 10, Pages 1423-1518 (October 1999.
  [4] : [REVUE239] Elsevier Science, Microelectronics Reliability, Volume 39, Issue 9, Pages 1311-1421 (September 1999.
  [5] : [REVUE238] Elsevier Science, Microelectronics Reliability, Volume 39, Issue 8, Pages 1173-1303 (August 1999.
  [6] : [REVUE172] Elsevier Science, Microelectronics Reliability, Volume 39, Issues 6-7, Pages 721-1170, June - July 1999.
  [7] :  [DATA196] ESREF'99, Proceedings of the 10th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis.
  [8] : [REVUE237] Elsevier Science, Microelectronics Reliability, Volume 39, Issue 5, Pages 551-719, May 1999.
  [9] : [REVUE236] Elsevier Science, Microelectronics Reliability, Volume 39, Issue 4, Pages 441-549, April 1999.
 [10] : [REVUE235] Elsevier Science, Microelectronics Reliability, Volume 39, Issue 3, Pages 327-429, March 1999.
 [11] : [REVUE234] Elsevier Science, Microelectronics Reliability, Volume 39, Issue 2, Pages 159-323, February 1999.
 [12] : [REVUE233] Elsevier Science, Microelectronics Reliability, Volume 39, Issue 1, Pages 1-149, January 1999.

Microelectronics Reliability 38 - 1998

TOP

  [1] : [REVUE300] Elsevier Science, Microelectronics Reliability, Volume 38, Issue 12, Pages 1811-1996 (December 1998.
  [2] : [REVUE299] Elsevier Science, Microelectronics Reliability, Volume 38, Issue 11, Pages 1647-1801 (November 1998.
  [3] : [REVUE298] Elsevier Science, Microelectronics Reliability, Volume 38, Issue 10, Pages 1519-1645 (October 1998.
  [4] : [REVUE305] Elsevier Science, Microelectronics Reliability, Volume 38, Issue 9, Pages 1367-1512 (September 1998.
  [5] :  [DATA233] ESREF'98, Proceedings of the 9th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis, 5-9 October 1998.
  [6] : [REVUE253] Elsevier Science, Microelectronics Reliability, Volume 38, Issues 6-8, Pages 851-1366, 8 June 1998.
  [7] : [REVUE304] Elsevier Science, Microelectronics Reliability, Volume 38, Issue 5, Pages 709-841 (May 1998.
  [8] : [REVUE303] Elsevier Science, Microelectronics Reliability, Volume 38, Issue 4, Pages 497-708 (April 1998.
  [9] : [REVUE302] Elsevier Science, Microelectronics Reliability, Volume 38, Issue 3, Pages 295-478 (March 1998.
 [10] : [REVUE301] Elsevier Science, Microelectronics Reliability, Volume 38, Issue 2, Pages 179-291 (February 1998.
 [11] : [REVUE297] Elsevier Science, Microelectronics Reliability, Volume 38, Issue 1, Pages 1-178 (January 1998.

Microelectronics Reliability 37 - 1997

TOP

  [1] : [REVUE330] Elsevier Science, Microelectronics Reliability, Volume 37, Issue 12, Pages 1799-1881 (December 1997.
  [2] : [REVUE199] Elsevier Science, Microelectronics Reliability, Vol. 37, Issues 10-11, Pages 1421-1798, 11 October 1997.
  [3] : [REVUE339] Elsevier Science, Microelectronics Reliability, Volume 37, Issue 9, Pages 1301-1420, September 1997.
  [4] : [REVUE338] Elsevier Science, Microelectronics Reliability, Volume 37, Issue 8, Pages 1161-1291 (August 1997.
  [5] : [REVUE337] Elsevier Science, Microelectronics Reliability, Volume 37, Issue 7, Pages 983-1150 (July 1997.
  [6] : [REVUE336] Elsevier Science, Microelectronics Reliability, Volume 37, Issue 6, Pages 875-976 (June 1997.
  [7] : [REVUE335] Elsevier Science, Microelectronics Reliability, Volume 37, Issue 5, Pages 713-874 (May 1997.
  [8] : [REVUE334] Elsevier Science, Microelectronics Reliability, Volume 37, Issue 4, Pages 549-712 (April 1997.
  [9] : [REVUE333] Elsevier Science, Microelectronics Reliability, Volume 37, Issue 3, Pages 381-547, March 1997.
 [10] : [REVUE332] Elsevier Science, Microelectronics Reliability, Volume 37, Issue 2, Pages 187-379 (February 1997.
 [11] : [REVUE331] Elsevier Science, Microelectronics Reliability, Volume 37, Issue 1, Pages 3-186 (January 1997.

