IRW, "Integrated Reliability Workshop", IRPS, mai 2004.
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Titre : IRW, Integrated Reliability Workshop, IRPS, mai 2004.

Cité dans : [DATA224] Liste alphabétique des conférences, août 2016.
Cité dans :[99DIV081] Dates des congrès sur les Convertisseurs Statiques, avril 2013.
Site : http://www.irps.org/irw
Lien : irps/irw/default.htm

Vers : IRW 2005
Vers : IRW 2004
Vers : IRW 2003
Vers : IRW 2002
Vers : IRW 2001
Vers : IRW 2000
Vers : IRW 99
Vers : IRW 98
Vers : IRW 97
Vers : IRW 96


IRW 2005

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Congrés : IEEE 2005 International INTEGRATED RELIABILITY WORKSHOP
Lieu :
Date : 2005
Abstract : 2005
Notification :
Full_paper :
Site : http://www.irps.org/irw
Lien : IRPS/irw/2005/irw2005_CFP.pdf
Lien : "maito:"
Informations :


IRW 2004

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Congrés : IEEE 2004 International INTEGRATED RELIABILITY WORKSHOP
Lieu : Stanford Sierra Camp, Fallen Leaf Lake, California
Date : October 18-21, 2004
Abstract : June 18, 2004
Notification :
Full_paper :
Site : http://www.irps.org/irw
Lien : IRPS/irw/2004/irw2004_CFP.pdf - 262 Ko, 2 pages, le 14 mai 2004.
Lien : "maito: Rolf.Vollertsen@infineon.com"
Informations :
Two page Paper and/or Poster Abstract Submission deadline is June 18, 2004
Send your submissions to: IRW 2004 Technical Program Chair: Rolf-Peter Vollertsen.
The Categories of submission are:
· Wafer level reliability tests and test approaches
· Identification of new reliability effects & characterization
· Reliability models and simulations
· Reliability test structures
· Customer product reliability requirements/ manufacturer reliability tasks
· Designing-in reliability (circuits, processes, products)
Tutorials:
· Reliability of Gate Oxides, F. Monsieur
· Device, K. Ahmed
· Interconnects, P. Ho
· Negative Bias Temperature Instability (NBTI)
· High-k Dielectrics
· Product Reliability


IRW 2003

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Congrés : IEEE 2003 International INTEGRATED RELIABILITY WORKSHOP
Lieu : Stanford Sierra Camp, Lake Tahoe, CA
Date : October 20-23, 2003
Abstract : July 6th, 2003
Notification :
Full_paper :
Site : http://www.irps.org/irw
Lien : IRPS/irw/03/irw2003_CFP.pdf - 241 Ko, 2 pages, le 15 mai 2003.
Lien : "maito:mdion@intersil.com"
Informations :
My name is Mike Dion, Communications Chair for the IEEE 2003 Integrated
Reliability Workshop (IRW). This first Call for Papers is intended to give
you the opportunity to start preparing an abstract while there is still some
time. The committee of the 2003 IRW cordially invites you to submit an
abstract describing your latest reliability related work.

The Integrated Reliability Workshop continues to focus on ensuring
semiconductor reliability through component fabrication, design,
characterization, and analysis tools. It provides a unique environment for
envisioning, developing, and sharing reliability technology for present and
future semiconductor applications.

Hot topics of the workshop are: high-k gate dielectrics, Cu-interconnects &
Low-k dielectrics, deep submicron, high speed, high frequency devices (e.g.
SiGe), SOI devices, and future technologies such as molecular electronics
and carbon nanotubes.

We invite you to submit a presentation proposal that addresses:
- WAFER LEVEL RELIABILITY TESTS AND TEST APPROACHES
- RELIABILITY CHARACTERIZATION AND MODELS
- NOVEL RELIABILITY TEST STRUCTURES
- CUSTOMER PRODUCT RELIABILITY REQUIREMENTS / MANUFACTURER RELIABILITY TASKS
- DESIGNING-IN RELIABILITY (CIRCUITS, PROCESSES, PRODUCTS)


IRW 2002

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Congrés : IEEE 2002 International INTEGRATED RELIABILITY WORKSHOP
Lieu : Stanford Sierra Camp, Lake Tahoe, CA
Date : October 21-24, 2002
Abstract : July 5th, 2002
Notification :
Full_paper : September 17, 2001
Site : http://www.irps.org/irw
Lien : IRPS/irw/02/irw2002.pdf - 179 Ko, 6 pages, le 27 juin 2002.
Lien : "maito:Rolf.Vollertsen@infineon.com"
Informations :
My name is Rolf Vollertsen and I serve as the Communication Chair of the IEEE 2002 Integrated Reliability Workshop (IRW). Time is running fast and we noticed this is our last opportunity to call for Papers this year: On behalf of the organizing committee of the 2002 IRW I cordially invite you to submit an abstract describing your latest reliability related work for possible presentation at the IRW 2002 no later than July 5th 2002.
The Integrated Reliability Workshop focuses on ensuring semiconductor reliability through component fabrication, design, characterization, and analysis tools.
It provides a unique environment for envisioning, developing, and sharing reliability technology for present and future semiconductor applications. Hot reliability topics of the workshop are: Cu interconnects, reliability of deep sub-micron, high speed, high frequency devices, new dielectric systems, and reliability modeling & simulation.
We invite you to submit a presentation proposal that addresses one or more of the following topics:
* WAFER LEVEL RELIABILITY TESTS AND TEST APPROACHES
* IDENTIFICATION OF RELIABILITY EFFECTS
* NEW OR EXISTING RELIABILITY CHARACTERIZATION AND PREDICTION MODELS TO SHOW
* RELIABILITY TEST STRUCTURES
* CUSTOMER PRODUCT RELIABILITY REQUIREMENTS / MANUFACTURER RELIABILITY TASKS
* DESIGNING-IN RELIABILITY (CIRCUITS, PROCESSES, PRODUCTS)


IRW 2001

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Congrés : IEEE 2001 International Integrated Reliability Workshop
Lieu : Stanford Sierra Camp, Lake Tahoe, CA
Date : October 15-18, 2001
Abstract : July 6, 2001
Notification :
Full_paper : September 17, 2001
Lien : IRPS/irw/01/cfp_2001.pdf
Lien : IRPS/irw/01/2001irw.pdf - 593 Ko, 6 pages, le 26 septembre 2001.


IRW 2000

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Congrés : IEEE 2000 International Integrated Reliability Workshop
Lieu :
Date :
Abstract :
Notification :
Full_paper :
Lien : IRPS/irw/00/index.html


IRW 99

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Congrés : IEEE 1999 International Integrated Reliability Workshop
Lieu :
Date :
Abstract :
Notification :
Full_paper :
Lien : IRPS/irw/99/index.html


IRW 98

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Congrés : IEEE 1998 International Integrated Reliability Workshop
Lieu :
Date :
Abstract :
Notification :
Full_paper :
Lien : IRPS/irw/98/index.html


IRW 97

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Congrés : IEEE 1997 International Integrated Reliability Workshop
Lieu :
Date :
Abstract :
Notification :
Full_paper :
Lien : IRPS/irw/97/97irw.htm


IRW 96

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Congrés : IEEE 1996 International Integrated Reliability Workshop
Lieu :
Date :
Abstract :
Notification :
Full_paper :
Lien : IRPS/irw/96/96irw.htm


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