C. TURPIN, P. BAUDESSON, F. RICHARDEAU, F. FOREST, T.A. MEYNARD, "Fault management of multicell converters", IEEE Transactions on Industrial Electronics, Vol. 49, No. 5, October 2002, pp. 988-997.
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Article : [ART379]

Titre : C. TURPIN, P. BAUDESSON, F. RICHARDEAU, F. FOREST, T.A. MEYNARD, Fault management of multicell converters, IEEE Transactions on Industrial Electronics, Vol. 49, No. 5, October 2002, pp. 988-997.

Cité dans :[REVUE392] IEEE Transactions on Industrial Electronics, Volume 49, Issue 5, October 2002.
Cité dans : [DIV189]  Recherche sur l'auteur Thierry MEYNARD, mai 2003.
Auteur : Turpin, C.
Auteur : Baudesson, P.
Auteur : Richardeau, F.
Auteur : Forest, F.
Auteur : Meynard, T.A. - Lab. d'Electrotech. et d'Electron. Ind., CNRS, Toulouse;

Source : IEEE Transactions on Industrial Electronics,
Pages : 988 - 997
Volume : 49
Numero : 5
Date : October 2002
ISSN : 0278-0046
Info : INSPEC Accession Number: 7413692
Stockage : Thierry LEQUEU, le 15 mai 2003.
Lien : private/Turpin2.pdf - 10 pages, 472 Ko.

Vers : Bibliographie

Abstract :
Component counts and oversimplified reliability rules may lead to the conclusion
that multilevel converters are less safe than two-level converters, just because
they use more components. A better approach might be to consider that they use
a different arrangement of components and also that the consequence of faults
may be very different. This paper is focused on the study of the consequences of
faults in hard-switching and soft-switching multicell converters. Solutions to
minimize the consequences of major faults are described.

Index_Terms :
fault location insulated gate bipolar transistors power convertors power system harmonics
switching circuits fault detection fault location fault management fault tolerance
hard-switching multicell converters insulated gate bipolar transistors multicell converters
multilevel systems oversimplified reliability rules power electronics power systems
harmonics soft-switching multicell converters


Bibliographie

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References : 14
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