Microelectronics Reliability 36 - 1996

TOP

  [1] : [REVUE328] Elsevier Science, Microelectronics Reliability, Volume 36, Issues 11-12, Pages 1603-1946 (12 November 1996.
  [2] : [REVUE321] Elsevier Science, Microelectronics Reliability, Volume 36, Issue 10, Pages 1323-1601 (October 1996.
  [3] : [REVUE327] Elsevier Science, Microelectronics Reliability, Volume 36, Issue 9, Pages 1141-1317 (September 1996.
  [4] : [REVUE329] Elsevier Science, Microelectronics Reliability, Volume 36, Issues 7-8, Pages 845-1136 (8 July 1996.
  [5] : [REVUE326] Elsevier Science, Microelectronics Reliability, Volume 36, Issue 6, Pages 729-841 (June 1996.
  [6] : [REVUE325] Elsevier Science, Microelectronics Reliability, Volume 36, Issue 5, Pages 581-710 (May 1996.
  [7] : [REVUE324] Elsevier Science, Microelectronics Reliability, Volume 36, Issue 4, Pages 457-562 (April 1996.
  [8] : [REVUE323] Elsevier Science, Microelectronics Reliability, Volume 36, Issue 3, Pages 293-456 (March 1996.
  [9] : [REVUE322] Elsevier Science, Microelectronics Reliability, Volume 36, Issue 2, Pages 121-282 (February 1996.
 [10] : [REVUE320] Elsevier Science, Microelectronics Reliability, Volume 36, Issue 1, Pages 1-119 (January 1996.

Microelectronics Reliability 35 - 1995

TOP

  [1] : [REVUE311] Elsevier Science, Microelectronics Reliability, Volume 35, Issue 12, Pages 1451-1520 (December 1995.
  [2] : [REVUE310] Elsevier Science, Microelectronics Reliability, Volume 35, Issue 11, Pages 1377-1447 (November 1995.
  [3] : [REVUE319] Elsevier Science, Microelectronics Reliability, Volume 35, Issues 9-10, Pages 1207-1375 (September - October 1995.
  [4] : [REVUE318] Elsevier Science, Microelectronics Reliability, Volume 35, Issue 8, Pages 1111-1165 (August 1995.
  [5] : [REVUE317] Elsevier Science, Microelectronics Reliability, Volume 35, Issue 7, Pages 1017-1104 (June 1995.
  [6] : [REVUE316] Elsevier Science, Microelectronics Reliability, Volume 35, Issue 6, Pages 875-1008 (June 1995.
  [7] : [REVUE315] Elsevier Science, Microelectronics Reliability, Volume 35, Issue 5, Pages 777-874 (May 1995.
  [8] : [REVUE314] Elsevier Science, Microelectronics Reliability, Volume 35, Issue 4, Pages 637-757 (April 1995.
  [9] : [REVUE313] Elsevier Science, Microelectronics Reliability, Volume 35, Issue 3, Pages 325-635, March 1995.
 [10] : [REVUE312] Elsevier Science, Microelectronics Reliability, Volume 35, Issue 2, Pages 159-318 (February 1995.
 [11] : [REVUE309] Elsevier Science, Microelectronics Reliability, Volume 35, Issue 1, Pages 1-135 (January 1995.


Microelectronics Journal 32 - 2001

TOP

  [1] : [REVUE254] Elsevier Science, Microelectronics Journal, Volume 32, Issues 10-11, Pages 795-923, October - November 2001.
  [2] : [REVUE479] Elsevier Science, Microelectronics Journal, Volume 32, Issues 5-6, Pages 395-552, May-June 2001.

Microelectronics Journal 31 - 2000

TOP

  [1] : [REVUE252] Elsevier Science, Microelectronics Journal, Volume 31, Issues 9-10, Pages 725-824, October 2000.
  [2] : [REVUE142] Elsevier Science, Microelectronics Journal, Vol. 31, Issue 8, August 2000.
  [3] : [REVUE143] Elsevier Science, Microelectronics Journal, Vol. 31, Issue 7, July 2000.

Microelectronics Journal 30 - 1999

TOP

  [1] : [REVUE308] Elsevier Science, Microelectronics Journal, Volume 30, Issue 11, Pages 1083-1172, November 1999.
  [2] :  [ART228]  L. CIAMPOLINI, M. CIAPPA, P. MALBERTI, P. REGLI, W. FICHTNER, Modelling thermal effects of large contiguous voids in solder joints, Microelectronics Journal, Volume 30, Issue 11, November 1999, pp. 1115-1123.
  [3] :  [ART255]  M. JANICKI, M. ZUBERT, A. NAPIERALSKI, Application of inverse problem algorithms for integrated circuit temperature estimation, Microelectronics Journal, Volume 30, Issues 11, November 1999, pp. 1099-1107.
  [4] :  [ART256]  K. NASSIM, L. JOANNES, A. CORNET, S. DILHAIRE, E. SCHAUB,W. CLAEYS, High-resolution interferometry and electronic speckle pattern interferometry applied to the thermomechanical study of a MOS power transistor, Microelectronics Journal, Volume 30, Issues

Microelectronics Journal 29 - 1998

TOP

  [1] : [REVUE307] Elsevier Science, Microelectronics Journal, Volume 29, Issues 1-2, Pages 1-65, 2 January 1998.
  [2] : [REVUE111] Elsevier Science, Microelectronics Journal, Volume 29, Issue 3, Pages 67-158, March 1998.
  [3] :  [PAP158]  -------


Special Issues

TOP

  [1] : [REVUE162] Elvesier Science, Reliability Engineering & System Safety, Vol. 68, No. 3, June 2000.
  [2] : [REVUE144] Elsevier Science, Microelectronics Journal, Vol. 35, Issue 3001, 1995.
Volume 40, Numbers 4-5: Dielectrics in Microelectronics
B. Garrido, J.R. Morante

Volume 39, Number 12: Reliability of Compound Semiconductor Devices and Integrated Circuits
F. Fantini, J.J. Liou, M. Fukuda

Volume 39, Number 11: Papers Presented at the 1998 Symposium on Electrical Overstress/Electrostatic Discharge (EOS/ESD) and Current Issues in Metal Migration
S.H. Voldman, A.J. Mouthaan, H. Onoda

Volume 39, Numbers 6-7: Reliability of Electron Devices, Failure Physics and Analysis
N. Labat, A. Touboul

Volume 38, Number 11: Papers Presented at the 1997 Symposium on Electrical Overstress/Electrostatic Discharge (EOS/ESD)
K.G. Verhaege

Volume 38, Number 9: Advances in Submicron MOS Devices and Technology
H. Wong
1998

Volume 38, Number 6-8: Reliability of Electron Devices, Failure Physics and Analysis
F. Jensen, C. Kjærgaard
1998

Volume 38, Number 2: Dielectrics in Microelectronics
A. Paccagnella, E. Zanoni, Dipartimento di Elettronica e Informatica, University of Padova, Italy
1998

Volume 36, Number 6: Performance Modeling and Reliability Analysis
R.S. Sharma, G.S. Hura, Singapore
1996

Volume 36, Number 11/12: Reliability of Electron Devices, Failure Physics and Analysis (ESREF '96)
G. Groeseneken, H.E. Maes, A.J. Mouthaan, J.F. Verweij
1996

Volume 36, Number 7/8: Special Issue on Reliability Physics of Advanced Electron Devices
N. Stojadinovic
1996

Volume 35, Number 9/10: Reliability: A Competitive Edge
A.H. Rawicz
1995

Volume 35, Numbers 9/10: Reliability: A Competitive Edge
A.H. Rawicz
1995

Volume 35, Number 3: Reliability Physics of Advanced Electron Devices
N.D. Stojadinovic
1995

Volume 35, Number 3: Reliability Physics of Advanced Electron Devices
N.D. Stojadinovic
1995


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